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Rt Roughness Profilometer

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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), TotalRoughness Height (Rt, PV), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS, Other
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), TotalRoughness Height (Rt, PV), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS, Other
  • Supplier: Starrett
    Description: to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters Five second cycle time Result saved until the next measurement is taken Switches between inch and metric mode without remeasuring Use right out of the box - little or no operator training needed Automatic
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Flatness
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum PeakHeight(RP), Maximum Valley Depth (RV)
    • Industrial Applications: Mechanical Parts (Bearings, Shafting)
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), TotalRoughness Height (Rt, PV), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS, Other
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), TotalRoughness Height (Rt, PV), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS, Other
  • Supplier: Starrett
    Description: to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters Five second cycle time Result saved until the next measurement is taken Switches between inch and metric mode without remeasuring Use right out of the box - little or no operator training needed Automatic
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Flatness
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum PeakHeight(RP), Maximum Valley Depth (RV)
    • Industrial Applications: Mechanical Parts (Bearings, Shafting)
  • Description: to basic roughness parameters Ra and Rz, also measures advanced Rp, Rv and Rt parameters Five second cycle time Result saved until the next measurement is taken Switches between inch and metric mode without remeasuring Use right out of the box - little or no operator training needed Automatic
    • Technology: Contact / Stylus Based
    • Form Parameters: Flatness
    • Industrial Applications: Mechanical Parts (Bearings, Shafting)
    • Mounting / Loading: Handheld / Portable
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
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Engineering Web Search: Rt Roughness Profilometer Top

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Mitutoyo 178-561-02A Surftest SJ-210 Sur... from Amazon.com
A surf tester, also known as a profilometer, surface roughness tester, roughness gage, or surface finish gage, is a device used in metrology to
Test Sets - Fraunhofer Institute for Electronic Nano Systems
surface roughness (arithmetic average roughness Ra, square roughness Rq, total height of the profile [roughness Rt, ...)
See Fraunhofer ENAS Information
ME 383S-Lubrication, Wear & Bearing Techn. M.D. Bryant...
? man-made (often) Zwave = 100 sin[2 x+120 cos[4x x (cm) Surface roughness Zrough z (?m) ? short wavelength ? microscopic features ? deterministic
ME 392Q Mfg Bryant September 7, 2005 1 Surfaces "If God...
Atomic force microscope (micro-profilometer for nano measurements) 11 SURFACE PROFILE MEASUREMENTS Z(x) Profilometer surface x ? stylus travels
Surface Roughness Tester Manufacturers & Suppliers
Specifications: Roughness Ra, Rz, Ry, Rq, Rt, Rp, Rmax, Rv, R3z, RS, RSm, RSk, Rmr,parameters Assessed profiles Roughness profile (R) Primary profile
Main Title 32pt

JOURNAL OF APPLIED PHYSICS 105, 024504 2009 Effect of...
JOURNAL OF APPLIED PHYSICS 105, 024504 2009 Effect of substrate roughness on c-oriented AlN thin films Alvaro Artieda,a Michela Barbieri, Cosmin
POST-BUILD PROCESSING OF STEREOLITHOGRAPHY MOLDS A Thesis...
of Rapid Tooling and Potential Solutions 13 II.4 Polishing 21 II.5 Roughness 25 II.6 Summary 27 III. PRELIMINARY INVESTIGATION OF SURFACE IMPROVEMENT
Roughness: Definition, Synonyms from Answers.com
Roughness Sci-Tech Dictionary: roughness Related Videos: Roughness Top Thesaurus:

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