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Parts by Number for RF Test Probe Top

Part # Distributor Manufacturer Product Category Description
85RF Digi-Key Fluke Electronics Test and Measurement PROBE HIGH FREQ 500MHZ
85RF II Digi-Key Fluke Electronics Test and Measurement HIGH FREQUENCY PROBE 500 MHZ
MXHT83QH3000 Digi-Key Murata Electronics North America Cable Assemblies TEST PROBE
6006-8 Digi-Key Pomona Electronics Test and Measurement PROBE RF X10 INSULATED GRAY
6106 Digi-Key Pomona Electronics Test and Measurement PROBE RF DMM KIT 1GHZ
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Conduct Research Top

  • RF Probe Calibration
    of. where the state of probe calibration exists. today, issues involved with calibration and. the use of these probes, and finally where. the cal and test labs go from here. 3. Presentation Outline. • Current RF Field Probe Standards. • Types of RF Field Probes. • Methods used to calibrate RF Field
  • RF Test Gage R&R Improvement
    of variation in RF probe measurements. Tester Gage study results are presented. Evaluations of factors including test instrument repeatability, probe card wear, probe tip planarity, probe pressure, and probe placement within the bond pad are presented. The data indicated the repeatability of the test
  • Probe Calibration Services
    to change without notice. Notes for Probe Calibrations. Liberty Labs, Inc. offers complete calibration services for a variety of RF Isotropic probes such as. the Amplifier Research FP1000/2000/4000 series, IFI Narda Probes, EMCO 7120 series and. probes from Holaday Industries. Our laboratory
  • Evaluating pHEMT Process Improvements Using Wafer Level RF Tests
    , and the. DISCUSSION. interaction of the design with the process. While good. Wafer level tests employed by Skyworks include PCM. PCM and DC circuit test results are necessary, they are. and DC and RF wafer probe of the switch die. The PCM’s. not sufficient to guarantee acceptable RF performance. are used
  • Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
    to achieve up to. 85% capital equipment reuse over five or more process nodes. • Parametric test involves measuring a wide array of signal types, ranging from. femtoamp DC leakage to 40GHz RF s-parameters. Applying a typical cost of ownership model to parametric test as used in volume. production
  • RF Wafer Testing: An Acute Need, and Now Practical (.pdf)
    . in a production environment, which may have been the case in the past. However, new parametric test systems now make fast, accurate, and repeatable. RF parameter extraction almost as easy as DC testing. In fact, one system can. take precise DC and RF measurements simultaneously, making it suitable
  • Medical Device Link . Benchtop EMC Testing Techniques for Medical Equipment Using loop probes to help test devices for electromagnetic compatibility saves costly redesign and complements open area and chamber tests.
    for Medical Equipment Using loop probes to help test devices for electromagnetic compatibility saves costly redesign and complements open area and chamber tests. Scott Roleson A design may seem perfect; however, when electromagnetic compatibility (EMC) performance hasn't been considered, too often
  • High Volume Test Methodology for HBT Device Ruggedness Characterization
    of. or manufacturing process variations. Moreover, the test. all, since we are forcing the devices into bias points beyond. is non-destructive. breakdown, we need to avoid oscillations. To achieve this. we use devices which are laid out with GSG (Ground-. Signal-Ground) pads and use RF probes (these are standard

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