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  • Description: Mahr stands for innovative roughness evaluation software. Features Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085) Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as

    • Display & Special Features: Computer Interface / Networkable
    • Industrial Applications: Aerospace / Defense, Automotive, Mechanical Parts (Bearings, Shafting), Medical, Optics / Photonics
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Mounting / Loading: Benchtop

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  • Description: down or in any other position required by the component. 25 parameters: Offer the same range of functions as a laboratory instrument. Error-free operation thanks to an integrated roughness standard. Automatic cutoff selection (patented) so that even non-specialists are

    • Display & Special Features: Digital Readout
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Mounting / Loading: Handheld / Portable
    • Standards Compliance: ISO / EN, DIN

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  • Description: Product features MarSurf 300, the first portable roughness measuring unit with the option of wireless (Bluetooth) connection between the evaluation unit and drive unit. Bluetooth wireless connection Easy to use, with high-resolution color display and ATM

    • Display & Special Features: Digital Readout
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Mounting / Loading: Handheld / Portable
    • Operating Temperature: 23 to 104 F

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  • Description: management Integrated roughness standard for the standard pick-up PHT 6-350 Dynamic calibration function Date and/or time of measurement Software marsurf PS1/M300 explorer for recording measurements (option)

    • Display & Special Features: Digital Readout
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Mounting / Loading: Handheld / Portable
    • Operating Temperature: 23 to 104 F

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  • Description: To ensure that protective layers adhere permanently, the surface roughness of the base material must comply with strict recommended standards. The FPR1 profile probe is the ideal solution in this case: When combined with the FMP10/40 series, the FPR1 profile probe is the ideal solution for

    • Industrial Applications: Other
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
    • Standards Compliance: Other
    • Technology: Contact / Stylus Based

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  • Description: AlphaStep® D-100 profilometer rapidly and quantitatively measures the 2D topography of surfaces. The AlphaStep® D-100 systems includes an 800 micron (optional 1.2 millimeter) Z range, sub-angstrom resolution, 6 angstrom step height repeatability, manual x-y theta sample positioning stage, and

    • Display & Special Features: Computer Interface / Networkable
    • Industrial Applications: Coatings (Thin Films, Plating, etc.), MEMS, Semiconductor Manufacturing
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Mounting / Loading: Benchtop

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  • Description: Bruker's Dektak® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film

    • Display & Special Features: Computer Interface / Networkable
    • Industrial Applications: Electronics, Semiconductor Manufacturing, Other
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness
    • Mounting / Loading: Benchtop, Floor / Free Standing

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  • Description: , precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.

    • Common Specific Parameters: Profile Depth (Pt), Peak Count (PC)
    • Display & Special Features: Computer Interface / Networkable
    • Industrial Applications: Coatings (Thin Films, Plating, etc.), Electronics, MEMS, Semiconductor Manufacturing, Storage Media
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Step Height

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  • Description: The KLA-Tencor Development Series of 3D surface profilers offer a complete optical surface profiling solution focusing on the needs of the engineering and research community. Our 3D surface profiler products are designed to match the varied requirements of our customers through the delivery of

    • Display & Special Features: Computer Interface / Networkable, FFT Analysis
    • Industrial Applications: Medical, MEMS, Semiconductor Manufacturing
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Step Height
    • Mounting / Loading: Benchtop

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  • Description: The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6

    • Display & Special Features: Computer Interface / Networkable
    • Industrial Applications: Coatings (Thin Films, Plating, etc.)
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Mounting / Loading: Benchtop

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  • Description: Industry-leading surface form measurement for precision components

    • Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
    • Display & Special Features: Computer Interface / Networkable, Video / Graphic Display
    • Factory / Production Use: Yes
    • Industrial Applications: Automotive, Mechanical Parts (Bearings, Shafting), Optics / Photonics, Precision Machining / Grinding, Semiconductor Manufacturing

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  • Description: First optical instrument to provide extensive quantification of o.d. & i.d

    • Bore / ID Analysis: Yes
    • Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
    • Display & Special Features: Computer Interface / Networkable, Video / Graphic Display
    • Factory / Production Use: Yes

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