Products & Services
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Supplier: KEYENCE
Description: Combining the capabilities of an optical microscope, SEM and roughness gauge, the VK-X Series Laser Scanning Microscope is capable of providing non-contact profile, roughness and thickness measurements with a 0.5 nm Z-axis resolution on nearly any material. Users can scan and analyze samples
- Application: Metallurgical, Semiconductor Inspection, Other
- Grade: Benchtop, Research
- Microscope Type: Laser / Confocal
- Digital Display: Yes
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Supplier: Polytec, Inc.
Description: The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution
- Application: Measuring / Toolmaker, Semiconductor Inspection, Other
- Grade: Benchtop, Research
- Microscope Type: Other
- Computer Interface: Yes
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Supplier: WDI Wise Device Inc.
Description: The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications.
- Grade: Other
- Microscope Type: Laser / Confocal, Other
- Eyepiece Style: Other
- Digital Display: Yes
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Supplier: Newage Testing Instruments, Inc.
Description: Brinell optical scanning system
- Application: Metallurgical
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
- Eyepiece Style: Monocular
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Supplier: Bruker Nano Surfaces Division
Description: The Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life
- Application: Biological / Life Science
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
- Mechanical Stage: Yes
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Supplier: Park Systems, Inc.
Description: XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry’s only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM
- Application: Biological / Life Science
- Grade: Benchtop
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
- Eyepiece Style: Binocular
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Supplier: Thorlabs, Inc.
Description: The Laser Scanning Essentials Kit is Thorlabs' solution for researchers who desire to build their own laser scanning microscope. Two versions of the kit are available: LSKIT-VIS for the 400 - 750 nm transmission range and LSKIT-IR for the 650 - 1050 nm range. This kit contains the components
- Application: Biological / Life Science
- Grade: Benchtop
- Image Analysis Processing Software: Yes
- Eyepiece Style: Monocular
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Supplier: Olympus America Inc.
Description: of conventional optical microscopes and scanning electron microscopes (SEM).
- Application: Other
- Grade: Benchtop
- Microscope Type: Laser / Confocal
- Digital Display: Yes
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Supplier: WDI Wise Device Inc.
Description: WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features
- Application: Biological / Life Science, Measuring / Toolmaker, Metallurgical, Other
- Grade: Other
- Microscope Type: Other
- Computer Interface: Yes
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Supplier: Bruker Nano Surfaces Division
Description: The BioScope™ Catalyst™ Atomic Force Microscope (AFM) with ScanAsyst™ provides uncompromised high-resolution optical imaging capability and thermally limited force measurements and features numerous hardware and software features that make it easier than ever to realize the unique
- Application: Biological / Life Science
- Grade: Benchtop
- Digital Display: Yes
- Mechanical Stage: Yes
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Supplier: Leica Microsystems, Inc.
Description: The Leica DMI4000 B automated inverted research microscope is ideal for scanning cell and tissue cultures. The system features a fluorescence axis for ultra brilliant fluorescence imaging. The internal filter wheel with motorized excitation manager and FIM (Fluorescence Intensity Manager) enables
- Application: Biological / Life Science, Medical / Forensic
- Grade: Benchtop
- Microscope Type: Inverted
- Eyepiece Style: Binocular
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Supplier: Phenom-World BV
Description: Phenom-World is focused on giving you the opportunity to process ever-smaller samples and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro desktop scanning electron microscope (SEM) is the most effective, versatile and fastest desktop SEM available. Its
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Supplier: OMICRON NanoTechnology
Description: Optical beam deflection for AMF, variable temperature
- Grade: Research
- Microscope Type: Scanning Probe / Atomic Force (SPM / AFM)
- Application: Biological / Life Science
- Scanning Probe Microscope Type: EFM, MFM
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Supplier: KLA-Tencor Corporation
Description: and scanning stages 6”x6” or 8”x8” Microscope functionality can be computer interfaced via RS232 for OEM applications
- Application: Semiconductor Inspection
- Grade: Benchtop
- Eyepiece Style: Binocular
- Mechanical Stage: Yes
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Supplier: Renishaw
Description: Combined AFM/Raman instruments (also known as SPM-Raman) enable improved sample analysis by investigating chemical and structural properties of materials at sub-micrometer distance scales. Renishaw have developed optimised direct coupling technology making the inVia Raman microscope the perfect
