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Parts by Number for Oscilloscope Test Probe Top

Part # Distributor Manufacturer Product Category Description
U1562A Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - U1562A - 100:1 Oscilloscope Test Probe
N2796A Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - N2796A - TEST PROBE; OSCILLOSCOPE; 10:1; 2GHZ
U1561A-GSA Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - U1561A-GSA - 10:1 Oscilloscope Test Probe
P5050B Newark / element14 TEKTRONIX Not Provided TEKTRONIX - P5050B - TEST PROBE; OSCILLOSCOPE
76-105 Newark / element14 TENMA Not Provided TENMA - 76-105 - TEST PROBE; OSCILLOSCOPE
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Conduct Research Top

  • Selection Guide to Clamp-On Current Probes
    Clamp-on current probes are designed to extend the current measuring capabilities of DNNs, power instruments, oscilloscopes, hand-held scopes, recorders or loggers and other diverse instruments. The probe is "clamped" around the current carrying conductor to perform non-contact current measurements
  • A Closed-Loop Drive-train Model for HIL Test Bench (.pdf)
    This paper presents a hardware-in-the-loop (HIL) test bench for the validation of production transmission controls software, with a focus on a closed-loop vehicle drive-train model incorporating a detailed automatic transmission plant dynamics model developed for certain applications. Specifically
  • Varistor Testing (.pdf)
    This note details the common tests of varistor parameters and describes suitable test methods using simplified test circuits. All tests are performed at 25 o C, unless otherwise specified. The test circuits and methods given herein are intended as a general guide. Since the tests frequently entail
  • Capturing and Troubleshooting Serial Data Signals
    at the device under test and use other channels of the oscilloscope to probe additional signals showing the response of the device to the command. In addition to triggering on specific addresses and data values, it is also possible for the 'scope to trigger on a range of values, on the start of a data
  • Agilent: Five Hints for Debugging Microcontroller-Based Designs
    using a digital pentiometer Using SPI triggering and deep memory to measure the analog input and digital output for an SPI interface. Hint 3: Monitoring a digital motor speed controller Using an AC/DC current probe and a mixed signal oscilloscope to perform various analog and digital measurements
  • Brake Rotor Analysis Using Non-Contact Measurement Sensor
    and fixture used during the test. As the rotor was rotated, the output of each probe was captured on an oscilloscope and is presented in Figure 2. Clearly the Push-Pull technology provides a much cleaner output signal. The resolution obtained was better than 0.5 microns at a measurement range of 1.5 mm
  • Medical Device Link .
    to tester burnout. Test-group boredom leads to bungled tests. Almost nothing of value is salvaged from tests developed for one product and used on another. Everything has to be recreated. Thankfully, because of three factors, these practices are quickly becoming history. The first factor
  • Medical Device Link .
    of standard tests. With the goal of improving insulation quality, the authors' companies worked together to create a test apparatus and a test protocol to evaluate various shrink tubing materials used by the electrosurgical product industry. The results of that collaboration are reported below

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