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  • Description: With increasing manufacturing and machine quality, the quality of products' surface finishes is becoming ever more important. This makes it all the more crucial to offer metrology solutions with instrument designs that provide quick and simple measurement, yet comply with measuring standards

    • Technology: Non-contact - Optical / Laser
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Average Peak Profile Height (Rpm), Ten Point Height (Rz JIS), Core Roughness Depth (Rk), Other
    • Standards Compliance: ASME, ISO / EN, DIN, JIS

  • Description: profiler and surface analysis system utilizes numerous platform and measurement technologies from KLA-Tencor's most advanced semiconductor profiler systems for surface topography analysis - programmable scan stage, low noise, and high quality, high resolution long scans -- but in a smaller, more

    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Vertical (Z) Range: 0.0394 inch

  • Description: No Description Provided

    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Flatness, Warp / Bow
    • Common Specific Parameters: Maximum Roughness Depth (Rmax, Ry)

  • Description: 3-in-1 form, contour and surface measurement in one setting For large, precision parts for the wind, power and bearing industries Precision rotary table on air bearings with 80 nanometer rotation accuracy Form tester, contour measuring instrument and roughness measuring system in one Clear time

    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Specialty / Custom
    • Technology: Contact / Stylus Based
    • Industrial Applications: Other
    • Mounting / Loading: Floor / Free Standing

  • Supplier: Inspec Inc.

    Description: , steel balls etc.• Measured parameters: Ra, Rz DIN, Rmax, R3z, Rt, Rq RMS along withprinted profile bearing portion tp.• Integrated thermal printer.• Choice of cut-offs from 0.08 to 2.5 mm.• Traversing length lt from 0.48 to 15.0 mm.• RS-232 digital output compatible

    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Standards Compliance: ISO / EN, DIN
    • Technology: Contact / Stylus Based
    • Mounting / Loading: Handheld / Portable

  • Description: Modular machine concept and a wide variety of probes for any measuring problem High-precision shop floor measurements for quickly adapting the manufacturing process Large measuring volume Large weight capacity of the rotary table

    • Surface Metrology: Form Measurement
    • Measurement Capability: 2D / Line Profiles, Coaxiality, Cylindricity, Differential / Taper, Flatness, Eccentricity / Concentricity, Parallelism, Roundness, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Squareness / Angularity, Straightness, Waviness Parameters (Wa,Wt )
    • Standards Compliance: ISO / EN, DIN
    • Technology: Contact / Stylus Based

  • Supplier: Polytec, Inc.

    Description: For the best yields it is necessary to optimize your process. Measuring and understanding the characteristicsof your product allows continuous improvement. The AVT-1000 enables you to measure all critical parame-ters on metal or glass such as Roughness, Waviness, and Defects. The AVT can measure

    • Measurement Capability: 3D / Areal Topography, Defects / ADC, Flatness, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness, Waviness Parameters (Wa,Wt )
    • Standards Compliance: ASME, ISO / EN
    • Technology: Non-contact - Optical / Laser
    • Mounting / Loading: Floor / Free Standing

  • Description: ) Integrated pattern sync trigger (not PicoScope 9201A) High resolution cursor and automatic waveform measurements with statistics Waveform processing including FFT Time and voltage histograms Eye–diagram measurements for NRZ and RZ Automated mask test USB 2.0 LAN (PicoScope 9211A and 9231A only

    • Bandwidth: 1.20E10 Hz
    • Number of Input Channels: 2 (# channels)

  • Description: Russian Language - "STATE SYSTEM FOR ENSURING THE UNIFORMITY OF MEASUREMENTS. STATE SPECIAL STANDARD AND ALL-UNION VERIFICATION SCHEDULE FOR INSTRUMENTS MEASURING SURFACE ROUGHNESS PARAMETERS RMAX AND RZ IN RANGE 0,025 - 1600 MKM"

  • Description: waveform measurements with statistics Waveform processing including FFT Time and voltage histograms Eye-diagram measurements for NRZ and RZ Automated mask test USB 2.0 or LAN (PicoScope 9211A only) Familiar Windows graphical user interface Lightweight and energy efficient design

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  • The ABC's of Rz
    Recently an American-based German manufacturer was awarded a contract to produce some parts for a Japanese company. According to the contract, critical surface areas of the parts were to meet roughness criteria as defined by the Rz parameter. This appeared to be no problem, as Rz-mean roughness
  • Mean Peak to Valley Height (Rtm, Rz)
    such as Rt, Rp or Rv. Rtm is the mean roughness depth. Rtm is equivalent to Rz ISO when more than one sample length is evaluated (typically five). Rtm is equal to the sum of the Rp + Rv values in each sample length divided by the number of sample lengths. Rz = Rtm = Rpm + Rvm. The current ASME/ISO Rz
  • Surface Analysis: Beyond Roughness
    Most discussions on the quality of surface finish revolve around the measure of roughness. Indeed, roughness is the most common measure of surface finish, and parameters such as average roughness (Ra) and mean roughness depth (Rz) are the most commonly specified. But the ways to measure a surface

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