|
|
|
|
Welcome to GlobalSpec!
Find parts, products, suppliers, datasheets, and more for:
Stage Scanning Microscope
Find Suppliers by Category
Microscopes are instruments that produce magnified images of small objects
Search by Specification |
Learn More
Products & Services
See also: Featured Products | Technical Articles | Engineering Web Results-
Supplier: PI (Physik Instrumente) L.P.Description: Low Profile, Optimized forMicroscopy Applications P-541/P-542 nanopositioning and scanning stages are designed for easy integration into high-resolution microscopes. They feature a very low profile of 16.5 mm, a large 80 x 80 mm aperture, and offer highly accurate motion with sub-nanometer
-
Supplier: MTI Instruments Inc.Description: MTII/Fullam offers a unique, compact test system specifically designed to fit inside scanning electron microscopes. Capable of performing tensile, compression, bending and fatigue tests, they are ideal tools for researchers and material scientists. During testing, crack propagation, grain rotation
- Type: Automated Stage, Other
-
Supplier: Leica Microsystems, Inc.Description: The Leica DM4500 P is a high-end polarization microscope with intelligent light and contrast management. It operates with a mechanical Z-drive and mechanical stage. As an option, the microscope can also be retrofit with a motorized fine focus drive or scanning stage. The brightness of the image
- Application: Other
- Grade: Benchtop
- Computer Interface: Yes
- Image Analysis Processing Software: Yes
-
Supplier: GENEQ, inc.Description: the eyepieces. The new BA310 design also includes a standardized (DIN/ISO) photoport exit. The BA310's large, hard coated and chemical resistant stage, with an expansive 76x50mm travel range, incudes a new slide holder with improved tighter grip. This ensures easy and repeatable scanning of numerous slides
-
Supplier: MicroSense, LLCDescription: to a millimeter. The Mini is ideal for short travel, precision positioning applications – providing position feedback in mechanisms such as piezo driven positioning stages, micro-actuators, and scanning probe microscope stages. Based on advanced capacitive sensing technology, the MicroSense
- Technology: Capacitive Linear Position Sensor
- Output: Voltage
-
Supplier: Nikon Metrology, Inc.Description: The NEXIV VMR-6555 is a large stage bridge automated CNC non-contact measuring instrument. It features TTL laser height/profile scanning, intelligent pattern recognition and low contrast edge measuring. Designed for larger samples like FDP, LCD, PCB and mass-in-line inspections. Four models
- Application: Measuring / Toolmaker, Metallurgical, Semiconductor Inspection
- Grade: Benchtop
- Microscope Type: Laser / Confocal, Other
- Eyepiece Style: Other
-
Supplier: Cynmar CorporationDescription: - parfocal and precisely centered; color-coded for easy identification • Reverse quadruple nosepiece, ball-bearing mounted; rubber grip; precise click-stop action to center each objective • Built-in rackless rackless X axis, double plate mechanical stage; X/Y Range: 75mm x 52mm; low drive
-
Supplier: Phenom-World BVDescription: With the 3D Roughness Reconstruction application, the Phenom is able to generate three-dimensional images and submicrometer roughness measurements. This fully automated application for the Phenom scanning electron microscope will help to communicate imaging results and will extract and visualize
-
Description: for the turbo pumps include high energy physics and research, nanotechnologies, mass spectrometry, industrial vacuum processing, and semiconductors as well as dedicated pumps for Scanning Electron Microscope (SEM) work. Better performance with less power consumption Saves energy while creating less
- Configuration: Individual Vacuum Pump
- High Vacuum / UHV Pump Technology: Turbomolecular
- Lubrication: Dry / Oil-less
- Application: General Purpose / Industrial, Analytical / Scientific, Semiconductor Manufacturing, Other
-
Supplier: OMICRON NanoTechnologyDescription: STM/SEM-HC stage feature sample heating and cooling
- Application: Biological / Life Science
- Microscope Type: Scanning Electron Microscope (SEM), Other
Featured Products for Stage Scanning Microscope Top
-
Perform profile and roughness measurements on nearly any material. The KEYENCE VK-X Series 3D Laser Scanning Microscopes combine the capabilities of SEMs and non-contact roughness gauges with the simplicity of an optical microscope. This newly released system now boasts an unprecedented 0.5 nanometer Z-axis resolution with a magnification range spanning 200x - 24,000x. The usability and ease-of-use have been further improved with the addition of the AI-Scan function, allowing users to image... (read more)Browse Specialty Microscopes Datasheets for KEYENCE -
controlled automated sample stage can handle samples up to 20 mm in thickness. The iN10 MX Scanning IR Microscope will be applied to: Identification of contaminants. Characterization of plastics, rubbers and composites. Co-extrusions & multilayer packaging. Paints, coatings and adhesives. Microelectronics. Surface modification. Medical devices. Pharmaceuticals. Inks, pigments and graphic arts. Fibers and textiles. Cosmetics. Particle identification. Forensic investigations. Art restoration... (read more)Browse Material Testing Services Datasheets for ANALYZE Inc. -
