Products & Services
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Supplier: Prior Scientific, Inc.
Description: to begin analysis. The Prior Scientific motorized Shuttle Stage is designed to be used with the Nikon and Olympus wafer loader systems for 3, 4, 6, and 8 inch wafers. The system greatly reduces operator fatigue while increasing inspection accuracy and repeatability. In operation, the Shuttle
- Type: Motorized Stage
- Features: Programmable
- Lighting: Reflected Light
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Supplier: Olympus America Inc.
Description: The Olympus MX51 industrial inspection microscope is optimized for the inspection requirements of a variety of electronic components including semiconductor wafer inspection. Its compact size, ease of operation, 6"x6" stage travel and cost effectiveness make the MX51 an ideal inspection microscope
- Form Factor: Monitor / Instrument
- Mounting / Loading: Autoloading / In-line, Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Defects / ADC, Particle Contamination
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Supplier: Vanpro Inc.
Description: Vanpro manufactures wafer carriers that support automated semiconductor handling equipment. These reticle carriers allow wafers to be handled safely and efficiently reducing down time and potential defect issues. Their wafer cassettes and wafer carriers meet the stringent requirements
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Supplier: Park Systems, Inc.
Description: The XE-WAFER is a fully automated industrial AFM designed specifically to address surface roughness, trench width, depth, and angle measurements on 200mm & 300mm wafers in a production environment. The system provides superior accuracy and precision nanometrology over any other system
- Form Factor: Monitor / Instrument
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Critical Dimension / Trench Geometry, Defects / ADC, Roughness / Waviness
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Supplier: PLANSEE SE
Description: Wafer substrates are bonded to the semiconductor layers of LED chips. With molybdenum and molybdenum-copper wafer substrates, PLANSEE offers the optimum material for a reliable heat dissipation in LED chips. The uniform thermal expansion of the wafer substrate, sapphire substrate and ceramic base
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Supplier: CoorsTek
Description: Advanced Ceramic Vacuum Wafer Chucks Solutions Developed Specifically for Wafer Handling As a leader in technical ceramics for wafer processing equipment, CoorsTek understands advanced semiconductor manufacturing and constantly develops new materials, designs, and processes to optimize yields
- Type: Vacuum Chuck
- Chuck Geometry: Round
- Number of Jaws: None / NA
- Chuck Actuation: Manual
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Supplier: Terra Universal, Inc.
Description: Electropolished 304 stainless steel ensures clean performance Inward pitch of rod-top shelf stabilizes wafer boats High-modulus casters dampen vibration, minimizing wafer chatter during transit This cart is designed specially for transporting delicate semiconductor wafers. Its 5" (127 mm
- Type: Container / Utility Cart, Other
- Material: Aluminum, Stainless Steel, Wire
- Wheel Type: Solid / Cushion
- Features: Brake
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Supplier: Nikon Metrology, Inc.
Description: Built to accept the latest technology in wafer transport, and incorporating its own integrated ULPA filtration system, the Optistation-7 easily exceeds new fab automation requirements. Nikon semiconductor inspection stations are designed to provide ultra-high precision and throughput
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Defects / ADC, Particle Contamination
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Supplier: JST Manufacturing, Inc.
Description: JST's Single Wafer Etching and Stripping System utilizes an automated chemical spray process on a single wafer. The system includes oscillating spray nozzles, adjustable wafer speed (RPM) and precision adjustment of the distance between the nozzles and the surface of the wafer. It's automated
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Supplier: MTI Instruments Inc.
Description: The Proforma 200SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 75 to 200 mm. wafers, the 200SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around
- Form Factor: Wafer Probing System, Sensor / Sensing Element
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers
- Measurement Capability: Roughness / Waviness, Shape / Flatness, Thickness - Wafer / Disc (TTV)
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Supplier: Epoxy Technology
Description: A single component, solvent free, screen printable polymer designed for semiconductor wafer applications including passivation, CSP, MEMs and alpha particle protection of memory die. Its unique features include sharp printing definition without pin holes, non-voiding and no bleed out.
- Material Type / Grade: Thermoset
- Chemical / Polymer System Type: Epoxy
- Resins & Compounds: Liquid
- Compound Type: Casting Resin
Find Suppliers by Category Top
Featured Products for Semiconductor Wafer Top
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MTI Instruments Inc.
Semiconductor Wafer Thickness Gage
The ProformaTM 300 Advantage... One Package for ALL Wafer Sizes and Materials. Based on MTI Instruments' proprietary capacitance technology, the Proforma 300 can be used on all wafer materials including: · Silicon. · Gallium-Arsenide. · Indium Phosphide. · Germanium. ... without recalibrating or electrically grounding the wafer!. Fast, Accurate, and Reliable, the Proforma 300 measures wafers up to 300 mm in diameter for both thickness and total thickness variation (TTV). Portable and Easy... (read more)
Browse Semiconductor Metrology Instruments Datasheets for MTI Instruments Inc. -
Insaco, Inc.
