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Precision Surface Metrology
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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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Supplier: Mahr Federal Inc.Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Surface Metrology: Surface Profilometry
- Measurement Capability: 3D / Areal Topography
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Mechanical Parts (Bearings, Shafting), Precision Machining / Grinding
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Supplier: Bruker Nano Surfaces DivisionDescription: The ContourGT-X8 PSS provides highly repeatable, high-throughput, precision surface metrology of high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS). Based on the flagship ContourGT™ X8, this special configuration combines advanced non-contact 3D measurement
- Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Semiconductor Manufacturing
- Mounting / Loading: Benchtop
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Supplier: Corning Specialty MaterialsDescription: Industry-leading surface form measurement for precision components
- Surface Metrology: Surface Profilometry
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Flatness, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Straightness, Warp / Bow
- Standards Compliance: ISO / EN
- Technology: Non-contact - Optical / Laser
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Supplier: MSI-Viking GageDescription: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 3D / Areal Topography
- Industrial Applications: Mechanical Parts (Bearings, Shafting), Precision Machining / Grinding
- Mounting / Loading: Benchtop
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Supplier: Polytec, Inc.Description: Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution
- Measurement Capability: 3D / Areal Topography, Flatness, Parallelism, Roundness
- Technology: Non-contact - Optical / Laser
- Industrial Applications: Aerospace / Defense, Automotive, Other
- Mounting / Loading: Benchtop
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Supplier: Equipment Solutions, Inc.Description: developed for companies that produce instrumentation or tooling requiring high precision alignment. The autocollimator also provides a means to inspect and characterize material and components. The package is comprised of a sensor module and with integrated electronics for direct readout from a PC
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Supplier: Mahr Federal Inc.Description: High-precision form and position tolerance checking system for laboratory and measuring room High precision automatic form measuring station for comprehensive evaluation Large measuring volume High loading capacity (high performance) up to 1000 N
- Surface Metrology: Form Measurement
- Measurement Capability: 2D / Line Profiles, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Standards Compliance: ISO / EN, DIN
- Technology: Contact / Stylus Based
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Supplier: Mahr Federal Inc.Description: High-precision form, position and 3D measurements on cylindrical testpieces are performed using the centering and tilting table.\ With one set-up, it is also possible to measure geometrical elements transversely to the testpiece main axis. For example, straightness or roundness measurements can
- Surface Metrology: Form Measurement
- Measurement Capability: 3D / Areal Topography, Coaxiality, Cylindricity, Flatness, Parallelism, Roundness, Runout, Squareness / Angularity, Straightness, Specialty / Custom
- Technology: Contact / Stylus Based
- Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting)
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Supplier: Rigaku CorporationDescription: the wafer surface to identify "hot spots" that can be automatically re-measured at higher precision. Optional ZEE-TXRF capability overcomes the historical 15 mm edge exclusion of original TXRF designs, enabling measurements to be made with zero edge exclusion.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Particle Contamination
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Supplier: PI (Physik Instrumente) L.P.Description: . These stages feature an ultra-precise, flexure guiding system which confines motion to the XY plane and reduces runout in Z to a few nanometers or less. This unsurpassed trajectory precision is fundamental for highest-precision surface metrology applications. These stages provide a positioning
Featured Products for Precision Surface Metrology Top
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resolution and measuring accuracy.". The white light optical sensor in the MarSurf WS 1 enables the rapid, high-precision recording of surface topography on a wide range of materials. Using white light and a CCD camera, the system is able to collect height information through the field of view of the camera. Both the test surface area and a high-precision reference surface built into the objective lens are imaged simultaneously by the camera. During measurement, the Mirau objective is moved... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc. -
Separates into Two Pieces. The innovative SR100 separates into two pieces to measure surface roughness. The bottom half of the SR100 contains the traverse mechanism and stylus pickup assembly which is placed on the surface to be measured. Its wide base ensures stability. The upper half includes a large LCD display, start button, mode and parameter buttons, comfortably hand-held for easy operation and clear viewing. How it Works. A diamond stylus is drawn across the part. The motorized traverse... (read more)Browse Surface Metrology Equipment Datasheets for Starrett
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consumption. With the DVM2500 and DVM5000 HD, Leica Microsystems is offering two microscope systems that deliver full reports fast and with digital precision. The selection of zoom optics and extensive accessories enable the digital microscopes to be tailored to a wide range of applications and to the particular infrastructure at the user's site. The subsequent analysis of the results is faster and easier than ever before. Learn more via the links on the left - or e mail your inquiries... (read more)Browse Surface Metrology Equipment Datasheets for Leica Microsystems, Inc.
