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Parts by Number Top

Part # Distributor Manufacturer Product Category Description
U1562A Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - U1562A - 100:1 Oscilloscope Test Probe
N2796A Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - N2796A - TEST PROBE; OSCILLOSCOPE; 10:1; 2GHZ
1168A Newark / element14 AGILENT TECHNOLOGIES Not Provided AGILENT TECHNOLOGIES - 1168A - TEST PROBE; OSCILLOSCOPE
P5050B Newark / element14 TEKTRONIX Not Provided TEKTRONIX - P5050B - TEST PROBE; OSCILLOSCOPE
76-105 Newark / element14 TENMA Not Provided TENMA - 76-105 - TEST PROBE; OSCILLOSCOPE
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Conduct Research Top

  • Selection Guide to Clamp-On Current Probes
    Clamp-on current probes are designed to extend the current measuring capabilities of DNNs, power instruments, oscilloscopes, hand-held scopes, recorders or loggers and other diverse instruments. The probe is "clamped" around the current carrying conductor to perform non-contact current measurements
  • A Closed-Loop Drive-train Model for HIL Test Bench (.pdf)
    This paper presents a hardware-in-the-loop (HIL) test bench for the validation of production transmission controls software, with a focus on a closed-loop vehicle drive-train model incorporating a detailed automatic transmission plant dynamics model developed for certain applications. Specifically
  • DC/DC CONVERTER Terminology and Basic Test Conditions
    . This set-up is sufficiant to. least 10 times the resolution required to measure a. test the majority of electrical parameters. parameter. In general digital meters should be 4 1/2 digit. and oscilloscopes should have 20 to 100 MHz bandwidth. All connections should be made with great attention
  • Varistor Testing (.pdf)
    This note details the common tests of varistor parameters and describes suitable test methods using simplified test circuits. All tests are performed at 25 o C, unless otherwise specified. The test circuits and methods given herein are intended as a general guide. Since the tests frequently entail
  • Capturing and Troubleshooting Serial Data Signals
    at the device under test and use other channels of the oscilloscope to probe additional signals showing the response of the device to the command. In addition to triggering on specific addresses and data values, it is also possible for the 'scope to trigger on a range of values, on the start of a data
  • Agilent: Five Hints for Debugging Microcontroller-Based Designs
    using a digital pentiometer Using SPI triggering and deep memory to measure the analog input and digital output for an SPI interface. Hint 3: Monitoring a digital motor speed controller Using an AC/DC current probe and a mixed signal oscilloscope to perform various analog and digital measurements
  • ESD Compliance Testing and Recommended Protection Circuits for GaAs Devices
    to the. Pogo Probe. Device. oscilloscope. This allows the voltage at the outputs of the device. Under Test. Insulating. Fixture. to be recorded. Field-charging. 300 mΩ. Electrode. High Voltage. Charging. ESD Protection Circuit. Power Supply. Resistor. GaAs devices are used in different system
  • Brake Rotor Analysis Using Non-Contact Measurement Sensor
    and fixture used during the test. As the rotor was rotated, the output of each probe was captured on an oscilloscope and is presented in Figure 2. Clearly the Push-Pull technology provides a much cleaner output signal. The resolution obtained was better than 0.5 microns at a measurement range of 1.5 mm

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