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Parts by Number for Prober Top

Part # Distributor Manufacturer Product Category Description
7199848 RS Components, Ltd. Menda Work Area Type:Prober Tool
12680014 PLC Radwell Parker Not Provided ASSEMBLY 2PC PROBER ZLIFT A
12680014 PLC Radwell Bayside Not Provided ASSEMBLY 2PC PROBER ZLIFT A
35619 Allied Electronics, Inc. MENDA Not Provided Tool, Prober; Nylon; Straight; Nylon; 6-3/4 in.
35616 Allied Electronics, Inc. MENDA Not Provided Tool, Prober; Wood; Straight; Wood; 7 in.
35622 Allied Electronics, Inc. MENDA Not Provided Tool, Prober; Nylon; Straight; Nylon; 6 in.
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Conduct Research Top

  • Linear stepper motors keep positioning in line
    A dual-axis linear stepper motor from Baldor has a 0.02-in. tooth pitch. It is available in a wide range of custom platen sizes and both single and dual-axis configurations. It is used in applications ranging from wafer probers to electronic assembly and etching machines. Designing a two-axis
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Heard on the Beat (Nov. 30) Heard on the Beat, Nov. 30 TEL enhances prober to handle mix of 200- and 300-mm wafers TOKYO -- In a move to increase flexibility and throughput in wafer-test operations, Tokyo Electron Ltd. today announced an enhanced version of its P-12XL prober, which adds a new sort
  • Automated Test Platform
    testers can deal with more than one of these groups. Testers consist of a test control unit or panel and test head. Automated test platforms are used in conjunction with interfaces, source and measure units, handlers or probers. The interface or connection system to provides electrical paths
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    In a move to expand its portfolio of wafer probers, Electroglas Inc. announced that it has agreed to purchase software maker Statware Inc. for an undisclosed amount. Intel buys Indian networking group Intel Corp. said this week that it will acquire the consulting group of Network Solutions
  • MICRO:Archives of 1997 Back Issues
    deep-UV unit for Applied minifab; W-J CVD tool going to UMC; CFM scores Taiwanese order; MR head maker likes Veeco; Moto goes for Electroglas probers Applied plasma clean process KO's PFCs; USDC aligns with Elsicon; IES becomes IEST; updated EE text published IEDM, ISS 98, FID, 3C '98, and more
  • Important Information Concerning Mercury
    disposing of Mercury products: This product contains Mercury. a hazardous material!. Mercury Free Products. Important Information Inside!. from Palmer Wahl. Digi-Stem T/C & RTD Thermometers. Heat Prober Hand-Held Digital Thermometers. When your Mercury Filled instrument has reached. the end of its
  • Statistical Process Control of Wireless Device Manufacturing Needs Production Worthy S-Parameter Measurements
    -and-Stack DC/RF Parametric Test System. Special prober and chuck required. No test executive; each test program is usually created in BASIC. Multiple manual calibrations needed; low repeatability. Manual de-embedding1 prone to probe variations due to contamination (resonance). Slow measurements, data
  • Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
    mode, when a resistor is being. measured (requiring one SMU), then up to seven SMUs are sitting idle. By measuring. multiple mixed types of devices simultaneously within a single probe touchdown and thereby. increasing utilization of both the tester and the prober, parallel test delivers higher

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