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Parametric Tester
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Automated test equipment (ATE) is used to monitor and control test and measurement devices, keeping human interaction at a minimum.
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Supplier: Measurement Specialties, Inc.Description: properties to determine the quality, condition and contaminant loading of fluids such as engine oil, fuel, transmission and brake fluid, hydraulic and gear oils, refrigerants and solvents. The multi-parametric analysis capability improves fluid characterization algorithms. The FPS provides in-line
- Tested Fuel: Fuel Oil
- Property Analyzed: Contamination / Impurities
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Supplier: ProductionLine Testers, Inc.Description: The IC200 is an automatic, multi-channel, parametric test system for DC analysis of integrated circuits. Base tester comes with a 4-channel VI-Source board, and is expandable to 128 channels. This tester is the ideal replacement for the common rack-and-stack systems that run multiple SMU's
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Supplier: Chroma ATE, Inc.Description: Test command optimization technology, integrated software
- Type / Form Factor: Test Platform / System
- Options / Module Types: Measure Unit / Monitor, Source Module / Unit, Load Bank / Electronic Load, Test Software / Program Generator
- Components / Products Tested: Power Supplies / Transformers
- Tester / Test Capability: Functional Test (Performance), Parametric / In-process, In-Circuit Tester (ICT)
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Supplier: TELOPS, Inc.Description: Test heads for LIV, wavelength and FFP slide above the packages to minimize machine size and package handling. Lasers are aligned using the vision system to achieve test data accuracy . An optical fiber for wavelength can move independently in X & Y to measure each VCSEL accurately .
- Form Factor: Monitor / Instrument, Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Optical Components , Packaged ICs / Ceramic Substrates
- Measurement Capability: Electrical Test - Parametric / In-line, Electrical Test - Wafer Sort / Functional, Other
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Supplier: Measurement Specialties, Inc.Description: properties to determine the quality, condition and contaminant loading of fluids such as engine oil, fuel, transmission and brake fluid, hydraulic and gear oils, refrigerants and solvents. The multi-parametric analysis capability improves fluid characterization algorithms. The FPS provides in-line
- Tested Fuel: Fuel Oil
- Property Analyzed: Contamination / Impurities
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Supplier: TELOPS, Inc.Description: Test heads for LIV, wavelength and FFP slide above the packages to minimize machine size and package handling. Lasers are aligned using the vision system to achieve test data accuracy . An optical fiber for wavelength can move independently in X & Y to measure each VCSEL accurately .
- Form Factor: Monitor / Instrument, Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Optical Components , Packaged ICs / Ceramic Substrates
- Measurement Capability: Electrical Test - Parametric / In-line, Electrical Test - Wafer Sort / Functional, Other
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Featured Products for Parametric Tester Top
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of the probes assured by linear optical encoders are unique characteristics of the 4040 Multimode. The 4040 test system has test capability to detect open and short circuits as well as powerful InCircuit instruments that can be used to perform parametric measurements in order to exactly identify the mounted device. This test system is installed and in use at RiverSide Electronics. We are excited about this test option available to our customers. See our extensive equipment list... (read more) -
Thermotron's Product Test Solutions group provides Functional and Parametric Testers, Data Acquisition Systems, Custom Electronic Solutions, and Mechanical testers utilizing our comprehensive test system integration capabilities. Quality test and measurement solutions are available for a variety of applications and industries to customers worldwide. worldwide. Thermotron SIR Test System Assesses Board Failure. Used as an industry-wide standard for assessing circuit board assembly failures due... (read more)
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By enhancing your knowledge of Creo Parametric and advancing your skills, you can keep your edge over the competition-and broaden your career options. Creo Parametric users of all levels can hone their skills and advance their knowledge of this vital 3D product design tool-without attending a single seminar or class. With the extensive Creo Parametric eLearning Library, you can pick and choose the topics you want to study. Sign up just once, and gain unlimited access to over 100 comprehensive... (read more)
