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Semiconductor Test Tool
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Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.
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Supplier: BRL Test, Inc.Description: The TDS8200 Digital Sampling Oscilloscope is a comprehensive acquisition and measurement instrument capable of processing very fast signals. It is the prime tool for research, design evaluation, and manufacturing test in fields of semiconductor test, components test, TDR, and other applications
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Supplier: Setra SystemsDescription: Applications Laboratory Research & Development Test and Measurement Metrology Analytical Chemistry Systems Semiconductor Process Tools and Equipment Indstrial OEM Systems
- Device Category: Transducer
- Pressure Reading: Absolute, Vacuum
- Sensor Technology: Variable Capacitance
- Media: Gas
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Supplier: Microscan Systems IncorporatedDescription: . The software provides a point and click environment to develop, test, and install applications that can range from simple to sophisticated. Features include: Auto ID Tools: Decoding all standard linear barcodes, Data Matrix, and other symbols, Optical Character Recognition (OCR) and Verification (OCV
- System Type: Modular / PC-Based
- Applications / Capabilities: Bar / Matrix Code, Biotechnology or Medical, Color Mark / Color Recognition, Container or Product Counting, Edge Detection, Electronics or Semiconductor Inspection, Electronics Rework, Flaw Detection, Food & Beverage, Gauging, Scanning & Dimensioning, ID Detection / Verification, Materials Analysis, Non-contact Profilometry, Optical Character Recognition (OCR), Parcel / Baggage Sorting, Pattern Recognition, Pharmaceutical Packaging, Presence / Absence, Production & Quality Control, Seal Integrity, Security & Biometrics, Tool & Die Monitoring, Web Inspection, Other
- Image Source: Area Scan Camera, Line Scan Camera, High Speed / Brightness, Thermal or Infrared, Multi-spectral, Optical Microscope
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Supplier: Shinyei Corporation of AmericaDescription: , device as well as photo catalyst and air catalyst. OMX-SR is the most popular simplified tool for odor analysis in market by comparing "before and after". Real-time digital indication A built-in miniature pump introduces odor continuously and the numeric odor strength is displayed. Odor
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Supplier: Sinotech MotorsDescription: Cardiac pumps Factory Automation High speed semiconductor drills High speed pick and place electronic assembly system Semiconductor device assembly and test systems High speed miniature spindles High speed medical drills Advantages of Slotless Brushless DC Motors Sinotech's
- Motor Type: DC Motor
- DC Motor Construction: Coreless / Slotless
- Commutation: Brushless
- Gearing Arrangement: Planetary
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Supplier: MISUMI USADescription: highly original products that customers need with high quality, low prices and a short delivery period. MISUMI currently serves over 56,700 customers worldwide, supplying mechanical components for factory automation, press die and plastic mold components, cutting tools and gauges. MISUMI™s
- Capabilities: Assembly, Machining, Welding, Coating, Laminating, Polishing
- Services: Design, Model, Prototype, R&D, Test / Inspect
- Materials: ABS, CPVC, Delrin®, Hypalon® (CSM), Kevlar®, Kynar®, Nylon / Polyamide, PEEK, Polycarbonate (PC), Polyethylene (PE), Polyolefine, Polyoxymethylene (POM, Acetal), Polyphenylene Sulfide (PPS), Polypropylene (PP), Polyurethane / Urethane, PTFE - Teflon®, PVC, PVDF, Vinyl
- Location: North America, United States Only, Midwest US Only, Europe Only, South Asia Only, East Asia / Pacific Only
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Description: devices and technology to quickly generate accurate verification of your designs and manufacturing processes, and then compiles your data into professional, detailed reports. From tool and die verification through reverse engineering, Stork dimensional inspection services can help you shorten
- Capabilities: Certification, Component / Product Comparison, Failure Analysis / Troubleshooting, Field Evaluation / On-site Inspection, First Article / Contract QA, In-process / In-line Testing, Reverse Engineering / Digitization, Test Development, Test Fixtures / Equipment, Testing / Simulation, Specialty / Other
