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Ry Roughness Profilometer

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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: First optical instrument to provide extensive quantification of o.d. & i.d.
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS
  • Description: Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further
    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Mean Peak to ValleyHeight (Rtm, Rz), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Other
    • Standards Compliance: ISO / EN, DIN, JIS
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: Fast 3D noncontact robust factory floor profilometer, roughness AND form
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
  • Description: First optical instrument to provide extensive quantification of o.d. & i.d.
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)
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Engineering Web Search: Ry Roughness Profilometer Top

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Mahr Federal PocketSurf III Surface Profilometer Home > Products > Roughness Testers > Mahr Federal PocketSurf III Surface Profilometer
Mitutoyo 178-561-02A Surftest SJ-210 Sur... from Amazon.com
A surf tester, also known as a profilometer, surface roughness tester, roughness gage, or surface finish gage, is a device used in metrology to
Surface Roughness Tester Manufacturers & Suppliers
Specifications: Roughness Ra, Rz, Ry, Rq, Rt, Rp, Rmax, Rv, R3z, RS, RSm, RSk, Rmr,parameters Assessed profiles Roughness profile (R) Primary profile
Optical testing of diamond-machined aspheric mirrors for...
of the ADE PhaseShift MicroXAM white light interferometer (micro-roughness) and the Bauer Model 200 profilometer (mid-frequency error) is described.
NASA/CR--2003-212190 Analysis of the Effect of Surface...
Table 1 is a summary of the arithmetic average roughness (Ra) and waviness (Wa) for the composite surfaces.
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of 20 Use of Artificial Neural Networks for Predicting Rigid Pavement Roughness Abstract: This paper focuses on analyzing the Long Term Pavement
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The roughness of one of the surfaces was estimated using an optical profilometer (STIL micromeasure, CHR 150-N). Because of poor reflectivity of the
African Journal of Biotechnology Vol. 10(21), pp. 4392-4399,...
The surface roughness was evaluated according to the Ra, Rz and Ry principles, which were three basic parameters of the determination method for

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