Description: Surface Metrology by Mahr covers
roughness and contour
measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards.
With MarSurf equipment you are ahead, as success and further
- Technology: Contact / Stylus Based
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry)
- Standards Compliance: ASME, ISO / EN, DIN, Other