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custom test system integration equipment. About Thermotron. Thermotron is a premier supplier of environmental chamber solutions that set industry standards. Our broad range of products covers a multitude of environmental stresses that are capable of simulating single or multiple environmental use conditions in a variety of testing programs. Our Product Test Solutions group provides Functional and Parametric Testers, Data Acquisition Systems, Custom Electronic Systems, and Mechanical testers... (read more)
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Perfect your Creo Parametric and Pro/ENGINEER skills right from your computer!. Advance Your Parametric & Pro/ENGINEER Skills. The Creo Parametric Student eLearning Library offers over 800 hours of Creo Parametric & Pro/ENGINEER training courses - students learn through a combination of audio and video lectures plus demonstrations. You simply log into the online PTC University Precision LMS (Learning Management System) and take a course whenever your schedule permits. It's training when... (read more)
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Instruments for multi-point Hipot, resistance, continuity and capacitance measurement - high voltage cable testers are electronic devices used to test the integrity of electrical points in a wired assembly or cable. Multi-point hipot high voltage cable testers verify the electrical connections in a cable. This high voltage analyzer usually involves cable testing which is comprised of a voltage meter, an electrical source, and a switching mechanism to connect the voltage meter and the source... (read more)
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For maximum torsion testing versatility and capability, Tinius Olsen offers a full range of torsion testing machines in capacities from 1,000 to 30,000 Nm. These uniquely superior torsion testers provide loading and weighing capabilities in both directions of rotation. This feature makes it possible to conveniently determine not only the ultimate torque load of a specimen, but how that specimen behaves under conditions of continuous or intermittent torque loading in both directions. Essentially... (read more)
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the software products to determine which package is right for your application. HYDRAULIC TESTERS. Rugged Design. Proven Load Frame. Modular Design. Versatile Test Spaces. Manual/Closed Loop Control. Capacities up to 3000kN... (read more)
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NEWEST TECHNOLOGY PROVIDES USERS WITH THE MOST ADVANCED, SIMPLE TO USE MEGGER® INSULATION TESTERS. MIT510: Base model with 5 pre-programmed test voltages (250, 500, 1000, 2500 and 5000 V); measures to 15 T? on the digital scale. MIT520: Includes all the capability of the MIT510 plus the ability to step up the voltage in 10 V increments from 50 to 1000 V and in 25 V increments beyond 1000 V; pass/fail alarm; includes automatic Polarization Index, Step Voltage, Dielectric Discharge and Dielectric... (read more)
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On-site grounds can be tested separately without having to remove the utility connection with the added ART function. The ART ground testing method is more convenient and significantly reduces testing time as much as 40%. All models are rated to IP54 making them truly outdoor instruments. The testers are easy to use — a large selector switch makes selection for 2-pole, 3-pole or 4-pole quicker to test — and the design makes the fitting of shorting links to perform 2-pole tests... (read more)
Parts by Number for Parametric Tester Top
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| S500Q6053 | Newark / element14 | KEITHLEY | Not Provided | KEITHLEY - S500Q6053 - S500 PARAMETRIC TEST SYSTEM |
| S530Q6084 | Newark / element14 | KEITHLEY | Not Provided | KEITHLEY - S530Q6084 - S530 PARAMETRIC TEST SYSTEM |
| S2009008 | Newark / element14 | KEITHLEY | Not Provided | KEITHLEY - S2009008 - S200 PARAMETRIC TEST SYSTEM |
| S2011015 | Newark / element14 | KEITHLEY | Not Provided | KEITHLEY - S2011015 - S500 PARAMETRIC TEST SOLD TO RENESAS |
| S500Q6051 | Newark / element14 | KEITHLEY | Not Provided | KEITHLEY - S500Q6051 - S500 PARAMETRIC TEST SYSTEM |
Conduct Research Top
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Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
strategies for decreasing cost of test include testing less, testing more efficiently, testing differently, and reducing the cost of the testers used. 2499 Parallel Test White Paper.indd WHITE. PA P E R. Reducing parametric test costs with. faster, smarter parallel test techniques. Jeff Kuo...
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Measuring Jitter in Digital Systems
parametric issues. These parametric issues have a significant impact on the design, operation, and proof of operation of a digital product. At bit transfer rates exceeding a gigabit per second, the analog nature of signals can become frustratingly apparent. Designers can no longer remain in the ideal binary...