Semiconductor Wafer Processing Nesting
Specialty custom machining of sapphire and ceramic wafers allows Insaco to respond to customer needs for nesting of wafers in larger carriers. Insaco capability to machine and jig grind precise features to extreme tolerance in ceramic materials allows developmental engineers in the semiconductor and compound semiconductor industries to handle small process wafers on a large wafer line. Insaco is a precision machining company that fabricates parts from all technical ceramics, sapphire and quartz... (read more)
Browse Glass Fabrication Services Datasheets for Insaco, Inc. -
Olympus IMS
AL120 Wafer Handler
The NEW AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design. Continuing the world-renowned performance and reliability of previous Olympus wafer handlers, the AL120 now transfers wafers with thicknesses down to 90µm to specifically meet the demands of thin wafer manufacturers. The new system offers 360-degree rotation, for full macro... (read more)
Browse Specialty Microscopes Datasheets for Olympus IMS -
MTI Instruments Inc.
Solar Wafer Thickness Tool from MTI
production, test and research markets; semiconductor products for wafer characterization of semi-insulating and semi-conducting wafers within the semiconductor industry; and engine balancing and vibration analysis systems for both military and commercial aircraft. MTI Instruments is proud of the crucial role it has played with many of the world's largest companies whether it is in basic research, improved efficiency during production or quality control by offering solutions directly to the end-user... (read more)
Browse Semiconductor Metrology Instruments Datasheets for MTI Instruments Inc. -
MEI, LLC
MEI Solar Wafer Cleaning Equipment
Automated Solar Wafer Cleaning. Dry to Dry High Throughput, Process Multiple Lots and Recipes Simultaneously. The MEI Solar Evolution high throughput wet processing systems are in-line, configurable, automated, modular, linear batch immersion systems made for high throughput at a low cost. They are designed to clean photovoltaic/ solar wafers for many applications. We also make custom equipment for polysilicon and ingot cleaning, and wafer re-work. For Solar wafer processing, the MEI Solar... (read more)
Browse Semiconductor Wet Process Equipment Datasheets for MEI, LLC -
Precitec, Inc.
Measurement of Doped Wafers and TSVs
Modifications have been made to several existing CHRocodile sensors to enable measurement on unique semiconductor materials, ranging from glass, sapphire and highly doped wafers, to TSVs and other structured devices. Capable of measuring wafer thickness, topography or film thickness at high speeds, CHRocodile sensors are available for nearly all materials and applications. With the semiconductor and electronic industries dependant on high quality standards, the high precision of the CHRocodile... (read more)
Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc. -
Freudenberg-NOK Sealing Technologies Simrit
Fluorocarbon Compounds for Semiconductor Sealing
compounds - VO628 and VO793 - during SEMICON® West 2010 held July 13 to 15, 2010 in San Francisco. With their high-purity and low metal ion impurities, both critical to ensuring that no contaminants go into the clean-room production of semiconductor wafers and chips, Simrit's VO628 and VO793 materials were created specifically for use in semiconductor fabrication processes. Both materials can be utilized in a variety of products including O-rings and bonded gates. "As a materials specialist, it is our... (read more)
Browse Elastomer and Rubber Shapes Datasheets for Freudenberg-NOK Sealing Technologies Simrit -
Technical Glass Products, Inc. - OH
Avoiding Semiconductor Failures
an excellent furnace chamber for processing silicon wafers. This is significant in silicon wafer production because sag is virtually eliminated, and a longer furnace lifespan is assured. For superior performance at higher temperatures, Type 214 LDH furnace tubing gives process engineers a better balance between the effects of higher temperatures and heavier wafer loads. Leading suppliers offer a broad range of products that are used in semiconductor fabrication. For example, Technical Glass offers... (read more)
Browse Silica, Quartz, and Silicate Materials Datasheets for Technical Glass Products, Inc. - OH -
MTI Instruments Inc.