- Application: Biological / Life Science, Gemological, Measuring / Toolmaker, Medical / Forensic, Metallurgical, Semiconductor Inspection, Other
- Scanning Probe Microscope Type: AFM
- Grade: Student, Benchtop, Research, Other
- Microscope Type: Acoustic / Ultrasonic, Microwave, Compound, Fluorescent / UV, Inverted, Laser / Confocal, Polarizing, Portable Field, Scanning Electron Microscope (SEM), Scanning Probe / Atomic Force (SPM / AFM), Stereomicroscope, Transmission Electron Microscope (TEM), Other
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Supplier: KLA-Tencor Corporation
Description: The eS32 e-beam defect inspection system delivers the best capture of yield-limiting, buried electrical defects and the small physical defects that optical systems cannot find. With high sensitivity, voltage contrast capabilities, proprietary charge control techniques, and advanced binning
- Application: Semiconductor Inspection
- Grade: Research
- Microscope Type: Scanning Electron Microscope (SEM)
- Digital Display: Yes
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Supplier: Thorlabs, Inc.
Description: This page contains all the major mechanical components needed to build a custom microscope. T-Scopes (Thorlabs Microscopes)Thorlabs' T-Scopes are microscopes designed to provide an optical system that is easy to operate and modify. These microscopes can be adapted for a variety of applications
- Grade: Benchtop
- Microscope Type: Laser / Confocal
- Eyepiece Style: Monocular
- Digital Display: Yes
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Supplier: NanoAndMore USA Corp.
Description: ;. That is why high-tech companies and leading research institutes in more than 37 countries working with micro- and nano-microscopy use SPIP™ to move closer to fact and get the right image. Process Images from the following types of instruments: Atomic Force Microscopes (SPMs) Scanning Electron
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Supplier: Prior Scientific, Inc.
Description: Key features: Suitable for most major brand microscopes. 1µm or better repeatability Quiet and reliable Wide range of sample holders. Intelligent Scanning Technology (U.S. Patent 7,330,307) The H107 ProScan™ stage adapts to virtually any inverted microscope or optical system
- Type: Motorized Stage
- Features: Programmable, Slide Holder
- Lighting: Reflected Light
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Supplier: PI (Physik Instrumente) L.P.
Description: P-720 PIFOCs® are high-speed, piezo-driven microscope objective nanofocusing/scanning devices which can be mounted on most microscopes. The frictionless, flexure guiding system combines high guiding precision for superior focus stability with fast response for rapid settling and scanning
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Supplier: Flexbar Machine Corporation
Description: FLEXBAR DIGI-ZOOM VIDEO MICROSCOPE SYSTEM Featuring Auto-Focus, Image Capture, Documentation and Manual Measurement In One Easy-to-Use Package. MAIN SYSTEM FEATURES: Continuous 1:14 Ratio Optical Zoom Auto-Focus System 0.5X Standard Objective with 7"/172mm working distance
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Featured Products for Scanning Optical Microscope Top
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KEYENCE
VK-X Series 3D Laser Scanning MIcroscope
Perform profile and roughness measurements on nearly any material. The KEYENCE VK-X Series 3D Laser Scanning Microscopes combine the capabilities of SEMs and non-contact roughness gauges with the simplicity of an optical microscope. This newly released system now boasts an unprecedented 0.5 nanometer Z-axis resolution with a magnification range spanning 200x - 24,000x. The usability and ease-of-use have been further improved with the addition of the AI-Scan function, allowing users to image... (read more)
Browse Specialty Microscopes Datasheets for KEYENCE -
M+P Labs
Metallographic Mounts of the Highest Quality
M+P Labs is highly-renowned for producing metallographic mounts of the highest quality. Metallography, in basic terms, is the art of imbedding a specimen in resin, polishing it to a mirror-like finish, then typically etching the specimen to reveal the microstructure of the materials. Specimens are prepared in this manner for analyses under optical microscopes, scanning electron microscopes, and electron microprobes. These microscopy techniques are utilized to perform metallurgical evaluation... (read more)
Browse Material Testing Services Datasheets for M+P Labs
Conduct Research Top
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Interface for Laser Scanning Microscope
This customer needs to interface a scanning laser microscope to their PC so that image data can be acquired and stored. Data is received from the laser microscope via an optical sensor at 1300 line scans per image. Each scan has an 8ms duration, but 2/3 of that time is. Gage Applied ::. Data
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Cases For Electronics of a Laser Scanning Microscope
Precision and quality are a priority. 19" cases laser scanning microscope. Home Case Studies Carl Zeiss. Customer: Carl Zeiss. Task: Cases for electronics of a laser scanning microscope. Precision and quality are a priority. The Carl Zeiss Group have introduced a new laser scanning microscope
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Electron Microscope
to optical microscopes. Several types of electron microscopes exist such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) or scanning transmission electron microscopes (STEM).
