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Part # Distributor Manufacturer Product Category Description
LAB20609AS Global Industrial Elkay Plastics Company Inc Not Provided Assorted Tinted 3-Wall Style Specimen Transfer Bag - Printed Biohazard 6"W X 9"L, Pkg Qty 1,000
LAB20609GR Global Industrial Elkay Plastics Company Inc Not Provided Green Tint 3-Wall Style Specimen Transfer Bag - Printed "Biohazard" 6"W X 9"L, Pkg Qty 1,000
LAB20609NP Global Industrial Elkay Plastics Company Inc Not Provided 3-Wall Style Specimen Transfer Bag - Clear/No Print 6"W X 9"L, Pkg Qty 1,000
B505 Global Industrial Bobrick Washroom Equipment, Inc Not Provided Bobrick ® Recessed Specimen Pass-Thru Cabinet
PT2721K Global Industrial Harloff Company, The Not Provided Harloff Specimen Pass-Through Cabinet W/Key Locks 13-3/4"W X 6-1/4"D X 14"H
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  • Introduction of Cross Section Specimen Preparation
    Cross Section Specimen Preparation Device Using Argon Ion Beam for SEM Cross Section Polisher (CP) SM-09010
  • Medical Specimen Transport System Success Story
    An OEM wanted to launch a solution to provide hospitals and laboratories with an automation material handling solution for transporting fragile test tube specimens within a laboratory setting. Our client required absolute cleanliness, rigorous maintenance and zero-risk safety standards for handling
  • The Use Of X-ray Diffraction To Determine The Triaxial Stress State In Cylindrical Specimens (.pdf)
    A method of determining the axial, circumferential and. radial residual stress distributions in cylindrical. specimens is described. The axial and circumferential. residual stresses are measured directly by x-ray. diffraction at the free cylindrical surface exposed by. machining
  • Structure Analysis of Fine Precipitates in Metals Using an FIB-TEM (HF-2200, FB-2000A TEM 110)
    A specimen preparation technique using FIB/TEM systems permits an excellent specimen preparation for transmission electron microscopy allowing 0.1 um or thinner specimens. This technique makes it possible to check the specimen conditions during FIB milling by SEM/STEM imaging at a high voltage
  • Polarizing Microscopes
    Polarizing microscopes or polarized light microscopes use two polarizers (one on either side of the specimen) that are positioned perpendicular to each other so that only light which passes through the specimen reaches the eyepiece. Light is polarized in one plane as it passes through the first
  • JEM-9320FIB Product Brochure
    and achieves precise, fast milling for SEM cross sectional specimens. The JEM-9320FIB can simultaneously install the bulk specimen motor stage optimum for SEM/TEM specimen preparation from a bulk specimen, and the side-entry goniometer stage optimum for TEM specimen preparation (either one is a standard
  • Test Data for Kellett Enterprises Closed Cell Foam 3/8 (.pdf)
    Procedure: Two specimens were prepared from the submitted sample by mounting a 2"x2" section on a steel plate. Each specimen was pulled at 6 in/min. across a section of tile provided by the customer. The sample was loaded with a 200-gram weight.
  • Site-Specific 3 Dimensional Characterization Using an FIB Micro-Sampling Technique (FB-2000A, HD2000, HF-2200 STEM 7)
    , is well-known for its unique ability to make selected site-specific TEM specimens available directly from bulky samples. Failure analysis of semiconductor devices often require plan and sectional views simultaneously. Here in this Technical Data, we report on specimen preparation for plan
  • An Issue in Time to Delamination (T260) Testing for PCBs (.pdf)
    It has been reported by several laboratories that the time to delamination or decomposition of a printed circuit board specimen at 260°C decreases with the specimen thickness. A temperature gradient across the thickness of the sample within the furnace of the Thermomechanical Analyzer (TMA

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