Our Sites: GlobalSpec.com | GlobalSpec Electronics | CR4
Free Registration 
Welcome to GlobalSpec!
Find parts, products, suppliers, datasheets, and more for:

Step Height Profilometer

 

Find Suppliers by Category

Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
Search by Specification | Learn More

Products & Services

See also: Technical Articles | Engineering Web Results

  • No Image
    Provided
    View Specs & Datasheet
    Surface Profilometers - NewView Delta MPT™ -- Model SA
    Supplier: Zygo Corporation
    Description: Fast 3D noncontact robust factory floor profilometer, roughness OR form
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Common Specific Parameters: Roughness Average (Ra), Roughness- RMS (Rq), Mean Peak to ValleyHeight (Rtm, Rz), Base Roughness Depth(R3Z), Maximum PeakHeight(RP), Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), TotalRoughness Height (Rt, PV), Profile Depth (Pt), Maximum Roughness Depth (Rmax, Ry), Ten Point Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other
    Supplier Profile
    Go To Website
  • MTI-2100 Fotonic -- MTI-2125H
    View Specs & Datasheet
    Surface Profilometers - MTI-2100 Fotonic -- MTI-2125H
    Supplier: MTI Instruments Inc.
    Description: The MTI-2100 features advanced fiber-optic and electronic technologies for precise measurements of displacement, position and vibration. It sets new performance standards with resolution up to 0.01 uin. (2.5 Angstroms) and frequency response from direct-coupled (dc) up to 500 kHz. The
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow
    • Technology: Non-contact - Optical / Laser
    • Common Specific Parameters: Other
    • Industrial Applications: Automotive, Coatings (Thin Films, Plating, etc.), Mechanical Parts (Bearings, Shafting), Precision Machining / Grinding, Storage Media
    Supplier Profile
    Go To Website
    Email Supplier
  • Crosscheck™ Laser Profile Sensor -- CC3000-50
    View Specs & Datasheet
    Surface Profilometers - Crosscheck™ Laser Profile Sensor -- CC3000-50
    Supplier: Bytewise Measurement Systems
    Description: Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification.
    • Measurement Capability: Flatness, Step Height, Thickness, Warp / Bow
    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Common Specific Parameters: Average Peak Profile Height (Rpm), Maximum Valley Depth (RV), Peak Count (PC)
    Supplier Profile
    Go To Website
  • Stylus Profiler -- Dektak 8
    View Specs & Datasheet
    Surface Metrology Equipment - Stylus Profiler -- Dektak 8
    Supplier: Bruker Nano Surfaces Division
    Description: The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system’s impressive step height repeatability and vertical range, plus
    • Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Step Height
    • Surface Metrology: Surface Profilometry
    • Technology: Contact / Stylus Based
    • Industrial Applications: Semiconductor Manufacturing
    Supplier Profile
    Go To Website
  • Stylus Profiler -- Dektak 150
    View Specs & Datasheet
    Surface Metrology Equipment - Stylus Profiler -- Dektak 150
    Supplier: Bruker Nano Surfaces Division
    Description: range option of 1 millimeter enables larger step measurements 6 Angstrom repeatability with optional 4 angstrom performance to be industry-best NLite accessory for measurement of soft materials like photoresist
    • Measurement Capability: 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Step Height
    • Surface Metrology: Surface Profilometry
    • Technology: Contact / Stylus Based
    • Industrial Applications: Semiconductor Manufacturing
    Supplier Profile
    Go To Website

Conduct Research Top

  • Inspecting Hard-to-Reach Surfaces (.pdf)
    is an unfolded image of the internal surface. of the gun barrel in Figure 5. Height is encoded in the. brightness of the pixels. Dark to bright gray levels. represent a depth span of 750 µm. Surface features. in the order of a few microns would contribute to the. signature transferred to bullets. Figure 4
  • MICRO: Advanced Process
    over an STI trench. The first is that profilometer technology is based on measuring the deflection of a stylus affixed to the tip of a cantilever beam. As the stylus is physically dragged across the surface of the wafer, as illustrated in Figure 3, it records the step height of the structures
  • MICRO:Archive:Back Issue TOC
    , wafer transport robot, XRF analyzer, height-adjustable workbench, etch manometer, power supplies, airflow measurement system, computer workstations, and more. Product Extra!. Products in Action: Control system speeds start-up and stabilizes process air in DUV litho tool clusters. SEMICON West 2000

Engineering Web Search: Step Height Profilometer Top