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Supplier: Tradeport Electronics Group
Description: SMD/Chip Test Fixture for LCR-816/817/819/821
Supplier: Chroma ATE, Inc.
Description: 50/100MHz, 256 I/O channels, 16M, parallel testing of 4 devices
- Type / Form Factor: Test Platform / System
- Options / Module Types: Measure Unit / Monitor, Load Bank / Electronic Load, Test Software / Program Generator
- Components / Products Tested: System-On-Chip (SOC), Specialty / Other
- Tester / Test Capability: Functional Test (Performance), Parametric / In-process, Other
Supplier: Artifex Engineering
Description: The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for Diode characterization at the chip or bar level Quality control of incoming goods OEM We offer this instrument with a variety of end stages covering current ranges from 1A up
- Type / Form Factor: Test Module / Sub-system
- Options / Module Types: Measure Unit / Monitor
- Components / Products Tested: Specialty / Other
Description: Available NEW for official U.S. Government & Authorized Contractor purchase only This is available to Authorized User Groups and Agencies for delivery to CONUS, Alaska, Hawaii and Puerto Rico. Commercial and non-US entities are not authorized to purchase from GSA MSA contracts and may not reference
Supplier: American Microsemiconductor, Inc.
Description: Fast page and test modes
- Memory Category: DRAM
- IC Package Type: SOJ
- Logic Family: CMOS 4000
- Supply Voltage: 5 V
Description: Campylobacter test chip, 25 tests/pk Lateral flow tests for the rapid detection of pathogens in foods The same safety standards as the classical method of detection Definite test results with an additional positive control Order enrichment media, isolation media and confirmation chip seperately
Supplier: Skyworks Solutions, Inc.
Description: , chips can be supplied with only sample testing packaged in vials. Packaging in waffle packs with 100% electrical test and visual inspection is available if required.
- Configuration / Form Factor: Surface Mount / Chip Capacitor
Supplier: Omnetics Connector Corporation
Description: The Omnetics Test Point Connector is designed for use in modular electronic construction, utilizing circuit boards bonded to a central heat sink. The test point provides easy access to test points or allows programming of circuits without removing chips. TP1 series is available up to 96 contacts
Supplier: Anritsu Company
Description: , and Gold Radios with external attenuators. The result is a test instrument with faster integration into production, offers a universal solution for all WLAN chip sets, and is simpler to maintain and calibrate. The MT8860C also reduces test system costs, increases production throughput, and delivers
- Interface Port: BNC
- Equipment Type: Network / LAN Analyzer
- Form Factor: Desktop
Standards and Technical Documents - Paints and varnishes -- Determination of stone-chip resistance of coatings -- Part 3: Single-impact test with a free-flying impact body -- ISO 20567-3:2012
Description: Paints and varnishes -- Determination of stone-chip resistance of coatings -- Part 3: Single-impact test with a free-flying impact body
Supplier: Fisher Scientific
Description: A significant improvement over conventional glass hemacytometers Semen Test Counting Chamber; 10µm; 20/Pk. Hemacytometer; Disposable; C-Chip ; Semen Test Counting Chamber; 10µm depth; 5µL vol.; 20/Pk.
Noise, Vibration, and Harshness (NVH) Test Equipment - Semi-Automated Quality Test System -- NDT-SEMISupplier: PCB Piezotronics, Inc.
Description: Semi-Automated Quality Test System NDT-SEMI Resonant Acoustic Method is designed to help deliver fully inspected parts, economically and on time. Every component has a unique resonant signature or pattern that reflects its composition. NDT-RAM™ detects deviations from the expected signature
Supplier: ARM Inc.
Description: Express features a brand new bus architecture that improves bus/memory throughput over previous ARM development board families. The ARM Test Chip AXI™ buses are directly connected to the user expansion FPGA, giving greater architectural accuracy and minimizing bus latency.
Supplier: MPS Industries
Description: RoHS Compliant Product Operating Temperature: -40°C to +100°C Ordering Code: R7M0603C-XXX(S, J, K Tolerance) Inductance Tolerance: S = ±0.3nH, J = ±5%, K = ±10% - * Test at 50MHz Package: Tape and Reel is the standard, 4000 pcs per reel
- Technology: Multilayer
- Core Material: Ferrite
- Packing Method: Tape Reel
- Applications: General Purpose
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Featured Products for Test Chip Top
JTAG Technologies Inc.
. And, of course, be sure to get your prototypes up and running quickly. Underneath the skin of JTAG Live is the power of boundary-scan, capitalizing on the built-in test resources in many of the chips on your board. But to use JTAG Live, you don't need to know the anything about boundary-scan, because they did that part for you. One of the JTAG Live apps, Buzz, is available for download at www.jtaglive.com free of charge. Two other apps, Clip and Script, are available for a nominal price. Please... (read more)
Browse Automated Test Equipment Datasheets for JTAG Technologies Inc.