- Forms Tested / Certified: Capital Equipment, Components / Parts, Facilities / Capital Structures, Products, Samples or Materials
- Services Offered: Alignment, Dimensional Gaging / Metrology, Engineering / Design Verification (DVT), Form / Geometry (Straightness, Roundness, etc.), NDT / Inspection, Visual / Video Inspection, Specialty / Other
- Industry: Appliances, Aerospace / Avionics, Automotive, Battery / Energy Products, Building & Construction, Combustion Equipment, Consumer Products, Health Care / Medical, HVAC, Plumbing and Lighting, Industrial / Machinery, Instrument & Sensors / Laboratory, Materials, Motors and Control Systems, Nuclear / Utility, Paper / Plastic Packaging, Piping / Pressure Vessels, Power Generation, RF & Wireless / IT & Telecom, Rubber / Latex, Microelectronics / Electronics, Semiconductor / IC Packages, Valves / Pumps, Welding & Fabrication, Specialty / Other
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Supplier: Quadrant Engineering Plastic ProductsDescription: Product Overview This PEEK based static dissipative material provides a dissipative range of 106 - 109 ohms/sq. Semitron® ESd 480 is very dimensionally stable, making it ideal for critical test fixture applications. Its exceptional chemical resistance makes it well suited for use in wafer
- Chemical / Polymer System Type: PEEK
- Filler Material: Unfilled
- Form / Shape: Plate, Extruded Profile
- Material Type / Grade: Anti-static, Flame Retardant (e.g. UL 94 Rated)
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Supplier: Assembly & Test WorldwideDescription:
- Industry Served: Aerospace, Automotive, Electrical / Electronics, Food Processing, Industrial, Marine, Medical, Military, Optical, Packaging Equipment, Semiconductor, Other
- Capabilities: Jigs and Fixtures, Progressive Dies, Sheet Metal Forming Dies, Welding Fixtures, Custom / Specialty Tools
- Services: CAD/CAM Support, Design Assistance, Initial Tool Tryout, Production Facilities, Repair and Maintenance, Prototyping
- Location: North America, Southern US Only
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Supplier: Park Systems, Inc.Description: XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers, Data Storage / Memory
- Measurement Capability: Defects / ADC
Featured Products for Semiconductor Test Tool Top
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The ProformaTM 300 Advantage... One Package for ALL Wafer Sizes and Materials. Based on MTI Instruments' proprietary capacitance technology, the Proforma 300 can be used on all wafer materials including: · Silicon. · Gallium-Arsenide. · Indium Phosphide. · Germanium. ... without recalibrating or electrically grounding the wafer!. Fast, Accurate, and Reliable, the Proforma 300 measures wafers up to 300 mm in diameter for both thickness and total thickness variation (TTV). Portable and Easy to Set... (read more)Browse Semiconductor Metrology Instruments Datasheets for MTI Instruments Inc. -
300SA to your process needs. Wafer Specifications. Diameter: 200mm and 300mm. Material: All Semiconducting and Semi-insulating materials. Surfaces: As-cut, Lapped, Etched, Polished, Patterned. Flat/Notch: All SEMI Standard Flat(s) or Notch. Conductivity: P or N Type. Wafer mounting: Bare Wafer, Sapphire/Quartz Base, Tape. Measurements. Thickness and TTV. Bow. Warp. Site and Global Flatness. Advantages. Cost effective alternative to fully automated tools. Full 1000 uM Thickness Measurement Range... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc. -
production, test and research markets; semiconductor products for wafer characterization of semi-insulating and semi-conducting wafers within the semiconductor industry; and engine balancing and vibration analysis systems for both military and commercial aircraft. MTI Instruments is proud of the crucial role it has played with many of the world's largest companies whether it is in basic research, improved efficiency during production or quality control by offering solutions directly to the end-user... (read more)Browse Semiconductor Metrology Instruments Datasheets for MTI Instruments Inc. -
