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Parallelism Metrology System
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Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects.
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Supplier: Mahr Federal Inc.Description: High-precision form and position tolerance checking system for laboratory and measuring room High precision automatic form measuring station for comprehensive evaluation Large measuring volume High loading capacity (high performance) up to 1000 N
- Measurement Capability: 2D / Line Profiles, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Surface Metrology: Form Measurement
- Standards Compliance: ISO / EN, DIN
- Technology: Contact / Stylus Based
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Supplier: MSI-Viking GageDescription: high efficiency Easily accessible turntable for large and heavy parts Patented machine design with a transport and drive system separated from the measuring and reference system Use on shop floor possible
- Measurement Capability: 3D / Areal Topography, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Surface Metrology: Form Measurement
- Technology: Contact / Stylus Based
- Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting)
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Supplier: Polytec, Inc.Description: The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.
- Measurement Capability: 3D / Areal Topography, Flatness, Parallelism, Roundness
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Aerospace / Defense, Automotive, Other
- Mounting / Loading: Benchtop
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Supplier: Corning Specialty MaterialsDescription: The answer for controlling the manufacturing process of complex parts
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Coaxiality, Cylindricity, Flatness, Eccentricity / Concentricity, Parallelism, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Squareness / Angularity, Straightness, Warp / Bow
- Surface Metrology: Form Measurement
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting), Optics / Photonics, Precision Machining / Grinding
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Supplier: Mahr Federal Inc.Description: High-precision form and position tolerance checking system for laboratory and measuring room High precision automatic form measuring station for comprehensive evaluation Large measuring volume High loading capacity (high performance) up to 1000 N
- Measurement Capability: 2D / Line Profiles, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Surface Metrology: Form Measurement
- Standards Compliance: ISO / EN, DIN
- Technology: Contact / Stylus Based
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Supplier: MSI-Viking GageDescription: high efficiency Easily accessible turntable for large and heavy parts Patented machine design with a transport and drive system separated from the measuring and reference system Use on shop floor possible
- Measurement Capability: 3D / Areal Topography, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Surface Metrology: Form Measurement
- Technology: Contact / Stylus Based
- Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting)
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Supplier: Corning Specialty MaterialsDescription: The answer for controlling the manufacturing process of complex parts
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Coaxiality, Cylindricity, Flatness, Eccentricity / Concentricity, Parallelism, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Squareness / Angularity, Straightness, Warp / Bow
- Surface Metrology: Form Measurement
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting), Optics / Photonics, Precision Machining / Grinding
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Featured Products for Parallelism Metrology System Top
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Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more) -
Capacitec Launches A New Gapmaster3 Gen3 Portable Triple Channel Capacitance Amplifier Package for Parallelism/Gap Measurement. Capacitec, Inc. (Capacitec), a leading ISO9001: 2008 certified designer and manufacturer of non-contact capacitive displacement, gap and parallelism sensing systems, has announced the global market debut of the Gapmaster3 Gen3. Additional features include: fully portable package powered by 3 AA lithium batteries with a minimum battery life of 14 hours with continuous... (read more)
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Drawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more)
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We specialize in burr-free cut-off metal parts that offer length and diameter tolerances in the microns, parallelism and flatness less than a micron and squareness in the minutes. Capabilities include proprietary abrasive cutting, grinding (centerless, surface and profile), lapping and polishing of all ferrous and non-ferrous metals. Additionally, all tubing, rod and extrusions can be cut to any shape. Ends are square and parallel, with length/thickness tolerance from ±0.0002" (±0.005 mm... (read more)
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turbine blades, appliance housings and much more. "The HN-6060 multi-sensor system builds upon the Nikon Metrology portfolio of vision systems and 3D solutions." says Myles Richard, Managing Director of Americas for Nikon Metrology, "It addresses the need for fast, high-accuracy 3D inspection of complex shapes by combining innovative optical technology with the highest precision measurement hardware." The newly designed laser scanning sensor extracts the surface form and waviness data in one... (read more)
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and materials available these days, traditional stylus measurement is often not adequate to characterize the functional behavior of surfaces," said Pat Nugent, Vice President of Metrology Systems for Mahr Federal. "The MarSurf WS 1 can provide the three-dimensional recording and evaluation needed, as well as the non-contact measurement required by soft and sensitive materials. In addition, new processes are achieving ever higher levels of surface quality, greatly increasing the need for greater... (read more)
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Lapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more)
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Metrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)
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TXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)
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The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)
Conduct Research Top
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Measuring the Right Things at the Right Time Will Add Value to Products and Processes
One of the jobs of metrology system manufacturers is to make better, more sophisticated products. Ironically, however, they are frequently met with the argument that because inspection is essentially a nonvalue-added process, their efforts in product development run counter to their customers...
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MICRO:Top 30 (November/December 2001)
parallelism suited to high-tilt implants. A multitasking control feature facilitates editing of recipes, access to data, and communication with factory host systems without any impact on the production environment. CMP Unit. Peter Wolters. Rendsburg, Germany. A CMP unit for 300-mm wafer processing...
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INDUSTRY NEWS New definition, advanced defect detection tools are keys to highway Experts steering the latest revision of the National Technology Roadmap for Semiconductors to its autumn publication date assert that advanced defect detection technolo
reduction, contamination reduction, and environmentally benign [manufacturing]," Wolleson explains. "It's really easy to take that agenda and make it confrontational and controversial and counterproductive, but we want to take it seriously. There's a lot of parallelism." The crosscut group "has...
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Use of Non-contact Thin Gap Sensors in Controlling Coater Gap Uniformity
methods using traditional standard metrology tools. One method was the use of feeler gauges. This procedure could not provide the required accuracy and the repeatability was poor due to the subjective variation between users. In addition the feeler gauge method suffers from the following problems...
Engineering Web Search: Parallelism Metrology System Top
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SIM AO Support - Mission about the SIM mission, including mission operations, the end to end data system, experiment planning, and a sample timeline during flight operations. |
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Engineering Metrology Toolbox About Engineering Metrology Toolbox Frequently Asked Questions (FAQ) |
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IBM Research - Zurich | Storage Technologies | Probe... a navigation system based on thermal position sensors and media-derived servo information [12,13,17, |
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IBM Technical Journals Computer system availability Computers IBM System z9 IBM System/360 IBM System/360, Model 91 |
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PI: Precision Capacitance Sensor, Capacitive Displacement... Metrology / Laser-Systems / ... Precision Machining, Diamond Turning See PI (Physik Instrumente) L.P. Information |
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Optical Design and Testing - Photonics Asia 2002 |... Digitalized detection of optical axes' parallelism in multi-optical axes system |
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Advanced Optical Manufacturing and Testing II | Publications:... Integrated end-to-end metrology and data analysis system for the advanced x-ray astrophysics facility telescope mirrors |
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Teradyne system takes probers out of package test Title: Teradyne system takes probers out of package test Article Id: 10806721 Site Name: eetimes Company: CMP Media LLC Publication Date: 01/30/2001 |
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ETH - Indoor Positioning & Indoor Navigation - Program... The demonstration of the Bodyguard-System illustrates the combination of different sensors from different areas of technology, including software |
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History and Milestones METROTOM 800 is the most powerful measuring system in its class for 3D measurements and structural inspections of complex parts made of plastic, See Carl Zeiss SMT Information |
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