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  • Interface for Laser Scanning Microscope
    This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is
  • Cases For Electronics of a Laser Scanning Microscope
    Precision and quality are a priority.
  • Scanning Probe Microscopes and Atomic Force Microscopes
    Scanning probe and atomic force (SPM / AFM) microscopes are used to study surface features by moving a sharp probe over the object's surface (e.g., the scanning tunneling microscope). Atomic force microscopes enable the user to image the topography of a sample, and to monitor simultaneously
  • Scanning Electron Microscopy (SEM)
    Scanning electron microscopy (SEM) may include failure analysis, material analysis, and the elemental analysis (EDS) of extremely small particles. SEMs are electron microscopes in which the image is formed by synchronizing a detector with a focused electron beam that scans the object. The intensity
  • Electron Microscope
    Electron microscopes utilize an electron that is scanned across a scanning electron microscope (SEM) or passed through a tranmission electron microscope (TEM) a sample to capture an image. The significantly smaller wavelength of electrons allows much higher resolutions and depths of field compared
  • Scanning Electron Microscope - Explore the Nanoscopic World
    Electron microscopy allows our electronic failure analysts to take incredible images of a huge variety of defects. From melted silicon to cracked metallization and all points between, the electron microscope is an invaluable tool for inspecting any anomaly. Electron microscopy services
  • Near Field Imaging of a Laser Diode Using Scanning Method
    resolution was approximately 1 um. The measurement setup was constructed on Newport AutoAlign8000 alignment system, which consists of two motion stage stacks and a stationary center post. Beam profiling was achieved by using a high magnification microscope objective and scanning a detector with a pinhole
  • Applications for the IMV-4000 Multi-Channel Infrared Microscope
    Over the last two decades, IR microscopy has been widely utilized to identify increasingly smaller samples. Incorporation of a linear array detector and rapid scanning in a FT-IR microscope permits high-speed FT-IR spectroscopic imaging, with applications in semiconductors, polymers

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