Products & Services
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Supplier: Phenom-World BV
Description: With the 3D Roughness Reconstruction application, the Phenom is able to generate three-dimensional images and submicrometer roughness measurements. This fully automated application for the Phenom scanning electron microscope will help to communicate imaging results and will extract and visualize
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Supplier: Inspec Inc.
Description: Versatile roughness gauge designed for measuring roughness parametersaccording to ISO 4287/1, DIN 4768, 4772, 4777 or CNOMO (ISO 12085). A wide variety of interchangeable probes allows you to solve specific applications, such as roughness measurements on surfaces of grooves, smallbores, cylinders
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Standards Compliance: ISO / EN, DIN
- Technology: Contact / Stylus Based
- Mounting / Loading: Handheld / Portable
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Supplier: GENEQ, inc.
Description: The TR100 surface roughness tester is designed with an advanced micro-processor, performs data acquisition, data processing and display of all test measurements. This instrument features an integrated processor, display and sensor, and allows for user selectable roughness units in Ra and Rz
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Supplier: Starrett
Description: to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters Five second cycle time Result saved until the next measurement is taken Switches between inch and metric mode without remeasuring Use right out of the box - little or no operator training needed Automatic
- Technology: Contact / Stylus Based
- Form Parameters: Flatness
- Industrial Applications: Mechanical Parts (Bearings, Shafting)
- Mounting / Loading: Handheld / Portable
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Contour and roughness measurements in one step, upgradeable to full CNC
- Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, ISO / EN, DIN, JIS, Other
- Technology: Contact / Stylus Based
- Mounting / Loading: Benchtop
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Supplier: Olympus IMS
Description: The LEXT OLS4000 3D Laser Measuring Microscope is designed for nanometer level imaging, 3D measurement and roughness measurement. Magnification ranges from 108x – 17,280x satisfy the needs of today’s researchers.
- Application: Other
- Grade: Benchtop
- Microscope Type: Compound, Laser / Confocal
- Image Analysis Processing Software: Yes
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Supplier: Lasertec U.S.A., Inc.
Description: Roughness, etc.) Plentiful software such as multi layer 3D, shape measurement, roughness measurement, thickness measurement, patch work and so on Even sample with large contrast difference is observable by a real time, sharp mode Real time zoom function up to 8 times is equipped. Function to record
- Microscope Type: Laser / Confocal
- Application: Measuring / Toolmaker
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Supplier: KLA-Tencor Corporation
Description: , precision, and reliability measurements. This surface analysis solution delivers automated step height analysis, surface contour, waviness and roughness measurements with detailed 2D or 3D analysis of topography for a variety of surfaces and materials.
- Surface Metrology: Surface Profilometry
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Step Height, Waviness Parameters (Wa,Wt )
- Technology: Contact / Stylus Based
- Industrial Applications: Coatings (Thin Films, Plating, etc.), Electronics, MEMS, Semiconductor Manufacturing, Storage Media
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Supplier: Park Systems, Inc.
Description: Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series’ decoupled XY
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
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Supplier: Renishaw
Description: Surface finish / surface roughness measurement Traditionally measured with hand-held sensors or on a dedicated measuring machine REVO SFP1 probe makes surface finish inspection an integral part of your CMM measurement procedure Surface finish analysis can form part of a single measurement
- Probe Type: Other
- Mounting: Vertical, Horizontal
- Axes: +X, -X, +Y, -Y, +Z, -Z
- CNC / Machine Tool Applications: Yes
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Supplier: LECO Corporation
Description: that particular point 24 frames-per-second using a new high-speed graphics processor 32-bit image (1200 x 1600) 2D/3D measurement for total sample reconstruction Calibration is automatically adjusted with the ACS control (automatic calibration sensor) Roughness measurements (Ra, Rz, Rzjis
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Supplier: ASME
Description: This Standard is concerned with the geometric irregularities of surfaces. It defines surface texture and its constituents: roughness, waviness, and lay. It also defines parameters for specifying surface texture. The terms and ratings in this Standard relate to surfaces produced by such means
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Supplier: ASME Standards and Certification
Description: This Standard is concerned with the geometric irregularities of surfaces. It defines surface texture and its constituents: roughness, waviness, and lay. It also defines parameters for specifying surface texture. The terms and ratings in this Standard relate to surfaces produced by such means
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Featured Products for Roughness Measurement Top
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Starrett
SR100 Surface Roughness Tester
In addition to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters. • Five second cycle time. • Result saved until the next measurement is taken. • Switches between inch and metric mode without remeasuring. • Use right out of the box - little or no operator training required. • Automatic shut-off after five minutes of inactivity. • Configured with the most common industrial settings to ensure correlation between multiple operators... (read more)
Browse Surface Metrology Equipment Datasheets for Starrett -
Olympus IMS
LEXT OLS4000 Laser Confocal Microscope
the 405 nm laser, the LEXT OLS4000 can reliably measure acute-angled specimens that were previously impossible to measure. New Roughness GUI - the versatility of an interferometer and a stylus without limitations. The LEXT OLS4000 has a new roughness-specific mode enabling roughness profile measurement for sample lengths up to 100 mm with the new automatic line stitching function. The LEXT OLS4000 has been developed to represent a new standard of surface roughness measuring tool. This system... (read more)
Browse Microscopes Datasheets for Olympus IMS -
KEYENCE
VK-X Series 3D Laser Scanning MIcroscope
and measure a target with just a click of the mouse. With high-resolution color imaging and nanometer-level profile measurement functions, the VK-X Series Laser Scanning Microscopes have been designed to overcome the inadequacies of conventional imaging and profiling technologies. A short-wavelength laser scans across a target to provide non-contact profile, roughness and thickness measurements, even on targets with highly-angular surfaces. By combining the laser with an industry-leading, 16-bit... (read more)
Browse Specialty Microscopes Datasheets for KEYENCE -
Phenom-World BV
Desktop Scanning Microscope Advanced App. System
application, the Phenom is able to generate three-dimensional images and submicrometer roughness measurements. • Fibermetric (optional). Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before, with the Fibermetric application. The Phenom Application System and Phenom Pro Suite are available for all Phenom desktop SEMs. The Phenom Application System can be connected direct, via local network or Internet, enabling network storage... (read more)
Browse Electron Microscopes Datasheets for Phenom-World BV -
Mahr Federal Inc.
