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Identification and Suppression of Thermal Reflections in Infrared Thermal Imaging
microscopy, dark field. microscopy, and scanning electron microscopy. The right side of Figure 6 shows one typical example of an. area of about 100µm x 165µm, magnified with a light microscope. There are some scratches across the. surface with widths in the 1-5µm range and lengths of mm or more
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Evaluation of confocal microscopy system performance
. Confocal laser scanning microscopy (CLSM) has emerged as a very useful technique to visualize biological structures. Small apertures (pinholes) are used in CLSM to eliminate the fluorescent light from above and below the plane of focus, which results in increased resolution compared with conventional
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MICRO: 'Round the Ole Circuit
A U.S. Department of Energy-funded nanotechnology research program focused on the subangstrom world has selected FEI to be its R&D partner. The project, known as TEAM (for Transmission Electron Aberration-corrected Microscope), will build the highest-resolution scanning/transmission electron
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Product Technology News
to accommodate scanning modes such as contact, near-contact, and noncontact AFM; lateral force microscopy; and electrical force microscopy. The Accurex IIL is a laboratory version designed for research and industrial applications. Ionic Contaminant Analyzer Dionex Sunnyvale, CA The DX-800 combines
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Measuring and removing dissolved and colloidal silica in ultrapure water
gravimetry, colorimetry, graphite furnace atomic absorption spectroscopy (GFAAS), scanning electron microscopy (SEM), ion chromatography (IC), inductively coupled plasma mass spectroscopy (ICP-MS), and inductively coupled plasma atomic emission spectroscopy (ICP-AES). MICRO:May 97:Ultrapure Fluids
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MICRO: TechEmergent
Alex Salnik, Lena Nicolaides, and Jon Ospal, combination of ion implantation and thermal annealing, which are both silicon surface modification methods, is a key production process in semiconductor manufacturing. Thermal-wave (TW) technology measures surface modification (i.e., "damage") induced
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Medical Device Link .
compatible, however, either critical-point drying or a cold stage can be used to observe the sample. Nonconducting samples can be coated with a thin layer of carbon or precious metal in a thermal vacuum evaporator or plasma sputter-coater. Another type of scanning electron microscope
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Product Technology News
microscope offers high-temperature operation in both scanning-tunneling and atomic-force microscopy. The ultra-high-vacuum SPM is available in standard, extended y-translation, and high-temperature versions. The unit can produce AFM images up to 300 C and STM images up to 600 C and is capable of both