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Remet equipment is robust, easy to use and competitively priced. For the last 40 years Remet has designed and manufactured their own equipment in their state of the art factory. Together we engage in extensive product/application development aimed at improving surface finish, repeatability, and ease of use. What We Offer. Metallographic Machines. Complete Line of Consumables. Expertise in Sample Preparation. Worldwide Distribution. Consumables Delivery From Stock. Please Visit Our Lapmaster... (read more)Browse Surface Metrology Equipment Datasheets for Lapmaster International
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the Product Information form to request a prospectus. Fast high-precision topography measurement. Nemesis represents a high resolution contactless 3D Measuring unit for surface topography, profiles and transparent layer thickness. Precision stages with linear drives mounted on a highly stable grante portal assure service-free and precise operation in laboratories as well as in industrial production. Precitec Group - The market's choice. Precitec has gained an international reputation for being an expert... (read more)Browse Surface Metrology Equipment Datasheets for Precitec, Inc.
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operation. Optional Sweeping TXRF software enables mapping of the contaminant distribution over the wafer surface to identify "hot spots" that can be automatically re-measured at higher precision. Optional ZEE-TXRF capability overcomes the historical 15 mm edge exclusion of original TXRF designs, enabling measurements to be made with zero edge exclusion. TXRF 3760 specifications. Size of wafer: 200 mm max. Rotating-anode X-ray source. Sample stage: XY θ stage. Solid-state detector. Oil-free... (read more)Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation
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TXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)Browse Semiconductor Metrology Instruments Datasheets for Rigaku Corporation
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turbine blades, appliance housings and much more. "The HN-6060 multi-sensor system builds upon the Nikon Metrology portfolio of vision systems and 3D solutions." says Myles Richard, Managing Director of Americas for Nikon Metrology, "It addresses the need for fast, high-accuracy 3D inspection of complex shapes by combining innovative optical technology with the highest precision measurement hardware." The newly designed laser scanning sensor extracts the surface form and waviness data in one... (read more)Browse Metallurgical Microscopes Datasheets for Nikon Metrology, Inc.
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The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns are used... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc.
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detection systems, or for applications requiring a compact optical path. Each aspheric lens is serialized and provided with a complete metrology data package. The test data package includes a surface profile performed on our Taylor Hobson Talysurf Profilometer, an interferogram of the spherical surface, and tested values for diameter, center thickness, and centration. For custom designed calibration grade precision aspheric lenses, coating requirements, or volume pricing, please contact our Sales... (read more)Browse Optical Lenses Datasheets for Edmund Optics Inc.
