Products/Services for Scanning Reflection Electron Microscopy
Electron Microscopes - (60 companies)
No Image AvailableScanning Probe Microscopes - (11 companies)
Material Testing Services - (1002 companies)
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Web Sensing and Scanning Systems - (51 companies)Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Web Sensing and Scanning Systems Information. Web... Learn More
Document Scanning Services - (76 companies)Document scanning service providers convert text and graphics from paper, film, or other non-digital 2D media to digital formats as requested by their clients. These services are commonly used for technical, legal, medical, financial, and other... Learn More
Electron Beam Welding Services - (43 companies)
Electron Beam Processing Equipment - (34 companies)Electron beam machines, equipment or systems are used to process materials using a very focused energy source with a very small wavelength. Electron beam machines, equipment or systems are used to process materials. Electron beams provide a very... Learn More
Microscopy and Metallography Sample Preparation Equipment - (101 companies)...includes abrasive saws for producing thin slices of samples, grinding and polishing machinery, and a variety of coating and etching devices for preparing samples for electron microscopy. Microscopy sample preparation equipment and metallography sample... Learn More
Product News for Scanning Reflection Electron Microscopy
Confocal Scanning Laser Microscopy For confocal scanning laser microscopy, the stability and beam quality of the laser source are the key. for good imaging results. Qioptiq's offering will far surpass your expectations. Single or Multiple Wavelength Laser. Qioptiq can provide you with standard or customized fiber guide technology and single or multiple wavelength laser sources which can be perfectly matched for fluorescence excitation if required. Our kineMATIX ™ optomechanical system guarantees a perfectly stable coupling... (read more)
Electron Microprobe Analysis of Materials M+P Labs electron microprobe can quickly provide detailed information about a material's chemical composition, distribution of chemical constituents, microstructure and surface topography to study failures and features of interest in a wide variety of materials. This information can accelerate R &D, product development, process improvement and failure analysis. M+P Labs is equipped with both a Scanning Electron Microscope and an Electron Microprobe, which is a Scanning Electron Microscope... (read more)Browse Material Testing Services Datasheets for M+P Labs
Stilwell Baker, Inc.
Electron Microscope Power Supply Redesign Superior Technical Services provides service and maintenance for third- and fourth-generation charged particle equipment, including scanning electron microscopes (SEMs). The original SEM design called for three discreet power supplies. Each of them had a high failure rate due to design problems. Replacement with new OEM versions was too expensive and repair was fraught with numerous logistical problems. To provide their customers a single upgraded replacement power supply, at the same cost... (read more)Browse Electrical and Electronic Design Services Datasheets for Stilwell Baker, Inc.
Cambridge Technology, Inc.
Galvanometer #6250H & Scanning Mirrors . is the market leader in closed-loop, galvanometer based optical scanning components subsystems, controllers software, and supporting products. These products provide superior scanning performance to a wide variety of applications including laser marking, engraving, drilling, machining and treating, biomedical applications in Ophthalmology, DNA sequencing, and Confocal Microscopy, laser entertainment and industrial projection, and any application where laser beam steering is required. For more... (read more)Browse Galvanometer Optical Scanners Datasheets for Cambridge Technology, Inc.
General Digital Corporation
Reflections on Reflections The term reflection actually encompasses three entirely different types of optical phenomena. These three kinds of reflection are specular reflection (like a mirror), diffuse reflection (often called Lambertian) and reflexive reflection (or retro-reflection). Specular Reflections. Specular reflections are those we normally associate with a highly polished surface, such as a mirror. In technical terms, the angle of incidence of the light is equal to the angle of reflection of the light. All... (read more)
PHOTONIS Technologies SAS
Electron Generator Arrays Because each of the millions of pores produce electrons, the resultant electron flux is extremely uniform and dense. EGAs can be used as the electron source in electron impact ionization source applications. This technology has the advantage of performing as a cold ionization source, which eliminates pyrolytic effects that occur when the heat generated by the filament chemically changes the unknown substances to be identified. (read more)Browse Electron Multipliers Datasheets for PHOTONIS Technologies SAS
PHOTONIS Technologies SAS
Channeltrons - Channel Electron Multipliers Channeltron ® Electron Multipliers have set the standard for mass spectrometry detection. Our extensive product line proves that PHOTONIS has an extensive understanding and mastery of the different technologies involved with electron multipliers. Channeltron ® Electron Multipliers are durable and efficient detectors of positive and negative ions as well as electrons and photons. PHOTONIS offers over 150 standard and custom designs. PHOTONIS's exclusive detector design provides sustained... (read more)Browse Electron Multipliers Datasheets for PHOTONIS Technologies SAS
Hamamatsu Corporation USA
Electron Tube Division Hamamatsu is a world leader in photonics technology and is constantly engaged in the research of light, photons and their applications. The Electron Tube Division (ETD) of Hamamatsu Photonics, through it's state-of the-art detectors and light sources, strives to support progress in most advanced photonics technologies involving low-light-level and ultra-high speed measurements. The Electron Tube Division has developed and produced a variety of light-related devices that are widely used... (read more)Browse X-ray Instruments and X-ray Systems Datasheets for Hamamatsu Corporation USA
Desktop Scanning Microscope Advanced App. System Phenom Pro Suite. The Phenom Pro Suite is developed to enable Phenom users to extract maximum information from images made with the Phenom desktop scanning electron microscope (SEM). It extends the capabilities of the Phenom, a high-resolution imaging tool, providing solutions to specific application needs. The Phenom Pro Suite software is installed on the Phenom Application System. This monitor-mounted PC is the hardware platform for all Phenom Pro Suite software, leaving the Phenom system... (read more)Browse Electron Microscopes Datasheets for Phenom-World BV
Calibrated Image Analysis and Microscopy Metallographic preparation. · Metallurgical evaluation. · Scanning electron microscopy/electron microprobe analysis. · Specimen extraction & machining. · Thermal analysis. . M+P Labs Quality Assurance: The rigorous quality assurance requirements mandated by these industry quality standards: ISO 17025, Nadcap (aerospace and defense industry) and 10 CFR 50 Appendix B (nuclear utility industry) are applied to each and every job we perform, regardless of whether... (read more)Browse Material Testing Services Datasheets for M+P Labs
microscopy, dark field. microscopy, and scanning electron microscopy. The right side of Figure 6 shows one typical example of an. area of about 100µm x 165µm, magnified with a light microscope. There are some scratches across the. surface with widths in the 1-5µm range and lengths of mm or more...
...are accelerated using a 30 kV potential. and electromagnetically focused to an area that can be controlled by. feedback image data gathered from the far less damaging scanning. 3.3 Tensile Testing. electron beam. (b) Cross section ``rough'' cuts to expose lift out foil. The evolution of axial properties...
In the past, particles retained on the filter were analyzed using a scanning electron microscope and energy dispersive x-ray spectroscopy. This method only identifies elements so it is useless for identifying organic or molecular compounds. Infrared spectrometry, on the other hand, is able to extract...
...of similar defects in other OLEDs. ing the extended lifetime tests, in some devices short circuits. with scanning electron microscopy and electron microprobe. recur. However, a brief application of high current again. analysis reveal them to be deficient in both Mg and Ag as. opens the short...
Engineering Web Search: Scanning Reflection Electron Microscopy
Category:Microscopy - Wikipedia, the free encyclopedia
â?º Microscopy mountantsâ?? (2 P) S â?º Scanning probe microscopyâ?? (34 P)
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Advanced epitaxial growth processes are enabled by new in situ diagnostics using reflection electron energy loss spectroscopy.
ZL Wang's Homepage
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