Controller Included High Performance & Cost Effective Design. PInano ™ XY and XYZ microscope piezo positioning stages are designed to provide high performance at. low cost. For highly stable, closed loop operation, piezoresistive sensors are applied directly to the moving structure and precisely measure the displacement of the. stage platform. The very high sensitivity of these sensors provides optimum position. stability and responsiveness as well as sub-nanometer resolution... (read more)Browse Microscope Stages Datasheets for PI (Physik Instrumente) L.P. -
Phenom Pro Suite. The Phenom Pro Suite is developed to enable Phenom users to extract maximum information from images made with the Phenom desktop scanning electron microscope (SEM). It extends the capabilities of the Phenom, a high-resolution imaging tool, providing solutions to specific application needs. The Phenom Pro Suite software is installed on the Phenom Application System. This monitor-mounted PC is the hardware platform for all Phenom Pro Suite software, leaving the Phenom system... (read more)Browse Electron Microscopes Datasheets for Phenom-World BV -
Cambridge Polymer Group has developed a software add-on for Varian's FTIR spectrometer that provides automated 2D scanning of samples. Our Dynamic FTIR Scan package carries out automated scanning of any pattern along sample surfaces and edges, including user-defined periodic background scans and refocusing. The user either enters the start/end points and sample spacing or array of individual scan position, along with baseline/focus position and period if desired, and the software performs... (read more) -
Fast Piezo Focusing Stages for High Resolution Microscopes. A new, more affordable series of Fast Piezo Focusing devices is now available from piezo system specialist PI. The new PIFOC® system packages are designed to improve results in fast focusing & lens positioning as well as in deconvolution / 3D imaging, and to reduce costs at the same time. Features & Advantages. • Complete System with Fast Digital Controller & Software. • Choice of Travel Ranges: 100 µm, 250µm... (read more)Browse Microscope Stages Datasheets for PI (Physik Instrumente) L.P. -
of the LT's ultra-small, 2-micron beam spot. A continuous waveform display of topographic surface detail is provided by the LT's built-in microscope. The LT-9501 Controller and monitor provide simple-to-use menus in combination with a hand-held remote control unit for operational simplicity. Typical LT measurement applications: • Semiconductor: Height measurement of minute (20-micron diameter) bonding wires, BGA (Ball Grid Array) shape and height, depth of wafer etch and dicing grooves, wafer... (read more)Browse Optical Triangulation Position Sensors Datasheets for KEYENCE -
MTII designs and manufactures miniature tensile, compression and bend testing machines specifically designed for use in Scanning Electron Microscopes (SEM's), Atomic Force Microscopes (AFM's) and Light Microscopes (LM's). The dual leadscrew design symmetrically loads samples while keeping them centered within the scope's field of view. 100 and 1000 pound versions are standard with a wide range of sample clamps, bending fixtures (3 and 4 point) and compression anvils. Custom mounting adapters... (read more) -
As the number of large area, web feed and remote applications that use laser processing is growing exponentially, Cambridge Technology's 3-Axis Scanning Systems are gaining more and more popularity in the marketplace due to their: large field of view. small spot size. ability to scan pre-defined 3D surfaces. ability to use high power lasers. Compared to mechanical processes, laser processing using 3-Axis Scanning provides improved flexibility, quality, setup time and throughput. The advantages... (read more)Browse Laser Processing Equipment Datasheets for Cambridge Technology, Inc. -
Cambridge Technology, Inc. Announces. The Model 6250H Galvanometer and. High Performance Scanning Mirrors. A High-Performance Galvo for Large Apertures is a price/performance breakthrough. Lexington, MA and San Francisco CA. January 24, 2012- Cambridge Technology, Inc., the market leader in galvanometer-based optical scanning technology, today announced another product innovation for large aperture scanning applications. The 6250H, the latest addition to the CTI 62xxH Product line of moving... (read more)Browse Galvanometer Optical Scanners Datasheets for Cambridge Technology, Inc.
Conduct Research Top
-
Near Field Imaging of a Laser Diode Using Scanning Method
resolution was approximately 1 um. The measurement setup was constructed on Newport AutoAlign8000 alignment system, which consists of two motion stage stacks and a stationary center post. Beam profiling was achieved by using a high magnification microscope objective and scanning a detector with a pinhole...
