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Profile Measuring Interferometer
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Products/Services for Profile Measuring Interferometer
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Interferometers - (111 companies)...through and is reflected from a second beamsplitter. Twyman-Green interferometers are similar to Michelson interferometers in terms of the beam splitter and mirror arrangement, but different in terms of illumination. A Michelson interferometer uses... Search by Specification | Learn More -
Measuring Microscopes - (97 companies)Measuring microscopes are used by toolmakers for measuring the properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view... Search by Specification | Learn More -
Coordinate Measuring Machines (CMM) - (171 companies)...should only be big enough to accommodate the measure of its largest part. Measurement Capabilities. CMMs can be designed to perform different types of measurement. These include dimensional, profile, angularity, depth mapping, digitizing/imaging... Search by Specification | Learn More -
Optical Spectrum Analyzers - (44 companies)...is better wavelength resolution. Fabry-Perot interferometer based optical spectrum analyzers have a fixed, narrow resolution, typically in a specified frequency between 100 MHz and 10 GHz. Due to their narrow resolution, they can be used for measuring... Search by Specification | Learn More -
Dimensional and Profile Scanners - (267 companies)Dimensional and profile scanners gather two-dimensional (2D) or three-dimensional (3D) information about an object. They use several different configurations and technologies. Coordinate measuring machines (CMM) are dimensional and profile scanners... Search by Specification | Learn More -
Wafer and Thin Film Instrumentation - (347 companies)Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
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Metal Profiles and Structural Shapes - (84 companies)Metal profiles and structural shapes include metals and alloys with uniform cross sections such as tees, angles, channels, I-beams, rectangular tubes, and specialty cross sectional shapes manufactured through extrusion, continuous casting, roll... Search by Specification | Learn More
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Tensiometers and Surface Tension Meters - (60 companies)...a vertical plate is attached to the balance and the force generated due to wetting of the plate is measured. Surface tension measuring instruments include tensiometers, devices that are used to measure the moisture content in the soil. In some... Search by Specification | Learn More
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Surface Profilometers - (190 companies)Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters. Surface profilometers are used to measures surface profiles, roughness, waviness and other finish... Search by Specification | Learn More
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Surface Metrology Equipment - (300 companies)...the profile of the part or cylindrical surface under evaluation. Roughness profiles are the finer scale surface variations that remain after form and waviness variations have been filtered out of the raw profile. Squareness or perpendicularity... Search by Specification | Learn More
Product News for Profile Measuring Interferometer
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Lapmaster International
Interferometer Flatness MeasuringThe Lapmaster/LAMTech TOPOS and SPI series of Interferometers both feature Grazing Incidence flatness inspection and the measurement capability for grinding, lapping and polishing applications. Reflective surfaces, matte surfaces and ground surfaces can all be optically measured. The compact and cost-effective SPI series (Models #75 & #130) are contact flatness measuring gauging systems and utilize grazing incidence interferometry, providing the capability to measure surface flatness... (read more) -
Pratt & Whitney Measurement Systems, Inc.
Laseruler ® for Vertical MeasuringLaseruler® for Vertical Measuring. Your solution for vertical measuring is the Laseruler® which is laser-interferometer-based for very high accuracy. Our exclusive digital interferometer measures the dimension of the specimen by comparing the measurement probe position to the wavelength of a HeNe laser light source, effectively coupling the wavelength of light to the part being measured. Our patented laser path is in-line with the measurement axis to eliminate Abbe offset error. The Laseruler... (read more)Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc. -
Pratt & Whitney Measurement Systems, Inc.
Retrofits/Upgrades - Measuring MachinesRetrofits/Upgrades - Measuring Machines. Pratt & Whitney measurement instruments are designed to provide years of dependable operation, however your measurement requirements may change. Pratt & Whitney offers rebuild and retrofit programs to update obsolete instruments to either a digital or laser configuration. All components are evaluated and replaced as required or remanufactured to new condition. Our full warranty applies and the instrument is certified traceable to NIST. (read more)Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc. -
MSI-Viking Gage
Vertical Floor Standing Measuring ProjectorStarrett VF600 Vertical Floor Standing Measuring Projector, 24" (600mm) Screen, Workstage travel is 8" x 4" (200 x 100mm). Availability: Call for Quote and Ordering. Especially suitable for larger components found in the electronics, pressings, and extrusion industries. The VF600 is ideal for use with overlays. Screen is angled 30º from horizontal for clear, easy viewing. Workstage plate is 16" x 9" (400 x 225mm). Glass insert is 9 ¼" x 5 ½" (235 x 140mm). Workstage travel is 8" x 4" (200 x... (read more)Browse Optical Comparators Datasheets for MSI-Viking Gage -
Knick Elektronische Messgeraete GmbH & Co. KG
The Art of Measuringcapability of the measuring signal and the load connected to the isolator output should be known. Load capability of output. The load capability of voltage outputs is generally indicated by the max. current. Almost all manufacturers specify a resistance value for the load capability at current outputs. This specification does not indicate the load capability of the output currents of Knick isolation amplifiers absolutely correctly. Therefore the output load capability is 'traditionally' given... (read more)Browse Signal Conditioners Datasheets for Knick Elektronische Messgeraete GmbH & Co. KG -
Eraser Company, Inc.
