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Z-Scan for the Characterization of Transparent Optical Materials
Reliable methods for determining the nonlinear optical properties of materials (i.e. nonlinear absorption and nonlinear refraction) have been developed for wide ranging applications such as optical limiting, multi-photon polymerization as well as optical switching. Of these methods, "z-scan
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Preface
waves and the phenomena of. refraction and reflection. The next set of chapters introduces the reader to the field. of fiber optics, discussing different types of fibers used in communication systems,. including dispersion-compensating fibers. In later chapters we discuss recent developments
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MICRO: Using a nondestructive in-line system to monitor ultrashallow junctions
. Because there is a significant, built-in electric field at the junction edge, the distribution forms a sharp gradient aligned to that area. The index of refraction of a semiconductor is a function of conductivity and, therefore, of the excess carrier concentration. Consequently, the index of refraction
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Introduction to Prisms
functions. Click Here to view Prisms products. The common denominator shared by all prisms is polyhedral form. In other words, all prisms tend to be solid chunks of glass or crystal with polygonal faces. Sometimes they also have one or more curved faces. Refraction and Reflection. Two principles
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Micro-Optical Sensor Use in Boundary Layer Flows with Polymers and Bubbles (.pdf)
, density, temperature, salinity, or index of. sensors have been fabricated and are scheduled. refraction. to be used in a series of at sea tests. INTRODUCTION. MULTI-LOCATION VELOCIMETER. It is generally accepted that the injection of. An integrated optical flow velocity sensor. polymers and/or bubbles
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MICRO: Optimizing polymers to increase pellicle lifetime and transmission for 157-nm lithography
measurements, and the need for critical information on the material's index of refraction for pellicle-fringe optimization.3 Ellipsometry-based film structure and optical models are required to determine the complex index of refraction and film thicknesses. Also, the rapid turnaround time possible from
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Prism Compressor for Ultrashort Laser Pulses
. amount of GDD. Figure 1 illustrates the results of a numerical. dependent index of refraction, n(), typically in the form of a. simulation of the electric field for three pulses, all containing. Sellmeier's type equation, and then calculate second. 100 nanometers of bandwidth, centered around 800
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MICRO: Editor's Page
to the fabrication line. The past 12 to 18 months have seen the rollout of a fully automated x-ray refraction tool which, noted applications scientist David Joyce, a major semiconductor manufacturer has been using for in-line process control. Also riding the advanced process control wave is Dublin-based