Wafer Metrology Measurement Tool
The Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 150mm, 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Built around MTI Instruments' exclusive Push-Pull capacitance technology, the Proforma 300SA delivers full wafer surface scanning at the press of a button. User defined and ASTM/SEMI scan patterns... (read more)
Browse Wafer and Thin Film Instrumentation Datasheets for MTI Instruments Inc. -
Lapmaster International
Accupol Lapping & Polishing Wafer Thinning Jig
The Lapmaster line of Accupol Lapping & Polishing Wafer Thinning Jig Fixtures are designed to control precision thickness and parallelism of thin, fragile components made of semiconductor, compound semiconductor and electro-optics materials. A vacuum chuck retains the wafers during processing. The spring-loaded weight (down-force) is available in applying just a few ounces or can be adjusted to applying several pounds. Single or multiple wafers can be retained and processed within a fixture... (read more)
Browse Laps and Lapping Tools Datasheets for Lapmaster International
Parts by Number for Semiconductor Wafer Top
| Part # | Distributor | Manufacturer | Product Category | Description |
|---|---|---|---|---|
| LM101A WAFER | ASAP Semiconductor | NSC | Not Provided | Not Provided |
| 2N3019 WAFER | ASAP Semiconductor | MOTO | Not Provided | Not Provided |
| NC3V3 WAFER | ASAP Semiconductor | ZETEX | Not Provided | Not Provided |
| TR6811FA WAFER | ASAP Semiconductor | CMD | Not Provided | Not Provided |
| 501XCG002 WAFER | ASAP Semiconductor | SOLITRON | Not Provided | Not Provided |
| SMCS572 WAFER | ASAP Semiconductor | MOTOROLA | Not Provided | Not Provided |
Conduct Research Top
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Non-Contact Thickness Measurement of Semiconductor Wafers
of electrically conductive materials. Application Notes: Non-contact Measurement Sensors, Solutions and Systems - MTI Instruments. . Non-Contact Thickness Measurement of Semiconductor Wafers. Capacitance Probes. Thickness measurement is an integral part of semiconductor wafer manufacturing. From
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Thickness, Shape and Flatness Measurement of Semiconductor Wafers
measurements. TTV is expressed in microns or mils (thousandths of an inch). Application Notes: Non-contact Measurement Sensors, Solutions and Systems - MTI Instruments. . Thickness, Shape and Flatness Measurement of Semiconductor Wafers. Thickness Measurement. THICKNESS. ASTM F657: The distance
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Electronics Industry Case Study: Tracking Semiconductor Wafers (.pdf)
A typical semiconductor head wafer manufacturing facility produces 500,000 units per day. With fabrication yields of ? = 50%, and 20,000 heads per wafer on a 150 mm wafer, this drives the need to start approximately 50 wafers per day. A typical processing boat will contain anywhere from 1 to 15
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Industry Reference: Semiconductor and Wafer Production
Etched foil element heaters to heat acid in portable wafer processing baths, High Temperature Binder Inorganic and Organic coatings and with fabrication materials such as fiberglass cloth, fiberglass mat, mica, and ceramic fiber insulating carriers, etc... Thermal Circuits -Semiconductor etched
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TA002: Backside Mounting Procedures for Semiconductor Wafer Processing
capability that will enable further increases in capacity. Following, we present an overview of the process steps involved in backside processing for GaAs wafers with through via holes. Figure 1 shows a cross-sectional view of the major steps as the wafer is processed
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F-105 Wet Scrubbers Installed at Semiconductor Wafer Fab in Singapore
In order to comply with Ministry of the Environment emission requirements, Project Engineers at Chartered Silicon Partners, Singapore (CSP) needed gas scrubbers for their FAB-6 expansion. They required six (6) new 40,000 CFM scrubbers with chemical addition and high efficiency mist eliminators to
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Semiconductor - Cleaning: NIR Spectroscopy to Monitor Cleaning Solutions in Semiconductor Wafer Manufacturing Process
In a competitive semiconductor industry, where high volume and maximum efficiency mean everything, an emerging technology commonly used in the chemical and refining industries may be a suitable processing aid. Process Near Infrared (NIR) spectroscopy generates rapid, real-time data that is reliable
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Semiconductor Inspection
There are a number of techniques that are utilised today in the post process on line optical inspection of semiconductor wafers. These include: * Spectroscopic reflectometry where multiple laser wavelengths are shone down onto the surface of the thick film covered substrate to obtain information
Engineering Web Search: Semiconductor Wafer Top
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Power Management IC | Mobile Semiconductors - Fairchild...
Die & Wafer Application Notes Power Management
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SEMI - Home | SEMI.ORG
Silicon Wafer Revenues Decline in 2012 February Issue of SEMI Global Update Now Available
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Advanced Packaging, Semiconductor Packaging & Circuit...
DuPont Home«Electronics«Semiconductor Packaging & Circuit Materials« Semiconductor Packaging & Circuit Materials Home
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SEMICONDUCTOR.CO.JP Semiconductor Links:...
BOIN's Semiconductor Linkpage Ceramic End-Effectors / Wafer Chucks
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Semiconductor device fabrication - Wikipedia, the free...
Semiconductor device fabrication From Wikipedia, the free encyclopedia (Redirected from Semiconductor fabrication)
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National Semiconductor - Wikipedia, the free encyclopedia
National Semiconductor From Wikipedia, the free encyclopedia National Semiconductor Type Public Industry
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Cypress Semiconductor
Wafer & Die Programmable System-on-Chip Cypress Semiconductor Completes Tender Offer for Ramtron International - 17 Oct 2012
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Analog, Embedded Processing, Semiconductor Company, Texas...
Die/Wafer Solutions DLP® & MEMS High-Reliability