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Parts by Number for Oscilloscope Test Probe Top

Part # Distributor Manufacturer Product Category Description
P6316 Fotronic Corporation / Test Equipment Depot Tektronix, Inc. Electrical Test Probes This unique probe design offers two eight-channel pods, simplifying the process of connecting to the device-under-test. When connecting to square pins, the P6316 can connect directly to 8 ×2 square pin headers spaced on tenth-inch centers. When more attachment flexibility is required, you can...
P2221   Tektronix, Inc. Electrical Test Probes The P2220 and P2221, 200 MHz passive voltage probes permit selection of 1x or 10x attenuation, using a switch located on the probe head.|The P2221 is compatible with MSO2000 and DPO2000 Series oscilloscopes. Features & Benefits. 1x/10x Attenuation. 200 MHz Bandwidth. 1.5 m Length. UL3111-1...
90-10-3-R   E-Z-HOOK Electrical Test Probes Use with any scope. Bandwidth D.C. to 300 MHz. 1.2 Nano second rise time and less than 3 percent overshoot insures precise measurement. Range includes X1, X10 attenuation. Switchable X1, X10 attenuation. Available with actuator pin for scopes with readout feature. Replaceable tip
PR-59 Fotronic Corporation / Test Equipment Depot B&K Precision Electrical Test Probes Discontinued
665434 1-Source Electronic Components Agilent Technologies, Inc. / Electronic Measurement Group Electrical Test Probes TEST PROBE, OSCILLOSCOPE. Test Probe Type:Oscilloscope. Test Probe Functions:High Voltage. For Use With:Any oscilloscope with a high-impedance BNC input. Bandwidth:25MHz. RoHS Compliant: NA
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Conduct Research Top

  • Selection Guide to Clamp-On Current Probes
    Clamp-on current probes are designed to extend the current measuring capabilities of DNNs, power instruments, oscilloscopes, hand-held scopes, recorders or loggers and other diverse instruments. The probe is "clamped" around the current carrying conductor to perform non-contact current measurements
  • A Closed-Loop Drive-train Model for HIL Test Bench (.pdf)
    This paper presents a hardware-in-the-loop (HIL) test bench for the validation of production transmission controls software, with a focus on a closed-loop vehicle drive-train model incorporating a detailed automatic transmission plant dynamics model developed for certain applications. Specifically
  • DC/DC CONVERTER Terminology and Basic Test Conditions
    . This set-up is sufficiant to. least 10 times the resolution required to measure a. test the majority of electrical parameters. parameter. In general digital meters should be 4 1/2 digit. and oscilloscopes should have 20 to 100 MHz bandwidth. All connections should be made with great attention
  • Varistor Testing (.pdf)
    This note details the common tests of varistor parameters and describes suitable test methods using simplified test circuits. All tests are performed at 25 o C, unless otherwise specified. The test circuits and methods given herein are intended as a general guide. Since the tests frequently entail
  • Capturing and Troubleshooting Serial Data Signals
    at the device under test and use other channels of the oscilloscope to probe additional signals showing the response of the device to the command. In addition to triggering on specific addresses and data values, it is also possible for the 'scope to trigger on a range of values, on the start of a data
  • Agilent: Five Hints for Debugging Microcontroller-Based Designs
    using a digital pentiometer Using SPI triggering and deep memory to measure the analog input and digital output for an SPI interface. Hint 3: Monitoring a digital motor speed controller Using an AC/DC current probe and a mixed signal oscilloscope to perform various analog and digital measurements
  • ESD Compliance Testing and Recommended Protection Circuits for GaAs Devices
    to the. Pogo Probe. Device. oscilloscope. This allows the voltage at the outputs of the device. Under Test. Insulating. Fixture. to be recorded. Field-charging. 300 mΩ. Electrode. High Voltage. Charging. ESD Protection Circuit. Power Supply. Resistor. GaAs devices are used in different system
  • Brake Rotor Analysis Using Non-Contact Measurement Sensor
    and fixture used during the test. As the rotor was rotated, the output of each probe was captured on an oscilloscope and is presented in Figure 2. Clearly the Push-Pull technology provides a much cleaner output signal. The resolution obtained was better than 0.5 microns at a measurement range of 1.5 mm

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