Silicon Designs, Inc.
Silicon Designs TS1000 Test Socket
The TS1000 test socket from Silicon Designs, Inc. (www.silicondesigns.com) is designed to be used to pre-test any Silicon Designs 1010L,1210L and 1221L accelerometers. The socket is suitable for up to ± 65 g Vibration at 2K Hz. Only can be used with "surface mount" 20 pin LCC package. For more information or to request a quote, visit www.SiliconDesigns.com. About Silicon Designs. Based in Seattle, Washington, USA, Silicon Designs, Inc. (www.SiliconDesigns.com) specializes in industrial... (read more)
Browse Accelerometers Datasheets for Silicon Designs, Inc.
LIV Laser Diode Characterization
LIV testing of diodes (laser and LED) involves sweeping the current to the device and measuring the optical power output as well as the voltage drop across the device. In addition, the application may also involve measurement of the current output of an internal monitor photodiode as well as the optical spectrum of the device under test. Artifex Engineering offers LIV test instrumentation for use in the lab as well as for OEM applications, ideal for testing lasers and LEDs at all ranges... (read more)
Browse Automated Test Equipment Datasheets for Artifex Engineering
PREMA Semiconductor GmbH
Prototyping Services for an ASIC Project
In a production hall with an area of 8000m ², PREMA has all process steps required for prototype and high-volume wafer production inhouse. To offer quick prototype cycles we also have an e-beam mask writer that allows us to quickly proceed from layout data to first silicon. Also wafer probing and chip test are located in our building. Steps of an ASIC Project. . An ASIC design has to pass different stages: specification and concept study. circuit design and specification. layout... (read more)
Browse Semiconductor Foundry Services Datasheets for PREMA Semiconductor GmbH
Conduct Research Top
Enhanced Imager Chip Packaging for Automotive Applications (.pdf)
been performed. described. The package represents an evolution from. with non-functional test chips equivalent in size to 1 inch. traditional flip chip integrated circuit packages. Imager. format chips. Initial imaging results will be presented. chips are bump mounted onto flex, which in turn
The New Era of Automated Test
, they can now customize test systems for their exact DUTs. PXI system software continues to evolve as DUT complexity increases. When engineers test a device like a WLAN system on a chip (SOC), they no longer perform simple stimulus and response tests to verify components. Instead, the test systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability. A comprehensive guide to new VLSI Testing and Design-for-Testability techniques, this text will allow you to master System-on-Chip Test architectures, and test, debug, and diagnose digital, memory, and analog/mixed-signal designs
Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization. Shedding light on the many issues that come to play in the arena of modular SOC testing, this book describes the problems related to SOC testing, and discusses the modeling granularity and the implementation into EDA (electronic
IC Chip Inspection System
confidence of their customers by demonstrating an in-depth engineering knowledge of a wide-range of applications. In addition, they always put the "customer first" irrespective of the customer or project size. Overview. The integrated chip QA support is provided by a distributed test system using
Flip Chip Bonder (Embedded)
Software & Utilities. Communication. Bus Expansion. Remote I/O. Industrial LAN & Wireless. Inductive Power Distribution. Solutions. System Integration. Digital Signage Solutions. Medical Solutions. Security Solutions. Smart Grid & Energy. Test & Measurement. Manufacturing Automation. Download. Case Studies
ChIP/DNA Shearing (.pdf)
off the horn, remove some water. Depending on what the tubes are composed of, some tubes may be brittle or prone to. cracking when they are exposed to long periods of ultrasonic energy. We recommend running a test of your sample tubes with the recommended. water level, with only buffer in the tubes
First Medical Test On CD Gets Good Results
and their colleagues have successfully automated a particular medical test on a compact disc (CD) for the first time -- and in a fraction of the normal time required using conventional equipment. The ELISA biochemical test -- one of the most widely. First Medical Test On CD Gets Good Results. OSU News
Engineering Web Search: Test Chip Top
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Power-on self-test - Wikipedia, the free encyclopedia
Power-on self-test From Wikipedia, the free encyclopedia
Mentor Graphics Completes Test Chip with IC Implementation...
Home Company News Mentor Graphics Completes Test Chip with IC Implementation Flow for Common Platform 32/28nm Technology
- Mentor Graphics delivers highest quality silicon test and...
Links and Selected Readings - GNU Project - Free Software...
Chip Documentation The list below is based on the c4x Manufacturer: Texas Instruments Exact chip name: TMS320C4X DSP Manuals
Wind River Provides On-Chip Debugging Solution to Address...
of Wind River On-Chip Debugging for Manufacturing and Test, an innovative standards-based offering that allows test and manufacturing engineers the
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