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RF Wafer Testing: An Acute Need, and Now Practical (.pdf)
advanced devices. The consequences are design and process iterations that. greatly increase costs and time to market, accompanied by lower initial yields. Third Generation Parametric Testers Provide a Solution. The key to making wafer level RF testing a production process control tool is fully...
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New Materials - New Reliability Issues
. Probes. Traditional. Parametric Tester. Figure 2. Reducing the length of the signal path between the probes and picoammeter input. reduces the test's parasitic dielectric absorption effect and allows measuring the. dielectric absorption effect on a typical test structure. Drift. Low dielectric...
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Assessing future technology requirements for rapid isolation and sourcing of faults
the collection of parametric data from the circuit tester (forward-biased pad diode resistances, Iddq, Voh, Vol, Iozl, and the like) so that parametric correlation and analyses may become possible. Integrated Yield Management Yield management systems have a fundamental purpose: to collect and store relevant...
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MICRO:May 98:Product Technology News
plasma disturbance. The probe monitors plasma stability and reproducibility from process to process and from run to run, and it rapidly detects changes in power/impedance, pressure, or gas concentrations. Windows-based software offers postprocessing functions for data analysis. Parametric...
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MICRO:Archives of 1998 Issues
plasma probe, parametric tester, motorized microscope stage, weld heads, 300-mm wafer cleaners, cleanroom lighting, digital microscope, vacuum controller, and more Product Extra: Slurry mixing tool eliminates contamination, air infiltration, and other problems; etch system offers short clean time...
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MICRO: Defect/Yield Analysis
test vehicle, which contains memory test chips, D0 test structures, parametric test structures, and voltage-contrast (uLoop) test structures. The D0 test structures are tested at probe and include combs to measure gate-level D0. The monitoring system's test structures used to measure gate-level D0...
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From the Editor: There s Room for All at the Table Isn t There?
some of the gridlock thats preventing more pharma companies from embracing new technologies and making real improvements. But is that, on a deep, philosophical level, the way things really should be? Can the industry be counted on to police itself? Could the concept of real-time parametric product...
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MICRO:Product Technology News (June '99)
and dataANALYZER components facilitate data collection and interactive statistical analysis, respectively. To optimize analysis, a multiprogram retrieval feature lets engineers associate equipment, metrology, parametric test, and bin data in one function. Other tools make possible wafer-level...
Engineering Web Search: Parametric Tester Top
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In pursuit of code quality: JUnit 4 vs. TestNG { private WebTester tester; @BeforeClass protected void init() throws Exception { this.tester = new WebTester(); this.tester.getTestContext(). See International Business Machines Corp. Information |
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IBM developerWorks : Rational software developer resources Rational Performance Tester Rational Performance Tester Extension for SOA Quality Rational Functional Tester Rational Logiscope See International Business Machines Corp. Information |
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Cellular Parametric Test - Aeroflex Cellular Parametric Test 2201 ProLock Phone Tester 4202S Mobile Service Tester 4208 Off-Air Mobile Tester See Aeroflex Incorporated Information |
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CST Inc, The... Memory FAQ Tester FAQ Memory Price Index Memory Specs DocMemory PRO PCI Test Card Download Docmemory SPD Reader Software See CST, Inc. Information |
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Mixed Signal Test ? Analog and mixed signal test tools from... Tessent SerdesTest and Tessent PLLTest minimize tester hardware requirements and reduce tests costs. See Mentor Graphics Corporation Information |
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Tessent SerdesTest - Industry-leading SerDes test tool for... Tessent® SerdesTest provides complete, parametric, embedded test for multi-Gb/s SerDes. See Mentor Graphics Corporation Information |
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Parametric Tester for sale, used Parametric Tester, surplus... Mixed Signal Tester Parametric Tester SOC Tester Classifieds / Semiconductor Equipment / Test Systems / Parametric Tester |
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A technique for characterizing AC performance with a DC... A technique for characterizing AC performance with a DC parametric tester |
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40 V high voltage arbitrary waveform pulse generator at... 40 V high voltage arbitrary waveform pulse generator at automatic parametric tester |
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Avtech Electrosystems - Nanosecond Waveform Generators Products Parametric Search App Notes Quote Ordering Contact See Avtech Electrosystems Ltd. Information |
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