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Supplier: ValueTronics International, Inc.
Description: All purpose RF demodulator probe, usable with most DMMs.
- Probe Type: Logic
- Probe Configuration: Computer / IC
Supplier: Cascade Microtech, Inc.
Description: DC probes can provide power or slow logic to circuit under test
- Probe Type: Voltage, Current, Differential, High Frequency
- Probe Configuration: Flat Blade
Supplier: Fluke Power Quality
Description: The 85RF High Frequency Probe is designed to convert a DC voltmeter with a input impedance of 10M ohms into a high frequency (100kHz to 500Mhz) RF voltmeter. Conversion from AC to DC is accomplished on a one-to-one basis includes a range of 0.25 to 30V rms. The probe’s DC output is calibrated
Supplier: Kikusui America, Inc.
Description: If the DVD pickup or drive has an extremely low clock signal or RF signal level, OP01-KJM offers a gain of 14 dB. Also, its input impedance is as high as 1 M Ohm, while the output impedance is converted to 50 Ohm. This helps suppress the noise effect on the transmission system after probing.
- Probe Type: Voltage, Other
- Probe Configuration: Pincher
Supplier: Hensley Technologies, Inc.
Description: The Agilent 85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high
Supplier: Flir Commercial Systems
Description: RT30: Wireless AC Circuit Identifier (914MHz) with External Probe Local & Remote non-contact Voltage Detection + Remote Light Detection Features: Combines non-contact voltage and light detection with RF (Radio Frequency) transmission technology Remotely identifies mid-run AC wiring, circuit
- Probe Type: Other
- Probe Configuration: Other
- Approvals: Other
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Featured Products for RF Test Probe Top
A.H. Systems Inc.
Injection Current Probes
Injection Current Probes are used to inductively couple large RF currents into conductors passing through their aperture. The conductors are signal, control and power circuits of equipment under test for conducted susceptibility or immunity. Typical specifications requiring the use of injection probes are: · DO-160 · EN-50081-1 · IEC 801-6 · TR-EOP-000063. The purpose of the test is to determine that RF signals in the range of 10 KHz to 400 MHz, when coupled onto conductors and cable bundles... (read more)
Browse Current Sensors Datasheets for A.H. Systems Inc.
Parts by Number for RF Test Probe Top
|Part #||Distributor||Manufacturer||Product Category||Description|
|MXHP32XX2000||Digi-Key||Murata Electronics North America||Cable Assemblies||TEST PROBE|
|PR-650A||Digi-Key||B&K Precision||Test and Measurement||RF PROBE 100KHZ-650MHZ|
|6104||Digi-Key||Pomona Electronics||Test and Measurement||PROBE RF DMM KIT 30MHZ|
|6006-2||Digi-Key||Pomona Electronics||Test and Measurement||PROBE RF X10 INSULATED RED|
|6006-8||Digi-Key||Pomona Electronics||Test and Measurement||PROBE RF X10 INSULATED GRAY|
|MXHS83QE3000||Digi-Key||Murata Electronics North America||Connectors, Interconnects||TEST PROBE MANUL FOR MM8430-8130|
Conduct Research Top
RF Probe Calibration
of. where the state of probe calibration exists. today, issues involved with calibration and. the use of these probes, and finally where. the cal and test labs go from here. 3. Presentation Outline. • Current RF Field Probe Standards. • Types of RF Field Probes. • Methods used to calibrate RF Field
RF Test Gage R&R Improvement
of variation in RF probe measurements. Tester Gage study results are presented. Evaluations of factors including test instrument repeatability, probe card wear, probe tip planarity, probe pressure, and probe placement within the bond pad are presented. The data indicated the repeatability of the test
Probe Calibration Services
to change without notice. Notes for Probe Calibrations. Liberty Labs, Inc. offers complete calibration services for a variety of RF Isotropic probes such as. the Amplifier Research FP1000/2000/4000 series, IFI Narda Probes, EMCO 7120 series and. probes from Holaday Industries. Our laboratory
Evaluating pHEMT Process Improvements Using Wafer Level RF Tests
, and the. DISCUSSION. interaction of the design with the process. While good. Wafer level tests employed by Skyworks include PCM. PCM and DC circuit test results are necessary, they are. and DC and RF wafer probe of the switch die. The PCM’s. not sufficient to guarantee acceptable RF performance. are used
RF Wafer Testing: An Acute Need, and Now Practical (.pdf)
. in a production environment, which may have been the case in the past. However, new parametric test systems now make fast, accurate, and repeatable. RF parameter extraction almost as easy as DC testing. In fact, one system can. take precise DC and RF measurements simultaneously, making it suitable
Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
to achieve up to. 85% capital equipment reuse over five or more process nodes. • Parametric test involves measuring a wide array of signal types, ranging from. femtoamp DC leakage to 40GHz RF s-parameters. Applying a typical cost of ownership model to parametric test as used in volume. production
Medical Device Link . Benchtop EMC Testing Techniques for Medical Equipment Using loop probes to help test devices for electromagnetic compatibility saves costly redesign and complements open area and chamber tests.
for Medical Equipment Using loop probes to help test devices for electromagnetic compatibility saves costly redesign and complements open area and chamber tests. Scott Roleson A design may seem perfect; however, when electromagnetic compatibility (EMC) performance hasn't been considered, too often
High Volume Test Methodology for HBT Device Ruggedness Characterization
of. or manufacturing process variations. Moreover, the test. all, since we are forcing the devices into bias points beyond. is non-destructive. breakdown, we need to avoid oscillations. To achieve this. we use devices which are laid out with GSG (Ground-. Signal-Ground) pads and use RF probes (these are standard
Engineering Web Search: RF Test Probe Top
Title: Extended Abstract Formatting Instructions for the...
RF Test Gage R&R Improvement James Oerth and Mike Downs Skyworks Solutions, Inc 20 Sylvan Road, Woburn, MA, 01801, USA Tel: (781) 376-3076, Email:
Aries Electronics High-Frequency (RF) Test Sockets
High-Frequency (RF) Test Sockets Chinese Version
- Active Probe | Tektronix
DPO70000 / DSA70000 / MSO70000 | Tektronix
Baseband Video Test Solutions WFM8000 Series MPEG Video Test Solutions MPEG Analyzers
New and Used Test Equipment, Environmental Chambers, Test...
RF Test Accessory Antenna Adapter Attenuator-Switch Driver RF Probe Step Attenuator Switch LCR Impedance
Boonton - Test instrumentation and sensors for RF and...
of high performance RF & Microwave test equipment including Peak and Average power meters, Modulation & Audio Analyzers, RF millivolt & Capacitance
Category:Electronic test equipment - Wikipedia, the free...
Category:Electronic test equipment From Wikipedia, the free encyclopedia The main article for this category is Electronic test equipment.
TTi - Thurlby Thandar Instruments - Electronic Test Equipment...
function generator, arbitrary generator, pulse generators, rf spectrum analyzer, rf signal generator, digital multimeters, lcr meter, dc electronic