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Product Announcements
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ASIC Design Applications
Custom Silicon Solutions, Inc. Atmel Starter Kit Prevents Data Counterfeiting Atmel Corporation Intellectual Property Products Custom Silicon Solutions, Inc. Low Power, Programmable, 555 Timer: Model CSS555 Custom Silicon Solutions, Inc. Standard IC Products Custom Silicon Solutions, Inc. Micro-Power 555 Timer Demo Kit Custom Silicon Solutions, Inc. |
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Mixed Signal Test ? Analog and mixed signal test tools from... Mixed-Signal Test The Tessent? mixed-signal test solutions are Home Products Silicon Test and Yield Analysis Mixed-Signal Test See Mentor Graphics Corporation Information |
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Mentor Graphics delivers highest quality silicon test and... The Tessent® mixed-signal test solutions are vendor- and ATE-independent, addressing the growing number of SerDes interfaces and PLLs on today?s SoC See Mentor Graphics Corporation Information |
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Stretching the limits of FPGA SerDes for enhanced ATE... Stretching the limits of FPGA SerDes for enhanced ATE performance |
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Testing high-speed, large scale implementation of SerDes I/Os... Title: 2005 IEEE International Test Conference Item Title: Testing high-speed, large scale implementation of SerDes I/Os on chips used in throughput |
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Tutorials - Maxim Automatic Test Equipment (ATE) Automotive Automatic Test Equipment (ATE) Automatic Test Equipment on a Budget See Maxim Integrated Products, Inc. Information |
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Interface, Interconnect, Signal Integrity - Latest Application... EMI-/EMC-Ready SerDes?Basic Test Strategies and Guidelines See Maxim Integrated Products, Inc. Information |
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Advantest Targets Advanced SerDes Device Testing with T2000... 2005 ? Advantest Corporation (TSE: 6857, NYSE: ATE), the world?s largest supplier of semiconductor test equipment, today introduced a revolutionary |
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Advantest Showcases SoC Solutions for Advanced SerDes Device... (TSE: 6857, NYSE: ATE), the global leader in semiconductor test equipment, is showcasing its latest Automatic Test Equipment (ATE) solutions at the |
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PCI Express requires ATE strategy |
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Analog BIST locates good dice It can be disheartening to try to solve the problem with automatic test equipment (ATE) or rack-and-stack implementations. |