Position Measuring Interferometer

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• A Primer on Displacement Measuring Interferometers
  A Displacement Measuring Interferometer (DMI) measures linear and angular displacements with very high accuracy and precision. DMI's are used in a variety of applications which can be broken into two broad categories: • high resolution real time position control systems, such as those used...
• Novel Interferometer Enables Challenging Measurements
  Dynamic interferometry is a standard technique for measuring optics, meter-class optics and optical systems in challenging environments. The method provides high out-of-plane resolution and repeatability even in the pres¬ence of significant vibration and air turbulence. A new dynamic interferometer...
• A Monolithic Interferometer
  of the interferometer mirrors is accu-. rately moved, causing movement of the fringes. In addition, focus-. ing the fringes on a photodetector enables measurement of their. intensity. This combination of controlling the linear movement of. Fixed mirror. the fringes, and thus the optical path, and measuring...
• Ultra-Precise 6D-Measuring System for Optical Surfaces (.pdf)
  Inserts for precision optical molds. make high demands on the testing. process. Today, such testing can. easily be automated with the help of. interferometric measuring devices. Parallel-kinematics Hexapod 6-axis. alignment systems even make it. possible to integrate testing directly...
• Resulting Position Error After Mulitpoint Linear Error Compensation with the LIDA 400 (.pdf)
  The accuracy of incremental linear encoders is comprised mainly of the position error over larger distance intervals and the position error within one signal period. With the LIDA 400, the position error over the measuring length is measured in a comparative measurement with a calibrated reference...
• Case Study: A Madrid, Spain-based precision engineering business specializing in complex parts for aerospace and defense applications has invested in a Renishaw REVO(R) five-axis measuring head and probe system.
  are somewhat more demanding, leading to further investments in other advanced metrology systems such as a white light interferometer microscope for measuring roughness, and a contact profile meter capable of assessing the size and texture of a part’s surface. Sophisticated expertise and technology...
• Sensors Reference Guide: One Sensor, Multiple Targets
  to as teh sensing element (SE). The magnet position is determined by measuring the time it takes for the wave to travel along the waveguide. The time is measured from the initiation of the SE interrogation pulse until the return signal is detected by the pickup. The drive and signal-conditioning...
• One Sensor, Multiple Targets
  whose shape is a highly predictable characteristic of this sensing configuration. The complete waveguied, damp, and pickup assembly is commonly referred to as teh sensing element (SE). The magnet position is determined by measuring the time it takes for the wave to travel along the waveguide...
• Surface Profiling by Frequency Domain Analysis of White Light Interferograms
  is the angular wavenumber of the source light. As a consequence, there is a. simple relationship between the rate of change of phase with wavenumber and the path length: d dk = x . (2.). Measuring distances with the aid of Eq.(2.) has some distinct advantages when compared to. conventional...
• Long Scan Autocorrelator
  are quite expensive. Several indirect methods for measuring ultrashort pulses have been developed. Detailed reviews can be found in, "Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses," by Rick Trebino, Kluwer Academic Publishers, Boston, 2002, and "Ultrashort Laser Pulse...

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