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Supplier: Bruker Nano Surfaces Division
Description: Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Edge PSS (Patterned Sapphire
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Roughness / Waviness
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Supplier: Zygo Corporation
Description: Fast 3D noncontact robust factory floor profilometer, roughness OR form
- Technology: Non-contact - Optical / Laser
- Form Parameters: Flatness, Step Height, Thickness, Warp / Bow
- Standards Compliance: ASME, ISO / EN, DIN, JIS
- Industrial Applications: Aerospace / Defense, Automotive, Coatings (Thin Films, Plating, etc.), Displays / FPD, Electronics, Mechanical Parts (Bearings, Shafting), Medical, MEMS, Nanomaterials, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing, Storage Media, Other
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Supplier: KLA-Tencor Corporation
Description: products, integration of new technologies, and improved performance. 30 mm scan length Z sensor range up to 1.2 mm 140mm manual sample positioning stage Force control 0.03mg – 10mg Windows XP, Vista, and Windows 7 compatible The AlphaStep® D-100 profilometer rapidly
- Technology: Contact / Stylus Based
- Surface Metrology: 2D / Line Profile
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Industrial Applications: Coatings (Thin Films, Plating, etc.), MEMS, Semiconductor Manufacturing
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Supplier: Bruker Nano Surfaces Division
Description: XYZ and unique tip/tilt head deliver easy sample setup for operators of any skill level. New Vision64 Operation and Analysis Software provides the industry's most functional and streamlined graphical user interface, combining intelligent architecture with intuitive visual workflow and extensive
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Roughness / Waviness
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Supplier: Bruker Nano Surfaces Division
Description: capabilities with unique Bruker PSS metrology hardware and software, and a Wafer Automation System Developer's Kit (SDK) that provide a tailored solution for PSS quality assurance and quality control applications.
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Roughness / Waviness
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Supplier: Bruker Nano Surfaces Division
Description: to 10mm in height for devices as they actuate. The system integrates a proprietary stroboscopic technology and powerful data acquisition and Vision analysis software to deliver simultaneous static and dynamic device measurements for frequencies from 11Hz to 2.4MHz on a single system. With ContourGT
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Roughness / Waviness
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Supplier: Bruker Nano Surfaces Division
Description: Operation and Analysis Software provides the industry's most functional and streamlined graphical user interface, combining intelligent architecture with intuitive visual workflow and extensive user-defined automation capabilities for fast and comprehensive data collection and analysis. The ContourGT-X8
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Optical Components , Other
- Measurement Capability: Roughness / Waviness
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Supplier: Park Systems, Inc.
Description: accuracy of less than 0.1 degrees • Fully automatic Critical Angle Measurement acquisition and analysis software High Throughput Inline Automation • Allowable sample size: 200/300mm wafers • Automatic data acquisition and analysis of critical angles, roughness and trench measurements
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
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Featured Products for Profilometer Software Top
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Marshall Manufacturing Company
Process Management Delivers Quality
Optical Comparator (50x Magnification). Precision Devices Surfometer Profilometer. Helios UMG 50 Super Micrometer. Bore Gages – Various Hand Tools - Micrometers. Customer Specific Designed Profile Gages. Measurement Capabilities. First Article Inspection. Receiving Inspection. First Piece/Setup Inspection. In Process Inspection. Final Audit Inspection. Statistical Sampling Plans (including C=0 and ANSI/ASQ Z1.4). GR &R Studies (Gage Reproduceability and Repeatability). Process Risk... (read more)
Browse CNC Machining Services Datasheets for Marshall Manufacturing Company -
Micro Quality Calibration, Inc.
Physical Dimensional
. 8" - 30". 0.0001" / .00005". Parallels. 0" - 12". 0.0001". PI Tape. 12" - 72". 0.001". Pin Gages. 0" - 1". 0.0001". Profilometer / Surface Finish. +/- 0.00002" - 0.00006". Protractor. 0 ᵒ- 360 ᵒ. +/- .25 sec. Radius Gages. Multi. .00005". Rotary Table. 4" - 24". .25 sec. Roundness Tester. 0.00001" - 0.00005". Screw Pitch Gages. 0" - 12". .00005". Sine Bars. 12". .00005". Steel Rules. 72". .0001". Surface Plate (Calibrate / Refinish). 6"x6" to 6'x12'. .00001". Tape Measure. 6... (read more)
Browse CMM, Gage, and Inspection Equipment Services Datasheets for Micro Quality Calibration, Inc.
Conduct Research Top
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High Precision Volume Loss Measurements (.pdf)
the volume loss of a. same range, customized devices have been. crater produced by a LIBS laser. constructed. using. a. common. light. path. configuration. These devices are ideal for. measuring coating thickness. Software Application Calculates Volume Loss. After the profilometer acquires data by scanning
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Soluble Narrow Band Gap and Blue Propylenedioxythiophene-Cyanovinylene Polymers
-NiR spectrophotometer. In this dual beam instrument, the baseline was. measured with two PEDOT-PSS coated glass slides and the reference beam was passed. through a PEDOT-PSS coated glass slide during the measurement. The film thickness. was then measured using a Dektak 3030 profilometer
Engineering Web Search: Profilometer Software Top
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Profilometer for non-contact surface measurement, confocal...
Affordable Profilometer Our profilometer systems feature fast and
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Bytewise, A Manufacturer of Non-contact Measurement Systems
Profile360 Profilometer On-Line Profilometer
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The Molecular Materials Research Center
XPS Software Vacuum Equipment Scanning Prob Microscopy & Profilometry DektakXT Profilometer Electrochemical Techniques
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Startseite - FRT, Fries Research & Technology GmbH
Software FRT Acquire Automation XT FRT Mark III Software FRT Software: Steuerung und Analyse der Messergebnisse
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Q&A | UA3P | Ultrahigh Accurate 3-D Profilometer |...
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Software | Electronic Component Mounting-related systems |...
Business > Panasonic Factory Solutions > Electronic Component Mounting-related Systems > Software
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KLA-Tencor P-16+ Profilometer - The Nanofabrication Laboratory...
KLA-Tencor P-16+ Profilometer - Process Characterization RIMS Name: Profilometer: KLA Tencor P16+
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labnetwork: Karl Suss MA150 mask aligner for sale
Previous message: David Menzies: "Profilometer"
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labnetwork: UBM profilo repair?
Does anyone know the way to change the laser diode and recalibrate the sensor of an UBM optical profilometer (microfocus sensor and DOS software) ?
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Nanolab
Dektak 8 Surface Profilometer with 100mm scan, extended vertical range to 1 mm, 3D analysis and stress measurement software.
