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Parts by Number Top

Part # Distributor Manufacturer Product Category Description
SS-10-3.8-G Allied Electronics, Inc. INTERCONNECT DEVICES INC Not Provided 0.100 INCH CENTERLINE SPACING SPRING CONTACT PROBES SPHERICAL RADIUS
SH-100-A-6.7-G Allied Electronics, Inc. INTERCONNECT DEVICES INC Not Provided Spring Contact Probes .100 (S100) centerline spacing 90 degree cup
SH-3-H-7-G Allied Electronics, Inc. INTERCONNECT DEVICES INC Not Provided Spring Contact Probes .125 (size 3) centerline spacing Waffle
SW-4-C-4.4-E/N-107 Newark / element14 INTERCONNECT DEVICES Not Provided INTERCONNECT DEVICES - SW-4-C-4.4-E/N-107 - SPRING CONTACT PROBE; PCB
S-4-E-5-G Newark / element14 INTERCONNECT DEVICES Not Provided INTERCONNECT DEVICES - S-4-E-5-G - SPRING CONTACT PROBE; PCB
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Conduct Research Top

  • Test Probes Spring Force Considerations (.pdf)
    When selecting probe spring force for vacuum fixtures, consider these factors: 1) Total probe spring force. 2) Condition of contact surfaces. 3) Distribution of probes across the probe field
  • Calculating X Probe Termination Heights (.pdf)
    Probe Termination Pin set height is a critical factor in the performance and life of the X Probe. When set too low, the X Probe is under-stroked, reducing the contact force and the X Probe's ability to penetrate surface contaminants. When set too high, the X Probe is over-stroked, resulting
  • Medical Device Link .
    Surface-mount header assemblies are an alternative to straight-pin and turned-pin headers. The spring probes used i n the assemblies are said to provide significantly more contact resiliency than conventional headers. With six contacts per header, the components are suitable for applications
  • Calculating Socket Set Heights (.pdf)
    Socket set height is a critical factor in the performance and life of a test probe. When set too low, the probe is under-stroked, reducing the contact force and the probe's ability to penetrate surface contaminants. When set too high, the probe is over-stroked, resulting in decreased spring life
  • Electronic Dimensional Gauging in Hostile Environments
    in.). They incorporate a non-contact inductive position sensor, either LVDT or half-bridge, which uses a spring-loaded movable...
  • Metrigraphics Article in Today's Medical Developments
    gelatin capsule - the same size capsule you might take as your daily vitamin. "Then there are purely structural parts we produce, such as a spring used for testing probes in the semiconductor industry," Sablich says. "The spring is quite large compared to some of the springs and devices we make
  • MICRO:Top 40 (Nov '00)
    products, process control software, metrology equipment, and an array of sensors, valves, and probes. Congratulations to the winners! Page Two of Product Allstars A front-opening shipping box (FOSB) for 300-mm wafers meets strict environmental protection and contamination specifications
  • MICRO:Top 40 (Nov '00)
    products, process control software, metrology equipment, and an array of sensors, valves, and probes. Congratulations to the winners! Page Two of Product Allstars A front-opening shipping box (FOSB) for 300-mm wafers meets strict environmental protection and contamination specifications

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