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  • MICRO:June 98:Industry News:Expansions and Acquisitions
    of approximately 200 Metra systems worldwide. Nanometrics has begun developing improved versions of the metrology system to meet next-generation CD requirements for critical dimensions 0.20 um, the company says. Metrology vendor bought Schlumberger Automated Test Equipment (ATE) of San Jose purchased...
  • MICRO: World Beat
    in Japan. The Japanese firm, which will act as AmberWave's sales agent in the country, will offer test wafers and starter kits. Mitsubishi will also license AmberWave's intellectual property to Japanese companies. The alliance signifies that the semiconductor industry "is quickly moving toward...
  • MICRO:Product Technology News (Sept. '98 p.60)
    of Opti-Probe job files without interrupting production measurements, and it supports recipes for all models of the process control tools. Information: 510/490-3663. New software from Schlumberger Automated Test Equipment is designed to improve measurement success rates on CMP layers and STI processes...
  • MICRO: Archive: Back Issue TOC
    process and equipment challenges in MEMS deep silicon-etch processes. Defect/Yield Analysis: Reducing gate-level electrical defectivity rapidly using voltage-contrast test structures. New Materials Integration: Fabricating and inspecting ultrathin silicon-on-insulator wafers. Tool/Fab Support Strategies...
  • MICRO:Conference Programs (March 2001)
    . Kevin McFadden, Schlumberger. Production Test of RFID Devices Used in Contactless Smart-Card Applications. Martin Stadler, Teradyne. Modeling and Empirical Techniques for Analysis of Test Cell Efficiency in a Multisite RF Environment. Jim Dawdy, Agilent Technologies. Panel Introduction Paper...
  • MICRO:Semicon West '99 (June '99)
    **. Greatest Hits of 2004. Featured Series Web Sightings Media Kit. Subscribe to MICRO Comments? Suggestions? Send us your feedback. MicroMagazine.com. 11444 W.Olympic Blvd. Los Angeles, CA 90064. 310.445.3700 SAN FRANCISCO. WAFER PROCESSING JULY 12 14, 1999 SAN JOSE. TEST, ASSEMBLY...

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