Parts by Number for Precision Surface Metrology Top
| Partb # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 599-622-222 | Amazon | Hexagon Metrology | Industrial & Scientific | Brown & Sharpe 599-622-222 Universal Surface Gage Large/B |
| 599-621-222 | Amazon | Hexagon Metrology | Industrial & Scientific | Brown & Sharpe 599-621-222 Universal Surface Gage Small/B |
| 599-621-192 | Amazon | Hexagon Metrology | Industrial & Scientific | Brown & Sharpe 599-621-192 9" Universal Surface Gage Small/B |
| 599-585-1 | Amazon | Hexagon Metrology | Industrial & Scientific | Brown & Sharpe 599-585-1 Hite-Chek Jr Height Transfer/Squareness Gauge, 3.5" Length x 2.5" Width x 1.3" Height |
| 599-7763 | Amazon | Hexagon Metrology | Industrial & Scientific | Brown & Sharpe 599-7763 Miti Mite Small Size Medium Duty Magnetic Base With Fine Adjust |
Conduct Research Top
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Measuring Surface Slope Error on Precision Aspheres (.pdf)
. Practical examples of slope specifications and experimental results will be presented. Why is it important for an optical designer to control slope errors. Measuring surface slope error on precision aspheres. James J. Kumler*a, J. Brian Caldwell, PhDb. aCoastal Optical Systems, 4480 South Tiffany
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MICRO: Defect/Yield Metrology - Schramm (October 2000)
broadband optics with spatial filtering can improve the contrast of an image, but the granularity of the substrate, the variation in edge detail, and the asymmetry of the registration mark can overwhelm a standard measurement algorithm and significantly decrease the precision, accuracy, and success rate
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Surface Measurement Learns Tolerance
of a complete range of production dimensional measuring technology. Mahr measuring instruments - from calipers to optical coordinate measuring systems - are used for measuring minute length, form and surface deviations on workpieces in the automotive industry and in the mechanical, precision and optical
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Advances in Interferometric Metrology
In the testing of optical components and optical systems there are many requirements on the precision and accuracy, measurement time, ease of use, dynamic range, and environmental conditions. Interferometry, and in particular phase-shifting interferometry, has the precision and potential accuracy
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Case Study: A Madrid, Spain-based precision engineering business specializing in complex parts for aerospace and defense applications has invested in a Renishaw REVO(R) five-axis measuring head and probe system.
"good times roll". New surface finish probe. CMM retrofit reduces inspection times and gains new business. Top German award for Renishaw’s PH20 five-axis measurement system. Measuring with speed and precision. New 5-axis head for touch-trigger inspection on CMMs. ANT Industries cuts inspection times
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Watch and Clock Part Surface Quality Depends on White-light Interferometry (.pdf)
Optical metrology is gaining in importance for quality assurance of precision micro-parts. Fast, high resolution measurements using a non-contact, non-reactive (zero mass loading) optical technique are particularly appealing for micro-parts. By reviewing an application from the watch
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MICRO: Critical Material-Wafers
be scrapped, because of surface damage or metallic contamination, and manufacturers may lose as much as 4% of a production run for such sampling. To be qualified as a production-worthy alternative tool, however, the noncontact system must be able to demonstrate equal or improved measurement capability over
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MICRO: Prod Extra
to that of atomic layer deposition (ALD) and with the manufacturing throughput of conventional chemical vapor deposition systems. NLD allows manufacturers to choose from a wide field of deposition precursors (a key limitation of ALD) to apply thin films onto the surface of a wafer with atomic layer
Engineering Web Search: Precision Surface Metrology Top
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Electro-Optical Metrology, Workshop Surface Finish, Conoscopic...
Spectrum Metrology was formed in 1998 and we are specialists in the field of electro-optical metrology, surface roughness, contact and non-contact
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Metrology World .com: Digital Marketplace for the measurement...
economical and powerful new skidless surface evaluation system to its MarSurf line of mobile surface metrology systems at WESTEC 2012, ...
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Sensofar
SENSOFAR is a leading-edge technology company operating at the highest quality standards within the field of non contact surface metrology.
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Untitled
: Industrial Metrology (278) Open Directory - Business: Industrial Goods and Services: Machinery and Tools: Industrial Metrology
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Taylor Hobson - Roughness, Roundness and Non-Contact...
Applications Surface Profilers Roundness & Form
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Surface Metrology Equipment Data Sheets on GlobalSpec
Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components.
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Starrett Precision Measuring Tools and Saw Blades Since...
Metrology Products Precision Measuring Tools Machinists' Precision Shop Tools Surface Gages
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Interferometry - Wikipedia, the free encyclopedia
for the measurement of small displacements, refractive index changes, surface irregularities and the like.