MarSurf™ WS 1 Optical Surface Metrology System
in small steps in the Z direction, using a piezo positioner. The resultant interferograms are recorded as image stacks and converted into height data. The MarSurf WS 1 can be used in both precision inspection rooms and production environments, and on both reflective and rough workpieces. High vertical resolution allows the surface roughness measurements on optical components such as lenses or mirrors with sub-µm accuracy. Texture can also be measured on micromechanical components on virtually any... (read more)
Browse Surface Metrology Equipment Datasheets for Mahr Federal Inc.
Conduct Research Top
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Beyond Roughness (.pdf)
and the reasons for doing so go far beyond roughness. ./7368fde6-5bbe-4c27-a122-87f8aff6cc5b Quality 101. 3This measuring system combines. roughness and contour measurements. into a single, integrated system. Using. a single drive unit and incorporating a. laser interferometer within the gage
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Surface Analysis: Beyond Roughness
and the reasons for doing so go far beyond roughness. In fact, many experts choose to use the terminology of "surface texture" rather than simply calling these characteristics "roughness.". Some measurements determine how a surface will bear loads, while others determine how well a surface provides
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Measuring Surface Roughness and Texture
to calculate surface Roughness Height). finish parameters from the same measurement data. Each of the. If surface finish is called out on a drawing but not otherwise. parameters has its own advantages and limitations, and many are specified, it is standard practice to assume Ra. But no single param-. very
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Surface Smoothness: The Surface Roughness of Anodic Coatings Resulting from the MLT-II and MLT-III Processes are Analyzed
The surface roughness of aluminum alloys anodized using the METALAST process has been measured and the results are summarized in this spec. The surface roughness is reported on the average of the results obtained from the four samples of each alloy with eight measurements evenly distributed on both
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Emissivity Measurements of Common Construction Materials
evaluation of the products performances and interpretation of. the data must be therefore considered in the application of the infrared analysis. Each object will have a. different emissivity based on the angle of interest. It should be noted that the building materials roughness. characteristics
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High Precision Volume Loss Measurements (.pdf)
from the differences between the. sizes. Fiber-based profilometers are also useful for. interpolated reference plane and the actual worn. measuring the thickness of coatings when. surface. combined with LIBS technology. Surface roughness. can also be evaluated. Dimensions of Scanned Objects
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Frequency Forms Measurement
For Bearings 2009-06 Good, Better & Best with Hand Held Gaging 2009-05 Considerations in Error Compensation 2009-05 Shaft Measurement Made Simple 2008-11 Custom Gaging 2008-11 Comparing Tactile and Optical Technologies 2008-06 What You Must Know About Calipers 2008-05 Beyond Roughness 2008-05
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Multisensor measurement Accuracy
2008-05 Beyond Roughness 2008-05 Measuring Taper for Toolholders 2008-04 Comparative ID/OD Gaging 2008-04 Measuring Surface Roughness and Texture 2008-03 Air Gaging Gets Better with Age 2007-11 The ABC\'s of Rz 2007-10 Value Added Measurement 2007-09 Caliper Basics 2007-07 Precision Measurement Center
Engineering Web Search: Roughness Measurement Top
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Measurement of Relative Surface Roughness at Particulate...
Measurement of Relative Surface Roughness at Particulate-Continuum Interfaces DeJong, JT Assistant professor, School of Civil Engineering, University
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Measurement of Rock Joint Roughness by 3D Scanner
Measurement of Rock Joint Roughness by 3D Scanner Hong, E-S Chief Researcher, Civil and Environmental Engineering, Korea University, Seoul, Lee, I-M
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Roughness- and contour measurement | Industrial Metrology |...
Roughness and contour measurement Form metrology Roughness- and contour measurement Homepage
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Measurement of the Surface Roughness - VACOM
Geometrical Measurement Measurement of the Surface Roughness Measurement of Semi-Finished Products Mechanical Manufacturing
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NIST Tech Beat - January 8, 2008
Measurement Innovations Add Up to Big Savings for Semiconductors
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guidelines details
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
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guidelines details
Roughness measurement - Roughness measurement using contact (stylus) instruments - Profile method - Setup, measurement conditions, procedure
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Protractors Angle Measurement Tools
Surface Roughness Gages Surface Roughness Gage Accessories Protractors & Angle Measurement Tools Vernier Protractors
