Scanning Electron Microscopy Determination

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• Multi-Length Scale Characterization of the Gibeon Meteorite using Electron Backscatter Diffraction (.pdf)
  of approximately 7.9%. Data Collection software V5.2 was used at speeds of 200 indexed points. Electron Backscatter Diffraction (EBSD) is a Scanning Electron per second. For EBSD mapping, EBSD patterns are collected and. Microscopy (SEM) based characterization technique that is commonly analyzed from a grid...
• OIM Analysis of Polyphase Mineralogical Samples (.pdf)
  Automated Electron Backscatter Diffraction (EBSD) or Orientation Imaging Microscopy (OIM) has proven its utility in the characterization of microstructure in polycrystalline materials. In single phase materials, it is reasonably straightforward to obtain high quality OIM scan data when the phase...
• MICRO: Product Extra!
  include resist thickness as a function of exposure dose and development time, focus-exposure matrix of resist critical dimensions, resist profiles extracted from scanning electron microscopy images, and E0 swing curves. Information: usa@sigma-c.com. Applied Materials has been granted a patent...
• Assessing future technology requirements for rapid isolation and sourcing of faults
  by optical means, and it will be several years before higher-resolution tools such as scanning electron microscopy (SEM) will be able to perform efficient and rapid whole-wafer analysis. A significant fraction of fault-related events on the wafer already are linked to nonvisible defects resulting from...
• Assessing future trends in automated defect inspection and yield management
  then protect those products that would be at risk if the defect excursion were not detected. In terms of inspection tools, yield learning applications are generally better served by optical imaging or scanning electron microscope based inspection tools, while laser scanning tools have distinct...
• Characterizing Fatigue Response of Nickel-Titanium (.pdf)
  a and 2 a show the comparison of. inclusions found in Supplier A and Supplier B, two common Nitinol material vendors, utilizing. scanning electron microscopy SEM . Longitudinal mounts along the drawing direction were com-. pleted on nominal wire diameters of 2.03 and 2.16 mm, for Suppliers A and B...
• Fatigue Performance of Nitinol Round Wire with Varying Cold Work Reductions (.pdf)
  and transmis-. sion electron microscopy (TEM). Fatigue behavior was. characterized using rotary beam fatigue test equipment man-. ufactured by Positool, Inc. at 3600 rpm in a temperature-. controlled, continuously flowing water bath. Ten specimens. from each cold work condition were tested...

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