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Phase Correcting Metrology Equipment
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Product Announcements
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Starrett 
Lapmaster International 
Leica Microsystems, Inc. 
Precitec, Inc.
MSI-Viking Gage
Leica Microsystems, Inc. |
Products/Services for Phase Correcting Metrology Equipment
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Surface Metrology Equipment - (300 companies)Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects. How to Select Surface... Search by Specification | Learn More -
Metrology Fixtures and CMM Fixtures - (55 companies)...fixtures are used with shop floor gaging systems such as those used in the automotive industry. Metrology fixtures and CMM fixtures also include OQ room fixtures, products that are designed for use in clean rooms, laboratory instruments and equipment. Learn More -
Semiconductor Metrology Instruments - (179 companies)Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers... Search by Specification | Learn More -
Phase Meters - (59 companies)...protection. These standards include the requirements defined in the EU 's Restriction of Hazardous Substances (RoHS) and Waste Electrical and Electronics Equipment (WEEE) directives. Phase meters that bear a CSA Mark have been tested by the Canadian... Search by Specification | Learn More -
Phase Converters - (61 companies)Phase Converters Information. Phase converters transform single-phase power into three-phase power for the operation of industrial motors, pumps, and other equipment. A 3-phase converter is a rotating machine, much like a motor, that converts... Search by Specification | Learn More -
Dimensional Measurement and Metrology Services - (215 companies)...and metrology services use a variety of instruments and equipment to measure parts. A dimensional measurement system is a complete set of measuring instruments and equipment. Dimensional laboratory metrology may involve coordinate metrology and surface... Search by Specification | Learn More
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Three Phase Uninterruptible Power Supplies (UPS) - (325 companies)Three phase uninterruptible power supplies (UPS) operate in conjunction with existing electrical systems to provide power conditioning, back-up protection, and distribution for electronic equipment loads that use three-phase power. A three phase UPS... Search by Specification | Learn More
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RF Phase Shifters - (83 companies)RF Phase Shifters Information. RF phase shifters are twin-ported devices that alter the phase of an output signal in response to an external signal. Variable phase shifters change the output signal phase by applying a variable control signal... Search by Specification | Learn More
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Single Phase Uninterruptible Power Supplies (UPS) - (571 companies)Single phase uninterruptible power supplies (UPS) sit between an AC outlet and an electronic device to provide power conditioning, back-up protection, and distribution for electronic equipment loads. They also prevent power disturbances from... Search by Specification | Learn More
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Single Phase Surge Suppressors - (178 companies)Single phase surge suppressors protect equipment from transient overvoltages present on AC single phase power lines. Single phase surge suppressors protect equipment from transient overvoltages present on AC single-phase power lines. They carry... Search by Specification | Learn More
Product News for Phase Correcting Metrology Equipment
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Metal Cutting Corporation
Cleanroom MetrologyOur cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more) -
Lapmaster International
Lapmaster FTP 130 for MetrologyLapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more) -
MTI Instruments Inc.
Wafer Metrology Measurement ToolThe Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used to... (read more) -
MSI-Viking Gage
Outsource All Your Metrology NeedsMSI-Viking Gage can customize and administer a Total Solution Program to manage the calibration, maintenance and inventory control of all your company's metrology equipment. Fully Customized Total Solution Programs. There is no charge to you for us to meet with you, evaluate your needs and develop a program to meet your company's very specific requirements and wishes. Your Total Solution Program can include any combination of these services tailored to your business: Regularly scheduled... (read more) -
Mahr Federal Inc.
MarSurf™ WS 1 Optical Surface Metrology SystemMahr Federal has expanded its offerings in the world of optical surface metrology with the introduction of the MarSurf ™ WS 1. Utilizing white light interferometry in a compact design, the MarSurf WS 1 offers vertical resolution of 0.1 nm (.004 µin) and provides three-dimensional measurement in only a few seconds. Utilizing MarSurf XT 20 topographical evaluation software, the space-saving MarSurf WS 1 can be configured to work both in the lab and on the shop floor. With the new processes... (read more) -
Nikon Metrology, Inc.
iSpace Metrology System for ArcheologyDrawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more) -
PixeLINK
Machine Vision Cameras for MetrologyMetrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more) -
Rigaku Corporation
TXRF-V310 Metrology InstrumentTXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more) -
Rigaku Corporation
MFM65 Process XRR, XRF, and XRD metrology FAB toolThe Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks. Designed for high-volume manufacturing. The MFM65 is designed with high-volume 200mm and 300mm manufacturing in mind: high-throughput thickness measurement by XRR and XRF, low-contamination wafer... (read more) -
Nikon Metrology, Inc.
Nikon Metrology Introduces a New WebsiteBRIGHTON, MI - January 26, 2012 - Nikon Metrology introduced a significant update and re-design of its website (http://www.nikonmetrology.com/). This re-design gives users a faster and more customized way to find the Nikon Metrology information that they need. Users will be given the option of looking up information either by specific product or by applications. The Application tab allows the user to select an application area such as aerospace and view a set of products that meet the demands... (read more)
Conduct Research
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Using SSA to measure the efficacy of automated defect data gathering
understanding and correcting important yield issues. The integration of product and process data into an automated analysis environment facilitates a significant increase in yield management capabilities. Results of such automated defect data capabilities include improved wafer throughput in the fab...
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MICRO: Expansions and Acquisitions
program for correcting physical design violations. Defect software firm bought. HPL Technologies has purchased Defect and Yield Management (DYM), a supplier of defect management software, for approximately $16.5 million. Based in Massachusetts, DYM makes the Odyssey System software. The program...
Engineering Web Search: Phase Correcting Metrology Equipment
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Netscape | Company Boardroom ZYGO Releases LIFTS? Stage Solution for Flat Panel Metrology and Inspection |
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IEEE - Fellow Class of 2010 |
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IEEE - Fellow Class of 1994 Murray W. Davis for contributions to a thermal rating system leading to increased capacity of overhead transmission lines and power equipment |
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Photomask and X-Ray Mask Technology IV - Photomask Japan '97 |... Correcting method for mechanical vibration in electron-beam lithography system |
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Metrology, Inspection, and Process Control for... Metrology, Inspection, and Process Control for Microlithography XI (Proceedings Volume) Thinking small: challenges for metrology at century's end |
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CAUSAL ANALYSIS OF SYSTEMATIC SPATIA L VARIATION IN OPTICAL... i Chapter 4 Spatial Variation Characterization in DUV Lithography Using Electrical Metrology. |
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Spanos & Poolla EE290H F03 EE290H Special Issues in... ? Metrology ? Modeling and Simulation ? Design Rules and Redundancy ? Parametric Yield ? Parametric Variance and Profit ? Metrology and Test Patterns |
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Error 404--Not Found See SAE International Information |
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Communities | ISA Lord defines active balancing as "correcting an imbalance in machinery while in operation," which is faster and more effective than conventional See International Society of Automation Information |
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Nanotechnology White Paper Organisation for Economic Co-operation and Development OEM Original Equipment Manufacturers OEI Office of Environmental Information OIA Office of |
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