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Long Scan Autocorrelator
of operation is based on recording the second order correlation function using a Michelson Interferometer. An incoming pulse with electric field E(t), is first split into two replicas by means of a beamsplitter. DS-09041 App Note 11.qxd APPLICATION NOTE. Long Scan Autocorrelator. 27. Technology
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Electric Substation Monitoring (.pdf)
. Surveillance systems. These systems. can automatically perform site patrols,. monitor equipment temperatures, and. scan for security breaches without. human supervision. The video images. and their temperature data are carried. over Ethernet, wireless, or fiberoptic. cables to an appropriate interface
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Wired 7.09: Electric Word
Synthespians, or virtual actors, have been lurking around for years, but the technology has hardly taken off. That's because the grueling process of transforming a person into pixels involves hours of crunching and modeling raw data. And time is money: A high-end full-body scan costs around $10,000
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Medical Motion: Electric Actuation
CT-Scan Data to... Contract Manufacturing. CAD/CAM Software. Software. Materials. Industry News. Additive Manufacturing. Rapid Prototyping. Machining Applications. Okuma TechTrek. Event Showcased Manufacturing Solutions. Contract Manufacturing. Industry News. Machining Centers. Additive
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Portable Leak Detection Instrument Improves Heat Rate at Electric Power Plant.
soon discovered that online steam condensers offer abundant ultrasonic signals to. compete with the leak signal. His general method used is to hold the instrument a couple. feet from the tube sheet and scan the entire area. If a noisy area is found it is noted. He. then switches to an extended
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Insignificant Components?
Is there such a thing as an "Insignificant Component" in a power plant? By looking at the "big picture" during an Infrared inspection a catastrophic failure of a power panel was averted. Predictive Maintenance was asked to perform an infrared scan on a feeder breaker, for a non-critical
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Digitize this: Big machines get laser scanned
equipment because the line had to be shut down first. And tape measurements were inaccurate. In contrast, laser-scan accuracies are ±3 mm. It takes 2 to 3 hr to scan a large production machine and as much as 40 more hours to turn point-cloud data into CAD models. "Each scan generates about a 250-Mbyte
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MICRO: Product Extra!
iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing