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Semiconductor Metrology Instruments - Spectroscopic Ellipsometer covering a range from FUV to NIR -- UVISELSupplier: HORIBA Scientific
Description: ellipsometers offer a modular design, enabling the best fit to your applications. Four spectral ranges are available covering wavelengths from 190 to 2100nm. Full automation, a large variety of accessories and integrated microspot optics make the UVISEL a powerful and versatile spectroscopic ellipsometer
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers, CVD / PVD Films
- Measurement Capability: Thickness - Film / Layer
Supplier: Rigaku Corporation
Description: of simply changing a cartridge. Featuring a robust direct-drive anode, the MicroMax-007 HF compact tower assembly contains both the vacuum chamber and turbo-molecular pump for fast pump downs. Conveniently mounted on the generator tabletop, the tower may be easily moved for integration with various optics
- Source Type: X-ray Generator
- Voltage: 20000 to 60000 volts
- Tube Current: 0.0100 to 0.0300 amps
- Focal Spot Size: 70 µm
Supplier: Edmund Optics Inc.
Description: Stackable for Two-Axis Rotation Durable Brass Construction Goniometers allow for precise angular adjustment of an object about a fixed point located above the center of the mounting surface. Stages with smaller radii can be mounted on top of same size stages with longer radii to provide motion
- Stage Type: Cradle Positioning / Goniometer
- Drive Mechanism: Micrometer
- Drive Type: Manual / Crank Handle
- Overall Length: 1.57 inch
Supplier: Rigaku Corporation
Description: by your side. The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator. Coupling a computer controlled alignment system with a fully automated optical system
- Wave Type: X-Ray
- Detector Type: Scintillation
- Diffraction Method: Powder
- Sample/Detector Positioning System: Goniometer, Eulerian Cradle
Supplier: Bruker AXS, Inc.
Description: No Description Provided
- Wave Type: X-Ray
- Detector Type: Position Sensitive Detector (PSD), Solid State / Semiconductor, Scintillation
- Diffraction Method: Powder
- Sample/Detector Positioning System: Goniometer, Eulerian Cradle, Other
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High Precision R&D Spectroscopic Ellipsometer
and integrated microspot optics make the UVISEL a powerful and versatile spectroscopic ellipsometer for demanding research and industrial quality control. . The UVISEL can be used either ex-situ or in-situ for integration with process chambers or roll-to-roll machines. A new configuration, called the UVISEL LT, features a compact, integrated goniometer to provide a very cost-effective ellipsometer. . The DeltaPsi2 software platform provides a complete measurement, modeling, and reporting... (read more)
Browse Semiconductor Metrology Instruments Datasheets for HORIBA Scientific
Aerotech’s MPS-GR Series Rotary Stages
MPS-GR Miniature, Gear-Drive Rotary Stages for Tight Spaces. Aerotech's MPS-GR series rotary stages provide accurate, repeatable positioning in a miniature, low profile and economical package. Available in two sizes - the MPS50GR and MPS75GR - they are engineered for the confines and requirements of a laboratory or research and development setting. MPS-GR stages are ideal for optics, measurement, alignment, inspection and other similar applications. Construction Features. MPS-GR stages... (read more)
Browse Rotary Stages Datasheets for Aerotech, Inc.
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JEM-9320FIB Product Brochure
Nanoscale observation and analysis are increasingly important in the nanotechnology era. Based on electron- and ion-optics technologies developed by JEOL for many years, the JEM-9320FIB system can prepare cross sections from local areas of STEM/TEM specimens for semiconductor failure analysis
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Forming mechanisms and wettability of double-scale structures fabricated by femtosecond laser
Both the apparent contact angle and the sliding angle of droplets on the surface are averaged over five measurements, which are measured using video-frequency optics goniometer .
Fundamentals of Powder Diffraction and Structural Characterization of Materials
These include instrumental parameters, i.e., the wavelength (energy) of the X-rays, their monochromatization, apertures of goniometer optics , power settings, and data collection parameters, that is, scanning mode, scan range, step-in data collection, and counting time.
Measuring the refractive index with precision goniometers: a comparative study
However, the lenses of the spectrometer- goniometer optics are adjustable to allow for the compensation of the wavelength dependent back focal length, whereas the prism goniometer has a fixed lens.
Superconductor thin films : In situ X�?ray study on the reaction of hydrogen with epitaxial YBa 2 Cu 3 O 7 Layers
...was calculated only for volume ratios between 5 and 95%, since below and above this range quasi pure phases appear with minor stacking disorder, whose line width is predominantly determined by the particle size and the diver- gence of the goniometer optics .
Whole diffraction pattern-fitting of polycrystalline fcc materials based on microstructure
Goniometer optics in- cluded a graphite curved-crystal analyser in the diﬀracted beam and narrow slits (Soller = 2◦ ; DS = 1/2◦ ; Soller .
Adsorption of fish oil and poly(vinylbutyral) onto aluminum oxide particles studied by light scattering
...q = (4xn/20)sin (fl/2) is the wave vector, n is the refrac- tive index of the solvent, e is the scattering angle, t is delay time, a is a constant of order 1 which depends on goniometer optics , g(l~(q,t...
Macromolecular Crystallography Protocols
The principles of operation of the required X-ray sources, optics , goniometers , and detectors are outlined, and a typical data collection protocol is present- ed.
A low cost wearable optical-based goniometer for human joint monitoring
Another popular class will be the fiber optics based goniometers due to its reduced size [7,8].
Biomimetic Surfaces for High�?Performance Optics
The angle- dependent specular reflection was evaluated using home-made equipment consisting of a collimated beam from a fiber-coupled tungsten-bromine lamp (Ocean Optics ), goniometer (Rigaku), and the spectrum was obtained using a spectrometer (Ocean Optics, USB650) from 400 to 800...
Structural studies of a new electroceramic composite: Pb(Fe0.5 Nb0.5 )O3 (PFN)-Cr0.75 Fe1.25 O3 (CRFO)
The X-ray powder diffraction profiles of the prepared samples were recorded using a powder X-ray diffractom- eter system Rigaku D/max-B, composed of X-ray generator, X-ray optics and goniometer , X-ray detector and counting system, and recorder for...
X-ray data collection from macromolecular crystals.
The principles of operation of the required X-ray sources, optics , goniometers , and detectors are outlined, and a typical data collection protocol is presented.
Angular scattering measurements and calculations of rough spherically shaped carbon particles
Keywords: Light scattering, phase function, single particle, rough surface, electrodynamic levitation, geometric optics , goniometer .
An XRD 2 system consists of at least one 2D detector, x-ray source, x-ray optics , goniometer , sample alignment device as well as corresponding computer control and data reduction and analysis software.
CAT Guide and Beamline Directory. A key to APS collaborative access teams.
...m from source EPICS version) and EPICS applications pt, pd, and sioz coatings 2 5-4 mrad incident angle Beamline support Equipment/Facilities * 12-lD-B -100 gm focus in 12-1D-B Huber 8-circle goniometer spectroscopy optics table Experiment Stations small...