Polymer Contamination Measuring Device

Conduct Research

• MICRO: Measuring and controlling wafer temperature during plasma etching
  blog. Greatest Hits of 2005. Featured Series Web Sightings Media Kit. Comments? Suggestions? Send us your feedback. MicroMagazine.com. Measuring and controlling wafer temperature during plasma etching. Calvin T. Gabriel, Advanced Micro Devices; and Arwa S. Ginwalla, formerly with SensArray...
• PREPARATION OF MEDICAL DEVICE SURFACE FOR ADHESIVE BONDING
  in the bulk of the polymer was diffusing to the surface and creating a thin release film on the part s surface. Due to other requirements, the additive could not be removed from the formulation. It was established that if the surface was sufficiently clean to achieve good initial adhesion, the long term...
• Using an in-line monitor to obtain real-time moisture measurements (First of two parts)
  pressure ionization mass spectroscopy (APIMS) analyzers to a variety of less accurate, less costly alternatives.1 3 Two widely used detection devices are coulometers and polymer-coated quartz crystal microbalance (QCM) sensors. Other types of non-APIMS analyzers include capacitive and dew-point...
• Precision moves with pint-sized motors
  sheets between discs of PZT ceramic. The sheets serve as electrical contacts. PZT doesn't handle pulling forces well, so actuators typically incorporate a preload. Most manufacturers encapsulate the stack in a polymer to guard against contamination, though actuator maker PI has devised a ceramic...
• Using Corona Cameras as Reliable Tools to Diagnose Compromised Insulators Prior to Failure
  Corona discharge is a major threat to the integrity of non-ceramic polymer insulators (NCI). It produces Ozone, nitric oxides and emits Ultra Violet leading to erosion and decomposition of the insulators' and affecting their mechanical and electrical properties. Ongoing research is performed...
• MICRO:Product Technology News (Oct '99)
  Matrix S200 metrology systems for CMP and etch provide application-specific sets of metrology techniques. The S200 CMP system has a 5 ' 10-mm-spot, 633-nm HeNe laser ellipsometer for measuring on-product substrate n and k and a 2.5-mm-spot, 470 905-nm reflectometer for measuring film thickness...
• Plastic Microfluidics Assembly with Lasers (.pdf)
  as a. materials have been silicon, metals, glass/quartz, or. complementary joining process for plastics and has been. unique polymer such as PDMS mainly because micro. successfully introduced in many industrial application. fabrication methods for these materials have been. areas [2]. extensively...
• Sensors eye Fluids And Lubricants
  . They have a dielectric polymer sandwiched between metal electrodes, encapsulated in a ceramic substrate for added durability. Water that migrates into the dielectric increases capacitance, and an RTD (resistancetemperature-detector) sensor in the probe compensates for temperature changes. Measuring...
• Flu bug finder on a chip
  , researchers tested DNA from a human, a mouse, and from a strain of influenza. The entire device would be about the size of a TV remote control. Presently, there are different versions of the device measuring between 1 and 2 in. in length and width. The chip does not yet include a purification unit...
• MICRO:Product Technology News (Sept '99)
  in conjunction with single- or multispindle heads. Applications include balancing pressure distribution during CMP machine setup, aligning polishing heads, detecting and measuring polishing-pad wear, and performing QC on rebuilt carriers. The noncontact, laser-based WaferGage inspection system captures...

Engineering Web Search: Polymer Contamination Measuring Device