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  • Description: 3D optical measurement system – confocal microscope with integrated white light interferometer – for measurement and evaluation of surface structures and small components High precision - non-contact measurement of surface structures Your results are correct! Fast measurement - short

    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Profile Depth (Pt)
    • Industrial Applications: Optics / Photonics

  • Description: , the MarSurf M 400 fulfills the needs on the shopfloor and in production and the measuring room. Especially skidless tracing with the skidless probe BFW 250 and the drive unit SD 26 enable the measurement and evaluation of not only the roughness depth but also waviness and profile criteria. The magnetic

    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Maximum Valley Depth (RV), Profile Depth (Pt), Ten Point Height (Rz JIS), Skewness (Rsk), Waviness Average (Wa), Waviness Height (Wt), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Other
    • Standards Compliance: ASME, ISO / EN, DIN, JIS, Other

  • Description: No Description Provided

    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Mean Peak to Valley Height (Rtm, Rz), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), Total Roughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point

  • Description: products, integration of new technologies, and improved performance. 30 mm scan length Z sensor range up to 1.2 mm 140mm manual sample positioning stage Force control 0.03mg – 10mg Windows XP, Vista, and Windows 7 compatible The AlphaStep® D-100 profilometer rapidly and quantitatively

    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Vertical (Z) Range: 31.5 inch

  • Description: The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6 stylus

    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Vertical (Z) Range: 0.0394 inch

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