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  • Anatomy of a Test Socket
    This presentation focuses on the components and construction of Burn-in and Test Sockets from concept through assembly to help educate those in associated industries who may lack an appreciation for all the steps and intricacies necessary to manufacture a Burn-in or Test Socket
  • Comparing, Contrasting and Interpreting Data For Test Socket Signal Integrity Performance (.pdf)
    Selecting a test socket based on its published bandwidth may not give a true representation of the socket's real world performance. When comparing the signal integrity performance of various test sockets, it's important to consider several factors. Understanding how the intrinsic attributes
  • IC Test Sockets Perform Beyond 10GHz
    Semiconductor design engineers have been under constant competitive pressure to provide more features and functions, all with lighter weights, smaller sizes, and lower costs.
  • RF Test Sockets: The Key to the Effective Testing of High-Frequency Devices
    With rapid and constant advances in silicon technology, today's IC packages are continually changing both inside and out. The inside of the package is holding more transistors per square millimeter. The outside of the package is constantly being trimmed and reconfigured to approach the size of the
  • Socket-Adapter Systems: A Practical Test Alternative (.pdf)
    Traditional one-piece, clam¬shell-design test sockets are useful diagnostic tools for establishing or evaluating device functionality. However, they tend to be less satisfactory for validating fine-pitch packages such as ball grid ar¬ray (BGA) and land grid array (LGA), which are gaining popularity
  • Machined plastics pass the test
    Designers are making good use of advanced machinable plastics that stay stable at temperature extremes while dissipating electrostatic charge. Test sockets made from Semitron ESd 420V, a new PEI-based ESD material from Quadrant EPP, offer high-temperature resistance and tight dimensional control
  • Socket Resistance Comparison (.pdf)
    This test measures the electrical resistance on the portion of the socket, which is in the primary current path. The resistance is measured as shown in the sketch. Note that secondary parallel paths (i.e. contact between probe tube and socket bottom, probe tube and socket top) if they occur, would
  • Spring Pin Socket User Manual
    SS-BGA sockets provide high bandwidth in a small, cost effective ZIF socket for prototype, test and burn-in applications. SS-BGA socket is a simple, mechanical socket based on spring pin technology. SS-BGA socket is a solder-less socket that can be mounted on to a PCB using supplied hardware
  • Calculating Socket Set Heights (.pdf)
    Socket set height is a critical factor in the performance and life of a test probe. When set too low, the probe is under-stroked, reducing the contact force and the probe's ability to penetrate surface contaminants. When set too high, the probe is over-stroked, resulting in decreased spring life
  • Double-Ended Sockets for Wireless Fixturing (.pdf)
    Double-Ended Sockets allow construction of fixtures with shorter signal path lengths compared to conventional wire-wrapped designs. The shorter path length allows for improved signal integrity from the tester circuits to the Unit Under Test (UUT). Fixtures built in this manner are referred

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  • IC Component Sockets
    TABLE 1.1 Classification of IC Component Sockets Classification Category By function Types of IC Component Sockets Burn-in sockets Test sockets Production sockets T hrough-hole sockets Surface-mounted sockets Metallic socket Elastomer socket Single-point contact Multipoint contact One-piece …