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  • Interface for Laser Scanning Microscope
    This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is
  • MICRO: Product Extra!
    iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing
  • Adaptive wavefront correction in two-photon microscopy using coherence-gated wavefront sensing
    The image quality of a two-photon microscope is often degraded by wavefront aberrations induced by the specimen. We demonstrate here that resolution and signal size in two-photon microcopy can be substantially improved, even in living biological specimens, by adaptive wavefront correction based
  • A Close-up Look at White-Speck Neps in Cotton
    labor-intensive agitators and wringers in 1922. As washing technology has advanced, so have the tools of textile science. Take microscopes as a case in point. The scanning electron microscope (SEM) was developed in 1942 and has been commercially available since the early 1960s. It uses electrons to scan
  • MICRO:Product Technology News (Sept '99)
    The SEMVision cX scanning electron microscope automatically reviews and classifies wafer defects in advanced semiconductor production lines. The system can examine up to 500 defects per hour and offers color multiple-perspective SEM imaging for enhanced topography and material information about
  • Drug Makers Fight Back!
    readers such as ultraviolet light or a microscope, can be integrated into packaging substrates, adhesives inks and print, he adds. Today, says PSL Director Culbertson, bar coding is a very effective method. There are ways to add more dimensions to allow it to carry more information, he explains
  • MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
    than the maximum AFM scan size required to find ~0.1- um defects easily. This limitation makes AFM-only defect review difficult and time-consuming. To surmount this limitation, an integrated defect review tool combining a dark-field (DF) optical microscope with an automated TappingMode AFM has been
  • Product Technology News
    The Accurex II scanning probe microscope's TrueMetrix proprietary design provides closed-loop scan linearization for accurate images in both lateral and vertical axes. TrueMetrix technology uses an inherently linear sensor to measure scanner motion in a real-time feedback loop. This feature ensures

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