Products/Services for Rku Roughness Profilometer
Surface Profilometers - (201 companies)
Wafer and Thin Film Instrumentation - (378 companies)Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. Search by Specification | Learn More
Metrology Fixtures and CMM Fixtures - (58 companies)...and OQ room fixtures. Profilometry fixtures are used with profilometers, instruments that are used to measure a surface 's profile in order to quantify its roughness. Quality assurance via checking fixtures (QA fixtures, Q.A.-Fixtures) measure parts... Learn More
Semiconductor Metrology Instruments - (205 companies)
Surface Metrology Equipment - (322 companies)
Form Gages and Form Gaging Systems - (89 companies)
Finishing and Surface Treatment Services - (879 companies)
Product News for Rku Roughness Profilometer
SR100 Surface Roughness Tester Separates into Two Pieces. The innovative SR100 separates into two pieces to measure surface roughness. The bottom half of the SR100 contains the traverse mechanism and stylus pickup assembly which is placed on the surface to be measured. Its wide base ensures stability. The upper half includes a large LCD display, start button, mode and parameter buttons, comfortably hand-held for easy operation and clear viewing. How it Works. A diamond stylus is drawn across the part. The motorized traverse... (read more)Browse Surface Metrology Equipment Datasheets for Starrett
Mahr Federal Inc.
MarSurf LD 130/LD 260 Roughness & Surface Measure units has been significantly reduced. This is the roughness "error" that would still be recorded if the probe traced a perfectly flat surface. In the MarSurf LD 120, this was specified at between 34 and 40 nm Rz. In the new units, this has been reduced by nearly 50% to 20 nm Rz. This is a significant improvement for those making ultra-high precision surface and contour measurements. . The MarSurf LD 130 and 260 systems for combined surface and contour measurement are available in a number... (read more)Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc.
Measurement of Doped Wafers and TSVs of data on a single sample and utilize that information to form a complete analysis of the bow, warp, tilt, roughness and other important parameters. (read more)Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc.
CHRocodile Sensors . Thickness of fluid bags, tubing and balloons. Topography of stints. Characterization of implants and devices. PLASTIC INDUSTRY. Flaw analysis of injection-molded parts. Non-contact thickness during film production. Thickness measurement of transparent coatings. LENS THICKNESS. Central thickness of lens with a range of 30 micron up to 25 mm. PACKAGING. Perforation burst. Thickness of layers. Quality of surface structures. AUTOMOTIVE. Quality control. Surface roughness. Characterization of components... (read more)
On-Line Glass and Plastic Inspection Non-contact Thickness Measurement of Containers. Precitec is now offering several multi-point, non-contact instruments for measuring container thickness inline. The CHRocodile M4 has been proven for glass container thickness inline. There are several different sensors available for the measurement of plastic containers and films depending on your shapes, sizes and colors. High temperatures of 700 °C (1200 °F) are not a problem for the robust optical probe, which makes this... (read more)
Transonic Aerodynamic - ESDU 09016 Use of Local-flow Conditions for Calculation of Roughness-particle Height in Transition Strips on Wings. This methodology is based on that of Van Driest and Blumer, which enables the required height of roughness elements in a boundary-layer transition band to be estimated from the local boundary-layer displacement or momentum thickness, together with conditions at the edge of the boundary layer. The item is accompanied by a GUI-based program which, when used in conjunction with a coupled... (read more)Browse Standards and Technical Documents Datasheets for IHS ESDU
Traction Coatings When different coating processes and materials are combined, specific properties of a component surface's structure and roughness can be modified. Materials or yard ware made of fabric, plastic and paper are transported more reliably and with fewer interruptions when components are treated with Impreglon's traction coatings. (read more)Browse Coating Services Datasheets for Impreglon, Inc.
PremaTech Advanced Ceramics
Lapping & Polishing - Art or Science? Creating a lapped and polished surface on a ceramic blank can be a challenge since there is a wide range of advanced technical ceramics and each has unique properties regarding surface roughness. There are monolithic, infiltrated materials, composites and porous ceramic materials. All are different yet all have one thing in common and that is that they are susceptible to subsurface damage during the "machining" process, leading up to a final lap and polish. Preparing the specimen properly... (read more)Browse Lapping Services Datasheets for PremaTech Advanced Ceramics
Piezosystem Jena, Inc.
Laserinterferometric Vibrometer: SP-S Series that are able to make measurements on surfaces having arbitrary roughnesses. The complete system consists of a modularly designed electronics unit incorporating a laser, a compactly designed sensor head, and various interfaces. Their fiber optic-coupled interferometer converts motion along their optical axes into interference fringes that are transmitted to their fast, high-resolution, demodulation electronics for processing. Operation and display of results employ a PC running specialized data... (read more)Browse Vibration Measurement Instruments and Vibration Analyzers Datasheets for Piezosystem Jena, Inc.
Cascade Optical Corp.
Optical Fabrication Capabilties Cascade Optical polishing technicians have experience in all optical glasses, some crystals, ceramics & metals.We achieve 10 Ã … typical RMS surface roughnesses and parallelism to 1 arc sec over 3" diameter. Maximum substrates from 305mm to 3mm diameter available. All custom shapes are welcome.send requirements to Cascade Optical for further consideration. (read more)Browse Optical Manufacturing Services Datasheets for Cascade Optical Corp.
Engineering Web Search: Rku Roughness Profilometer
Surface Roughness Tester Manufacturers & Suppliers
Surface Roughness Tester Companies - 57
Surface Roughness Measurement and Surface Finish Measurement...
Roughness Volume loss High aspect ratio features novacam.com > Applications > Roughness Applications
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Surface metrology: Information from Answers.com
2 Roughness parameters 2.1 Profile roughness parameters
Roughness: Definition, Synonyms from Answers.com
Roughness Sci-Tech Dictionary: roughness Related Videos: Roughness Top Thesaurus:
Development of ultrananocrystalline diamond (UNCD) coatings...
films was prevented when the initial SiC seal surface had an initial roughness >0.1 m. In addition, the UNCD surfaces showed no measurable wear as
| Publications: SPIE
Crater morphology shows a non linear change in depth, volume and roughness at fluence of 14.5 J/cm2 (Fcr) and above.
Bioline International Official Site (site up-dated regularly)
For roughness analysis, average surface roughness (Ra) and flatness coefficient (Rku) parameters were used.
Proceedings of the International Conference on Mechanical...
Also, various surface roughness parameters such as centre line average (Ra), root mean square (Rq), skewness (Rsk), kurtosis (Rku) and mean line peak
Surface & Coatings Technology 188?189 (2004) 319 ? 330...
with highly Coating roughness was measured both with a stylus ionised plasma (first hydrogen and then chromium). In order profilometer (Taylor Hobson
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