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PC Profilometer

 

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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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  • Description: Fast 3D noncontact profilometer, manual benchtop unit
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Common Specific Parameters: Roughness Average (Ra), Waviness Average (Wa)
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Common Specific Parameters: Roughness Average (Ra), Waviness Average (Wa)
  • Description: Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification.
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Flatness, Step Height, Thickness, Warp / Bow
    • Common Specific Parameters: Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), Peak Count (PC)

Conduct Research Top

  • Soluble Narrow Band Gap and Blue Propylenedioxythiophene-Cyanovinylene Polymers
    of a standard human observer. Fluorescence and excitation spectra were obtained using a Jobin-Yvon Fluorolog-. 3PL spectrophotometer. For polymer solutions, emission quantum yields were measured. relative to zinc phthalocyanine (Zn-PC) in pyridine2 or zinc tetraphenylporphryn (Zn-. TPP) in toluene.3
  • MICRO:Product Technology News (June '99)
    to be as reliable as the smaller system. Field-proven components integrated in the 300-mm tool include the handling robot, process elements, and the PC-based ControlWorks system software. (Semicon West, San Francisco, South Hall, Booth 2416) Pneumatic Diaphragm Valves George Fischer Tustin, CA The +GF

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