MEASURING METERS PROVIDE ACCURACY IN MEASURINGEraser's WM Series Measuring Meters are specifically designed to measure long lengths of wire, cable, flat cable and other flexible materials used in the electrical, electronic and associated industries. A digital counter records the amount of material measured. Models WMI, WMIG and WMIU measure in feet and inches to 9,999.00', 11". Models WMM, WMMG and WMMU measure in 1/10 meters to 9,999.9 m. Feed wheel material is model dependent; steel, abrasive coated or urethane. Custom design services... (read more)Browse Web Winders, Rewinders, and Unwinders Datasheets for Eraser Company, Inc. -
Pratt & Whitney Measurement Systems, Inc.
Laser Measuring Machine - Long Length ExternalLaser Measuring Machine - Long Length External. Long Length Measuring Machines are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper. The Electrolimit based measuring instrument utilizes a precision graduated master bar and maintains a non-accumulative accuracy throughout the measuring range. Our most recently developed Laser-based... (read more)Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc. -
Pratt & Whitney Measurement Systems, Inc.
Digital Measuring Machine - Long Length ExternalDigital Measuring Machine - Long Length External. Long Length Metrology Laboratory Measurement Systems are offered in standard lengths to 3 meters (120 inches) available with either our Electrolimit or laser based transducer, both easily measuring length, diameter, pitch diameter, roundness, parallelism and taper. The Electrolimit based measuring instrument utilizes a precision graduated master bar and maintains a non-accumulative accuracy throughout the measuring range. Our most recently... (read more)Browse Calibration Instruments Datasheets for Pratt & Whitney Measurement Systems, Inc. -
Creaform Inc.
MaxSHOT 3D Optical Coordinate Measuring SystemThis complementary product adds the accuracy and speed of photogrammetry to the wide range of applications already possible with Creaform technologies, especially when it comes to larger parts. Creaform is renowned for the portable, reliable and very easy-to-use technologies it designs. In concrete terms, the system, combining the MaxSHOT 3D photogrammetric video camera and the VXshot processing software, stands out from other systems because it is so easy to use. Its user-friendly design allows... (read more)Browse Dimensional and Profile Scanners Datasheets for Creaform Inc. -
Industrial Research Institute
Measuring the Effectiveness of R&DMeasuring the effectiveness of R &D has been a perennial challenge. IRI's Research-on-Research working group Measuring the Effectiveness of R &D sought to investigate how managers define R &D effectiveness and what metrics they use to measure it. Via surveys and questionnaires, attendees at IRI meetings revealed that while the three top metrics are unchanged over the past 15 years, there were significant differences in metrics used depending on the industry type. The study also... (read more)
Conduct Research
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Low Coherence Vibration Insensitive Fizeau Interferometer
, and. spatial phase measurement which is also called the spatial carrier method. Temporal phase measurement is a well-established method for measuring optical. wavefront phase 2. In this technique, three or more interferogram intensity profiles are. recorded. For each recording, there is a different...
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Case Study: A Madrid, Spain-based precision engineering business specializing in complex parts for aerospace and defense applications has invested in a Renishaw REVO(R) five-axis measuring head and probe system.
are somewhat more demanding, leading to further investments in other advanced metrology systems such as a white light interferometer microscope for measuring roughness, and a contact profile meter capable of assessing the size and texture of a part’s surface. Sophisticated expertise and technology...
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What is Frequency Domain Analysis?
are interested in. Splitter. Detector. measuring. When the object mirror is scanned. Figure 2: Michelson interferometer. backwards so as to increase the OPD L , the. intensity measured by the detector varies. sinusoidally. The relationship between. intensity and object distance is illustrated in. 1. Figure 3...
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Another way to peer inside the body
more light was used to probe the sample. One technique used to overcome the mirror problem was borrowed from scientists measuring femtosecond light pulses from ultrafast lasers. The light first goes through a diffraction grating and lens before hitting the mirror. This distributes the spectrum...
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Surface Profiling by Frequency Domain Analysis of White Light Interferograms
is the angular wavenumber of the source light. As a consequence, there is a. simple relationship between the rate of change of phase with wavenumber and the path length: d dk = x . (2.). Measuring distances with the aid of Eq.(2.) has some distinct advantages when compared to. conventional...
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Long Scan Autocorrelator
are quite expensive. Several indirect methods for measuring ultrashort pulses have been developed. Detailed reviews can be found in, "Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses," by Rick Trebino, Kluwer Academic Publishers, Boston, 2002, and "Ultrashort Laser Pulse...
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MICRO: Prod Tech News
the surface-imaging quality of a microscope with the high-accuracy measuring capability of a surface profiler, resulting in precise 3-D surface texture, step height, and microdimensional measurements. Used for semiconductor and MEMS applications, the tool uses a patented correlation algorithm to find...
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An Introduction to Portable CMMs (.pdf)
that they utilize cameras and imaging software to perform. the inspection analysis. Machine vision systems are very fast, but can be expensive, are limited to. specific tasks, and are only useful for two dimensional inspections of small parts. Coordinate Measuring Machines. Coordinate Measuring Machines...
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MICRO: Product Tech News
structures and materials. It also provides film thickness, values of n and k, and phase shift of MoSiON, even with the presence of a chrome layer. Handheld Particle Counter. Particle Measuring Systems. Boulder, CO. The HandiLaz Mini is an ergonomically designed, simple-to-use handheld system that counts...
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Surface Analysis: Beyond Roughness
a seal against leaks, either with gaskets or through direct contact. Some surfaces can be made to retain lubricant or adhere a coating. ./ae399718-41d4-43d9-b6e2-04b3e8854b29 Quality 101. 3This measuring system combines. roughness and contour measurements. into a single, integrated system. Using...
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