Our Sites: GlobalSpec.com | GlobalSpec Electronics | CR4
Welcome to GlobalSpec!
Find parts, products, suppliers, datasheets, and more for:

SS Strip

 

Find Suppliers by Category

Stainless steels are steels that contain a minimum of 10% chromium and are more resistant to corrosion than normal steels.
Search by Specification | Learn More

Parts by Number for SS Strip Top

Partb # Distributor Manufacturer Product Category Description
SS 596 Newark / element14 BELDEN Not Provided BELDEN - SS 596 - SIAMESE STRIPPER 59/6
SS6T PLC Radwell Hubbell Not Provided OUTLET STRIP OR EQUAL
SS7415-15 Digi-Key Tripp Lite Line Protection, Distribution, Backups POWER STRIP 48" 16OUT RACK MOUNT
SS7619-15 Digi-Key Tripp Lite Line Protection, Distribution, Backups POWER STRIP 72" 15A 24OUT15'CORD
SS761915 PLC Radwell Tripp Lite Not Provided SUPPRESSORSOUTLET; SUPPRESSOR TYPE:OUTLET STRIP; T

Conduct Research Top

  • MICRO:Product Technology News (Jan '99)
    The adjustable fluid flow control and end-of-cycle snuffback features of the Model 725DA-SS valve eliminate drips in spin coating applications. A stainless-steel fluid chamber, an inert polymer diaphragm, and sealing head isolate the actuator from wetted components to ensure trouble-free cycles
  • Chemical Resistance Chart
    for information on Eastar® products. Chemicals. Chemicals. PVC. Ultem (GF 40%)CPVC PPL PVDF. Teflon Viton. PVCGF (Fiberloc). EPDM. 316 SS416 SS. Nitrile (Buna N). Titanium. PVC. Ultem (GF 40%)CPVC PPL PVDF. Teflon Viton. PVCGF (Fiberloc). EPDM. 316 SS416 SS. Nitrile (Buna N). Titanium. Acetaldehyde. X X B C X
  • Application of X-ray Diffraction Residual Stress Measurement to Shot Peened Surfaces (.pdf)
    and measurement. a. -250. directions are comparable to those that are directly. (MP. measurable must be verified by prior subsurface. SS. -500. studies. RE. -750. Decarburized/Peened. 2. Subsurface residual stress measurement, with. DUAL ST -1000. Electropolished/Peened. correction for penetration of the x-ray
  • MICRO: Extreme Silicon - Sun (March 2000)
    the maximum acceptable surface level. By comparing the mass spectrum of the unknown peak at 18 minutes in the MSD chromatogram to the mass spectrum library, this organophosphorus contaminant was identified as Fyrol PCF (tri-(SS-chloroisopropyl phosphate)), a commonly used flame retardant that can cause
  • MICRO: Extreme Silicon - Sun (March 2000)
    , this organophosphorus contaminant was identified as Fyrol PCF (tri-(SS-chloroisopropyl phosphate)), a commonly used flame retardant that can cause unintentional n-type doping on silicon wafers.12 The matching spectra are shown in Figure 4. Figure 3: Chromatograms of a wafer sample that had been

Engineering Web Search: SS Strip Top