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Standards and Technical Documents - Standard Test Method for Total Luminous Reflectance Factor by Use of 30/t Integrating-Sphere Geometry (Withdrawn 2004) -- ASTM E1651Supplier: ASTM International
Description: 1.1 This test method covers measurement of total luminous reflectance factor of opaque, nonfluorescent specimens by use of an integrating-sphere reflectometer with illumination at an angle of 30° from the surface normal and diffuse viewing with specular component included. 1.2Show More
Standards and Technical Documents - Paints and varnishes -- Determination of specular gloss of non-metallic paint films at 20 degrees, 60 degrees and 85 degrees -- ISO 2813:1994
Description: Specifies a test method for determining the specular gloss of paint films using a reflectometer geometry of 20°, 60° or 85°. The 60° geometry is applicable to all paint films, but for very high gloss and near-matt films 20° or 85° may be more suitable. TheShow More
Supplier: Filmetrics, Inc.
Description: Affordable Reflectance, Transmittance, and Film Thickness Measurement aRTie represents a breakthrough in spectral reflectometer affordability and ease-of-use. Time consuming reference readings and minutes-long lamp warm-ups are a thing of the past. Simply plug aRTie into your
- Type: Thickness Gage
- Technology: Optical, Non-contact
- Range: 5.91E-7 to 0.0028 inch
- Units: Metric
Supplier: StellarNet, Inc.
Description: spectrometer coupled to a reflectance probe and light source. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample's specular reflectance. Several spectrometer models are available to suit your thin film
- Mounting / Loading: In-situ / System Mounted
- Applications: CVD / PVD Films, Data Storage / Memory, Flat Panel Displays, Optical Components , Polishing / CMP, Polymers / Photoresists, Semiconductor Wafers, Other
- Measurement Capability: Thickness - Film / Layer, Thickness - Wafer / Disc (TTV)
- Technology: Reflectometer
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New Method to Characterize Degradation of First Surface Aluminum Reflectors: Preprint
The degraded samples were analyzed with a microscope and with a newly designed space-resolved specular reflectometer (SR)2 that is capable of optically detecting and characterizing the corrosion spots.
Light-Scattering Properties Of Laminate Membrane Mirrors
These laminar reflector struc- tures often exhibit light- scattering features not present in glass mirrors; features too large for previous specular reflectometers to fully discern and yet too small to be labeled slope error.
Applied Photometry, Radiometry, and Measurements of Optical Losses
Fig. 5.15 Absolute specular reflectometer .
Handbook of Optics: Volume II - Design, Fabrication, and Testing; Sources and Detectors; Radiometry and Photometry, Third Edition > MEASUREMENT OF TRANSMISSION...
R. F. Weeks, “Simple Wide Range Specular Reflectometer ,” J. Opt. Soc. Am. 48:775 (1958).
Specular Reflectance Properties Of Silvered Polymer Materials
The specular reflection properties of transparent cast polymer sheets and extruded polymer films, silvered and unsilvered, have been characterized with a newly designed specular reflectometer .
Environmental Reflectance Degradation Of Central Receiver Test Facility (CRTF) Heliostats
The development of a portable specular reflectometer ' made it possible to obtain reflectance measurements on heliostats that had been exposed to the environment for approximately one and one -half years without cleaning.
Journal of Spacecraft and Rockets > Survey of infrared measurement techniques and computational methods in radiant heat transfer. transfer.
In general, the Strong66 and the Bennett63 specular reflectometers account for the en- tire range of instrumentation for the accurate measurements.
The Reflectance Of Ames 24E, Infrablack, And Martin Black
The basic instrument, the non - specular reflectometer (NSR) shown in Figure 1, has been described before.