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Semiconductor Test Instrument

 

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Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
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Parts by Number for Semiconductor Test Instrument Top

Partb # Distributor Manufacturer Product Category Description
SMC2708-45JM TEST MA ASAP Semiconductor TEXAS INSTRUMENTS Not Provided Not Provided
SNJ54ACT8990HV Texas Instruments Standard Linear and Logic Texas Instruments Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic > Boundary Scan (JTAG) Support Device Test Bus Controllers 68-CFP -55 to 125
SNJ54ACT8990GB Texas Instruments Standard Linear and Logic Texas Instruments Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic > Boundary Scan (JTAG) Support Device Test Bus Controllers 68-CPGA -55 to 125
5962-9172601M3A Texas Instruments Standard Linear and Logic Texas Instruments Semiconductors > Logic > Specialty Logic > Boundary Scan (JTAG) Logic > Boundary Scan (JTAG) Bus Device Scan Test Devices With Octal Buffers 28-LCCC -55 to 125

Conduct Research Top

  • Semiconductor manufacturing: Off to a slower start
    , President, VLSI Research; Art Katsaros, Group Vice President Development and Technology, Air Products; and Mark Jagiela, President, Semiconductor Test Division, Teradyne. Finally, another panel session covers the economic outlook for semiconductormanufacturing equipment. Participants include Richard S
  • Non-Contact Thickness Measurement of Semiconductor Wafers
    of electrically conductive materials. Application Notes: Non-contact Measurement Sensors, Solutions and Systems - MTI Instruments.   . Non-Contact Thickness Measurement of Semiconductor Wafers. Capacitance Probes. Thickness measurement is an integral part of semiconductor wafer manufacturing. From
  • Developing an exit charge specification for semiconductor production equipment
    of the semiconductor front end and in the sort, marking, and test areas of the back end. For semiconductor manufacturing to be successful, these static-related obstacles must be overcome.5 Table I lists examples of these problems. VictimCulprit Consequence Diffusion furnace Operator touchingontrol
  • The New Era of Automated Test
    . For decades, engineers have built automated test systems by taking the same traditional box instruments they use on the engineering bench and placing them in a rack, stacked one on top of the other. The rack is connected over an instrument control interface to a computer, where a software program
  • Testing Teccor Semiconductor Devices Using Curve Tracers (.pdf)
    . Introduction. Limitations, Accuracy, and Correlation. AN1. One of the most useful and versatile instruments for. Although the curve tracer is a highly versatile device, it is. testing semiconductor devices is the curve tracer (CT). not capable of every test that one may wish to perform on. Tektronix
  • Instrument Grade Chassis for Vibration Test Equipment
    Vibration Test equipment for semiconductor, automotive and aerospace industries. Their product is currently housed in Industrial Grade PCs which they integrate themselves. They currently purchase the chassis from an off-shore company. Their major problem is product differentiation: their product looks
  • The ALMEMO(R) system: One Instrument for All Sensors
    the same test input circuitry. More than 60 standard measuring ranges are available for branch-independent. applications, e.g. for measuring the following:- Temperature, humidity, flow, heat flow, pressure, rotational speed, frequency,. resistance, current, voltage, force, wire strain gauges
  • Comparing cleanroom wipers with a dry abrasion resistance test
    cleanroom wipers with a dry abrasion resistance test Osmond Atterbury, Himansu R. Bhattacharjee, Douglas W. Cooper, and Steven J. Paley, Texwipe The continuing effort to improve the cleanliness of semiconductor fabs and other contamination-sensitive manufacturing environments includes selecting non

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