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  • A multi-modal stereo microscope based on a spatial light modulator
    Spatial Light Modulators (SLMs) can emulate the classic microscopy techniques, including differential interference (DIC) contrast and (spiral) phase contrast.
  • Drift Correction (.pdf)
    Samples being analyzed in a scanning electron microscope can build up a charge from the beam. This happens when a sample or area (i.e. phase, particle, edge, etc.) does not conduct the electrical charge from the electron beam away from the sample properly. Gross examples of charging can be observed

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