Products & Services

See also: Categories | More Information
  • Description: Method for Quantifying Percentage Wood Failure in Block-Shear Specimens by a Laser Scanning Profilometer Volume 2, Issue 8 (September 2005) A new method for quantifying percentage wood failure of an adhesively bonded block-shear specimen has been developed. This method incorporates a laser

    Show More
  • Description: reflectCONTROL Compact has been specifically developed for the inspection of lustrous surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software.

    • Surface Metrology: 2D / Line Profile
    • Measurement Capability: Defects / ADC
    • Industrial Applications: Automotive, Displays / FPD, Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing, Other
    • Factory / Production Use: Yes

    Show More
  • Description: for innovative roughness evaluation software. Features Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085) Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required. Comprehensive measuring

    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Standards Compliance: ISO / EN, JIS
    • Vertical (Z) Range: 0.0098 to 0.0295 inch

    Show More
  • Description: products, integration of new technologies, and improved performance. 30 mm scan length Z sensor range up to 1.2 mm 140mm manual sample positioning stage Force control 0.03mg – 10mg Windows XP, Vista, and Windows 7 compatible The AlphaStep® D-100 profilometer rapidly and quantitatively

    • Surface Metrology: Surface Profilometry
    • Measurement Capability: 2D / Line Profiles, Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Technology: Contact / Stylus Based
    • Industrial Applications: Coatings (Thin Films, Plating, etc.), MEMS, Semiconductor Manufacturing

    Show More
  • Description: Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification.

    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Flatness, Step Height, Thickness, Warp / Bow
    • Common Specific Parameters: Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), Peak Count (PC)

    Show More
  • Description: 0.1 degrees • Fully automatic Critical Angle Measurement acquisition and analysis software High Throughput Inline Automation • Allowable sample size: 200/300mm wafers • Automatic data acquisition and analysis of critical angles, roughness and trench measurements • Automatic tip

    • Form Factor: Monitor / Instrument
    • Mounting / Loading: Floor Mounted / Stand-alone
    • Applications: Semiconductor Wafers
    • Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness

    Show More
  • Description: No Description Provided

    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), Total Roughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point

    Show More
Page: 1

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire