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Ry Profilometer
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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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Supplier: MSI-Viking GageDescription: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Technology: Contact / Stylus Based
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
- Standards Compliance: ISO / EN, DIN, JIS
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Supplier: Mahr Federal Inc.Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Technology: Contact / Stylus Based
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry)
- Standards Compliance: ASME, ISO / EN, DIN, Other
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Supplier: Zygo CorporationDescription: Fast 3D noncontact profilometer, motorized bench top unit
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
- Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
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Supplier: Corning Specialty MaterialsDescription: First optical instrument to provide extensive quantification of o.d. & i.d.
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Supplier: MSI-Viking GageDescription: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Technology: Contact / Stylus Based
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
- Standards Compliance: ISO / EN, DIN, JIS
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Supplier: Mahr Federal Inc.Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
- Technology: Contact / Stylus Based
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry)
- Standards Compliance: ASME, ISO / EN, DIN, Other
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Supplier: Zygo CorporationDescription: Fast 3D noncontact profilometer, motorized bench top unit
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
- Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
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Supplier: Zygo CorporationDescription: Fast 3D noncontact profilometer, motorized bench top unit
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Spacing Parameters (PC, Sm), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
- Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
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Supplier: Corning Specialty MaterialsDescription: First optical instrument to provide extensive quantification of o.d. & i.d.
- Technology: Non-contact - Optical / Laser
- Surface Metrology: 2D / Line Profile, 3D / Areal Topography
- Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
- Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Featured Products for Ry Profilometer Top
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Swissomation, Inc. uses a profilometer for accurate measurements of surface finishes. Our customers enjoy the satisfaction of well-planned and well-timed orders produced on some of the most advanced equipment available, including Vision Systems, CMMs, Comparators, Profilometers, Indicators, and many other instruments. Capabilities: Brown and Sharpe CMM. Touchprobe capability for measuring dimensional and wall thickness with both flat & rotary capabilities. Our newest optical vision system... (read more) -
How The System Works. The system can be used on a conventional recirculating system to the gun. It replaces the conventional supply and return hoses with a single monoline coaxial paint hose which attaches to the supply and return paint station ball valve. The Restrictor. HOSCO RIL-6 - an in-line restrictor identical to the RY-4 or 6 less the WYE recirculation feature. The Hoses. The hoses are specially compounded to withstand solvents and paints and yet are more flexible than a conventional... (read more)
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aluminum housing, to provide years of accurate, reliable surface finish gaging. Can be used to measure any one of four, switch-selectable, parameters: Ra, Rmax/Ry, Rz. Selectable traverse length 1, 3 or 5 cut-offs of 0.8 mm/.030". Operates in any position - horizontal, vertical, and upside down. Four switchable probe positions - axial (folded) or at 90°, 180° or 270°. Even difficult-to-reach surfaces such as inside and outside diameters are accessible. Integrated data output for SPC-processing units... (read more)
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At Swissomation, we work with each customer on an individual basis, to meet or exceed their quality requirements. Our quality management system is ISO 9000 compliant. Our customers enjoy the satisfaction of well-planned and well-timed orders produced on some of the most advanced equipment available, including: Vision Systems. CMMs. Comparators. Profilometers. Indicators. Aand many other instruments. In addition, our services include lot tracking, material certification, and SPC when needed... (read more)
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Lapmaster series KDP Composite Plates for Diamond Lapping and Polishing. Materials available include Iron (primary lapping/roughing), Copper (all-around lap or polish processing), Ceramic (intermediate lap or polish with reduced staining, corrosion and conductivity attributes), Tin-Lead (finish polish) or XP (finish polish). Available in standard diameters of 12" to 36", although custom sizes (smaller and larger) and shapes available. Can be configured in most standard groove patterns including... (read more)
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detection systems, or for applications requiring a compact optical path. Each aspheric lens is serialized and provided with a complete metrology data package. The test data package includes a surface profile performed on our Taylor Hobson Talysurf Profilometer, an interferogram of the spherical surface, and tested values for diameter, center thickness, and centration. For custom designed calibration grade precision aspheric lenses, coating requirements, or volume pricing, please contact our Sales... (read more)
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to meet their specific needs. Typical Applications: Boiler Level Controls. Electron Microscopes. Flow Meters. Flow Sensors. Gas & Liquide Flow Measurement. Gas Detection. Leakage Detection. Level Sensors. Mass Spectrometer. Moisture Control. NDT Probes. Offshore Drilling. Oxygen Probes. Particle Accelerators. Photo Detector. Pressure Transducers. Profilometer. Storage Rings. Strain Gauges. Test Equipment. Thermocouples. Vacuum Pumps. We invite you to visit our website via the links on left... (read more)
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The Lapmaster/LAMTech TOPOS and SPI series of Interferometers both feature Grazing Incidence flatness inspection and the measurement capability for grinding, lapping and polishing applications. Reflective surfaces, matte surfaces and ground surfaces can all be optically measured. The compact and cost-effective SPI series (Models #75 & #130) are contact flatness measuring gauging systems and utilize grazing incidence interferometry, providing the capability to measure surface flatness of... (read more)
Engineering Web Search: Ry Profilometer Top
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DigiProfilo I Pocket Surface Roughness Profilometer DigiProfilo I Pocket Surface Roughness Profilometer Pocket Surface Roughness Profilometer - DigiProfilo I |
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Mahr Federal PocketSurf III Surface Profilometer Mahr Federal PocketSurf III Surface Profilometer Mahr Federal PocketSurf III Surface Profilometer |
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Optical testing of diamond-machined aspheric mirrors for... mirror is concave and has a 94×76 mm aperture, Rx=377 mm, kx=0.0778, Ry=407 mm, and ky=0.1265 and is decentered by -2 mm in X and 227 mm in Y. All of |
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Mitutoyo 178-561-02A Surftest SJ-210 Sur... from Amazon.com A surf tester, also known as a profilometer, surface roughness tester, roughness gage, or surface finish gage, is a device used in metrology to |
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NASA/CR--2003-212190 Analysis of the Effect of Surface... |
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NASA/TM--2001-211319 IEPC?01?086 Retention of Sputtered... using a surface samples back to the heating environment for the next profilometer. |
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Supplementary Materials: Diffusive Motion with Non-Linear... The roughness of one of the surfaces was estimated using an optical profilometer (STIL micromeasure, CHR 150-N). Because of poor reflectivity of the |
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Research | Optical Sensor Technology LFTY ry. PhysNet Search: Laboratory of Optical Sensor Technology |
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Diss. ETH Nr. 12213 Analyse von Spurenelementen mit... |
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Applauding our innovators The 2003 Patent & Licensing... and Acoustic Levitator/ Contact Interior Probing Phase Concentrator Profilometer Transitions in Gregory Kaduchak (MST-11) Martin S. Piltch (MST-6) See Los Alamos National Laboratory Information |
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