With Tompkins' PRO TEST Test Points, you can pressure test without tools and check for leaks in multiple spots without shutting down, avoiding costly downtime. Typical problems detected include leaking seals in pumps and cylinders, line blockages, faulty valves, clogged filters and worn out pumps and motors. The PRO TEST SYSTEM consists of a test point with a spring-load check valve along with a microbore high pressure hose that connects to a pressure gauge. The purpose of the system... (read more)Browse Industrial Valves Datasheets for Tompkins Industries, Inc. -
impedance are all presented on a single operator display to save time. No need to scroll thru multiple screens. This versatile meter also tests GFCI and AFCI operation. All load tests are done without tripping circuit breakers or blowing fuses. The handheld Amprobe INSP-3 operates from a single 9V battery and comes with carrying case and 120V AC test plug. Data Sheet Other Amprobe Testers... (read more) -
SUS, SBS, SCS.... Tutorial. Did you Know ?. · American Microsemiconductor is certified AS9100 Rev C. (We had previously been Certified AS9100 Rev B and ISO9001:2008 for years). · American Microsemiconductor Inc. has been supplying semiconductor for over 40 years. · We have the largest semiconductor stock, over 100,000 different line items in stock. · We have over 100 years of semiconductor sales experience. · We sell semiconductors worldwide. · We design, manufacture, and test all types... (read more)Browse RF Diodes Datasheets for American Microsemiconductor, Inc. -
Benchmark provides the semiconductor industry with a full compliment of thermal components with the following features: Uniform or profiled heat throughout or in discrete zones. Temperatures to 475 DegF (246 DegC). Temperature control through thermocouples or imbedded thermostats. Overtemperature protection through thermostats or thermal fuses. Control of surface temperature by insulation provides operator safety. Nylon coated snaps for operator protection. Clean room compatibility. Foam molded... (read more) -
offers a rugged solution for industrial troubleshooting and installation applications. It's a truly integrated test tool, with oscilloscope, multimeter and "paperless" recorder in one affordable, easy-to-use instrument. Find fast answers to problems in machinery, instrumentation, control and power systems. (read more)Browse Oscilloscopes Datasheets for Fotronic Corporation / Test Equipment Depot -
Scientific Test provides high performance semiconductor testers for testing discrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can meet or exceed your semiconductor testing requirements at a very affordable cost. Current Ranges: Standard: 1.0nA - 50A. Up to 100A with Mainframe Extension. Voltage Ranges: Standard (anode): 10mV - 1000V. 2000V with 2kV... (read more)Browse Automated Test Equipment Datasheets for Scientific Test, Inc. -
Scientific Test provides high performance semiconductor testers for testing discrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can meet or exceed your semiconductor testing requirements at a very affordable cost. Throughput of 5300HX. Throughput is dependent upon a number of variables including number of test steps, absolute value of programmed... (read more)Browse Automated Test Equipment Datasheets for Scientific Test, Inc.
Parts by Number for Semiconductor Test Tool Top
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| 4WRA2 | Grainger Industrial Supply | GRAINGER GLOBAL SOURCING - TOOLS | Test Clips and Probes | Modular Test Probe Kit, Color Black & Red, Length 5.5 In, Ratings 1000 V, 10 A, Insulation Type Double Insulation, Safety Rating CAT III 1000V, Tip Material Steel, Testing Semiconductor Interconnects and High Density Circuit Boards |
Conduct Research Top
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Developing an exit charge specification for semiconductor production equipment
infrared thermography as a preventive maintenance tool across all manufacturing and assembly/test facilities. Montoya received a BSEE (1991) from the University of New Mexico with an emphasis on semiconductor manufacturing. Montoya is a member of the IEEE EMC Society, the IEEE Engineering Management...
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Non-Contact Thickness Measurement of Semiconductor Wafers
Thickness measurement is an integral part of semiconductor wafer manufacturing. From an as-cut to a polished, epi-ready wafer, thickness measurement provides the process engineer with the information necessary to ensure that manufacturing processes are under control at all times and material...
