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  • Wired 12.04: The God Particle and the Grid
    , circular tunnel that straddles the Switzerland-France border. Then a tiny adjustment in the magnetic field throws the proton into the path of another particle beam traveling just as fast in the opposite direction. Everything goes kerflooey. This will happen 10 million times a second inside the Atlas
  • Particle Analysis for the QbD Era
    , has developed an automated means of in-process particle characterization that aims to speed and simplify materials analysis for drug manufacturers. Part scanning electron microscope, part energy dispersive spectrometer, the ASPEX Rx has a variety of applications beyond basic quality control, and also
  • Active Brazing Joins Titanium-Graphite Beam Target for Subatomic Particle Detection
    particles called neutrinos. from Fermilab, near Chicago, to a particle de-. tector in Minnesota.
  • Improvements in Low Power, End window, Transmission-Target X-ray Tubes
    analysis (FEA) charged-particle beam modeling software it was possible to design an improved cathode optic with significantly better electron beam performance. This results in higher electron density on the target and a more stable beam position. 4) Finally, innovations in the high-voltage power supply
    to 0.1 um, the physicists assert that the method can even make quick work of that chipmaking nemesis, the killer particle measuring less than 0.1 um. Waiting for liftoff: Julius Perel, top left, and John Mahoney examine their wafer-cleaning invention. In bottom photo Mahoney displays the working
  • Medical Device Link .
    New Device Provides Better Virus Detection Environmental-health monitoring systems at hospitals could be improved with the development of a device sensitive enough to detect a single virus particle. (West Lafayette, IN) researchers have produced a miniature �cantilever,� a beam
  • MICRO:Top 30 (November/December 2001)
    their sealing ability after continuous exposure to temperatures 320 C in one formulation. A choice of black, white, and translucent materials is offered. The Sysmex FPIA-2100 is a fully automated particle size and shape analyzer that delivers size and shape distribution data and, using a CCD camera, produces
  • Drift Correction (.pdf)
    Samples being analyzed in a scanning electron microscope can build up a charge from the beam. This happens when a sample or area (i.e. phase, particle, edge, etc.) does not conduct the electrical charge from the electron beam away from the sample properly. Gross examples of charging can be observed

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