-
Setting the stage for clearer images
microscope. Clear scanned images rely on low jitter levels at the chuck. For example, an imaging sensor collecting data at 1 kHz with the Y stage scanning at 10 mm/sec theoretically gives 100-mm resolution. Measuring geometrical features smaller than this resolution requires jitter-free constant velocity...
-
MICRO: Product Extra!
iC atomic force microscope (AFM) upgrade kit supports Veeco Dimension-series scanning probe microscopes, which accommodate large samples such as 300-mm wafers. The stage offers a scanning range of 100 X 100 um. The upgrade kit brings subnanometer accuracy and excellent scan linearity to existing...
-
Evaluation of confocal microscopy system performance
The confocal laser scanning microscope (CLSM) has been used by scientists to visualize three-dimensional (3D) biological samples. Although this system involves lasers, electronics, optics, and microscopes, there are few published tests that can be used to assess the performance of this equipment...
-
Advanced Digital Technology Breaking Ground in Light Microscopy (.pdf)
microscopes, measuring microscopes and scanning electron microscopes into an all-in-one imaging, me 1100 North Arlington Heights Road. Itasca, IL 60143. 888-KEYENCE (539-3623). www.keyence.com. Advanced Digital Technology Breaking Ground. in Light Microscopy. By: Leila Javidi, Application Engineer...
-
Medical Device Link .
compatible, however, either critical-point drying or a cold stage can be used to observe the sample. Nonconducting samples can be coated with a thin layer of carbon or precious metal in a thermal vacuum evaporator or plasma sputter-coater. Another type of scanning electron microscope...
-
MICRO: Behind the Mask -Chen (April 2000)
programmed defect sizes, the sizing errors associated with these instruments can be as large as 100 nm, making it difficult to characterize the inspection tool's sensitivity accurately, especially when dealing with defect sizes <0.5 um. Fortunately, as scanning electron microscopes dedicated to mask...
-
Anatomy of a Snowflake
emotions to many people. It can mean a harried drive home during rush hour traffic or the promise of a weekend of skiing. But ARS microscopists William P. Wergin and Eric F. Erbe view snowfalls as welcome opportunities to photograph snowflakes using a scanning electron microscope (SEM). Images from...
-
High-Speed EBSD (.pdf)
An electron backscatter diffraction (EBSD) pattern is formed when a focused electron beam is positioned on a grain within a highly inclined (typically 70 degrees) sample in a scanning electron microscope. As the incident electron beam interacts with the crystal lattice within a small volume...
-
MICRO: Product Tech News
on the scanning electron microscope's chamber configuration. The system integrates all three techniques into a single PC environment. Its hardware and software provide all three techniques with data-sharing capacity and improve data-processing speed and accuracy. For additional analytical capability...
Engineering Web Search: Stage Scanning Microscope Top
|
Inverted microscope - Wikipedia, the free encyclopedia An inverted microscope is a microscope with its light source and condenser on the top, above the stage pointing down, while the objectives and turret |
|
|
Graphene - Wikipedia, the free encyclopedia Also, they note a number of pre-2004 reports in which intercalated graphite compounds were studied in a transmission electron microscope. |
|
|
Untitled Microscope Stages Vacuum Products Fiber Alignment See PI (Physik Instrumente) L.P. Information |
|
|
Los Alamos: MST: MST-6: EML: Electron Microscopy Laboratory Philips XL30 F Scanning Electron Microscope & Orientation Imaging System See Los Alamos National Laboratory Information |
|
|
Microscopy at UW-Madison | Research & service microscopy... Scanning electron microscopes (5) Field-emission scanning electron microscopes (2) Confocal laser scanning microscopes (8) |
|
|
Applied Scientific Instrumentation - The Solution Creators MS-8000 XY Automated Stage MX-2000 Microscope Translation Stage MS-2000-WK Multi-Axis Stage Controller RM-2000 Rack Mount Stage Controller See Applied Scientific Instrumentation Information |
|
|
PRIOR SCIENTIFIC - Product Information Microscope Automation Motorized Stages See Prior Scientific, Inc. Information |
|
|
Precision Nanopositioning Instrumentation, Pico-Positioning,... Motorized Stages Photonics Alignment Steering Mirrors Nanopositioning Scanning Stages Piezo Actuators Hexapod 6-Axis Motion Control Systems Physik |
|
|
The TEAM Project: TEAM05 The microscope is a very special design that starts with the advanced commercial column produced by FEI company, but adds a number of unique |
|
|
Front-illuminated full frame image sensor achieves 85% peak... The 2-stage amplifier on the KAF-3200ME sensor, shown in Figure 7, has a low-capacitance sense node achieving 20 ?V/e- and 6 electrons total system |
More >>