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Near Field Imaging of a Laser Diode Using Scanning Method
, unlike. other popular near field systems such as SNOMs. (scanning near field optical microscopes). A typical. Model 8000. PC. diffraction limit of a microscope objective is on the order. Modular TEC/LDD. Integra control. Controller. software. of 1 um. No matter how good the optical system
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Wavelength-scalable hollow optical
Conventional solid-core optical fibres require highly transparent. materials. Such materials have been difficult to identify owing to. the fundamental limitations associated with the propagation of. light through solids, such as absorption, scattering and nonlinear. effects. Hollow optical fibres
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Comparing Tactile and Optical Technologies (.pdf)
the results. of the analysis. Optical scanning methods do just that--they change the way profiles are. generated. This is not to say optical methods are better or worse, but they. are different. Figure 1. Regardless of the. There are a wide variety of different methods and technologies used for. method
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Automated Optical Positioning Helps Automate FT-IR Analysis
analysis capability recently revealed defects in a printed paper sample that could not be detected with a conventional microscope. Automated Optical Positioning Helps Automate FT-IR Analysis. Automated Optical Positioning Helps Automate FT-IR Analysis. The incorporation of software control
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Microstructural Analysis of Optical Materials (.pdf)
) in the scanning electron microscope (SEM). EDAX tools in support of materials problems associated with the Hydrogen Economy Optical Materials. Application Note EBSD & EDS. Microstructural Analysis of Optical Materials. Stuart Wright & Matthew Nowell - EDAX. Introduction. "Photonic applications
Engineering Web Search: Scanning Optical Microscope Top
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Near-field scanning optical microscope - Wikipedia, the free...
Near-field scanning optical microscope From Wikipedia, the free encyclopedia
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Optical fiber - Wikipedia, the free encyclopedia
Optical fiber From Wikipedia, the free encyclopedia A bundle of optical fibers A TOSLINK fiber optic audio cable being illuminated at one end
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Molecular Expressions Microscopy Primer: Introduction to...
Digital Imaging in Optical Microscopy - Digitization of a video or electronic image captured through an optical microscope results in a dramatic
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CCMR - Shared Experimental Facilities
Optical Microscopy Leitz Laborlux 12 hl Optical Microscope Nanonics Multiview 1000 or 2000 Near-field Scanning Optical Microscopy (NSOM)
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Department of Physics - UC Santa Barbara
Scanning Electron Microscope (Hansma lab) measuring bone strength.
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Optical microscope: Definition from Answers.com
Optical Communications Optical microscope McGraw-Hill Science & Technology Dictionary: optical microscope Top
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Optical microscope: Information from Answers.com
The optical microscope, often referred to as the "light microscope", is a type of microscope which uses visible light and a system of lenses to
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NC State Department of Physics
"Electromigration in YBCO using a Metal clad Near-Field Scanning Optical Microscope Probe," Appl.