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The New Era of Automated Test
3. Testing complex systems like WLAN on a chip requires new levels of test software abstraction and capabilities. Fortunately, tools such as NI LabVIEW graphical system design software make this possible. The same graphical programming environment used to control box instruments for 25 years...
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Machined plastics pass the test
resistivity target range of 1 X 10 O/sq, something previously unavailable to designers and users of high-precision test sockets. The first use for these materials: Ensuring super-dense ICs pass final QA. Designers of semiconductor consumables are relying more and more on advanced. Machined plastics...
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Top technical challenges in semiconductor manufacturing
steering council in consultation with corporate managers. In the area of lithography, Sematech's. Top technical challenges in semiconductor manufacturing | Machine Design. Skip to Content. Home. Subscribe. Advertise. Contact. RSS. E-mail: * Password: *. Create new account. Request new password...
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Socket-Adapter Systems: A Practical Test Alternative (.pdf)
Traditional one-piece, clam¬shell-design test sockets are useful diagnostic tools for establishing or evaluating device functionality. However, they tend to be less satisfactory for validating fine-pitch packages such as ball grid ar¬ray (BGA) and land grid array (LGA), which are gaining popularity...
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MICRO: Tool/Fab Automation
. The article concludes by addressing the yield impact associated with changing out a critical MFC. The data presented in this article were gathered from a variety of tools provided by major semiconductor equipment suppliers. The processes under investigation included interlevel dielectric etch...
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MICRO: Tool/Fab Automation
Ute Nehring and Andreas Steinbach, A case study involving DRAM and logic gate-conductor etch relies on data compression and analysis techniques to map process parameters to tool parameters and electrical test results. eal-time sensors have proven to be both a blessing and a burden. While savvy...
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MICRO: Tool/Fab Automation
Ron Bruns and Dave Zuck, QuantumClean; and A study begins to address the issues involved in quantifying tool-part cleanliness, which has not kept pace with process material purity. rom the day the first semiconductor device was manufactured, increasingly stringent defect reduction goals...
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MICRO: Tool/Fab Strategies
of similar tools. Whether a fab uses a mixed set of tools to expose different layers or different systems that resemble one another, optimizing the performance of an entire toolset can play a major role in semiconductor manufacturing. This article describes a methodology that was used to plan...
Engineering Web Search: Semiconductor Test Tool Top
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Keithley Instruments Inc. - A Greater Measure of Confidence Semiconductor Test Systems & Software Semiconductor Parametric Analyzers Automated Integrated Test Systems Semiconductor Parametric Test Systems See Keithley Instruments, Inc. Information |
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Automatic test equipment - Wikipedia, the free encyclopedia Semiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components |
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Digital Semiconductor Validation Reference Architecture:... Digital Semiconductor Validation Test Digital Semiconductor Validation Reference Architecture: Software Components |
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Computer Specification : ENERGY STAR would make use of an Energy Efficiency Performance Assessment tool (EEPA tool) in order to assess the energy efficiency of a desktop or notebook but See Energy Star Information |
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The Center for X-ray Optics - Now hiring engineers. Apply... Leading semiconductor and emerging-technology firms have recently renewed their long collaboration with the U.S. Department of Energy?s Lawrence |
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Untitled SCAN/JTAG System Test Access Home - SCANSTA Products from National Semiconductor |
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ADC14155 - 14-Bit, 155 MSPS, 1.1 GHz Bandwidth A/D Converter National Semiconductor | High-performance Analog Test and Measurement Equipment Communications Instrumentation See National Semiconductor Information |
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Electronic Components & Supplies | Mouser See Mouser Electronics, Inc. Profile & Catalog |
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Synopsys.com Implementation & Signoff Advanced digital and custom IC and FPGA design solutions, including synthesis, physical implementation, test and signoff See Synopsys, Inc. Information |
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Used Semiconductor and Scientific Equipment for Science and... Semiconductor Wafer Fabrication Semiconductor Manufacturing See Capovani Brothers Inc. Information |
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Siemens Industry Automation
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