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  • Infrared Detector Basics (.pdf)
    thermal infrared detectors.
  • How Do Thermal Imaging Infrared Cameras Work
    , or measured, allowing you to not only monitor thermal performance, but also identify and evaluate the relative severity of heat-related problems. Recent innovations, particularly detector technology, the incorporation of built-in visual imaging, automatic functionality, and infrared software
  • An Improved Wire Grid Polarizer For Thermal Infrared Applications
    Moxtek has developed a high contrast IR polarizer on silicon suitable for long wavelength thermal IR applications using. our aluminum nanowire, large area patterning capabilities. Between 7 and 15 microns, our 144 nm pitch polarizers transmit better than 70% of the passing polarization state
  • Thermal Image Quality - Visualization of Spatial and Thermal Resolution in Thermal Imaging
    Generally, the performance of an infrared camera is characterized by either the noise equivalent temperature difference (NETD) with respect to thermal resolution or by the instantaneous-field-of-view (IFOV) with respect to spatial resolution. The NETD represents an uncertainty in measuring
  • The Practice of Detecting Termites with Infrared Thermal Imaging Compared to Conventional Techniques
    Adequate IR camera resolution is a combination of the IR camera detector and optics. The wise thermographer ensures the right system is available for the job at hand. This paper illustrates with real world measurements on actual thermal anomalies found in the field, the magnitude of error one can
  • Challenges in Infrared Imaging: Low Emissivities of Hot Gases, Metals, and Metallic Cavities
    In infrared thermal imaging, the temperatures are computed from the measured IR radiation according to Planck's law, modified by corrections due to the camera (detector response, transmission of optics, and more) as well as to the emitter, i.e., the object under consideration. The major problems
  • MICRO: Extreme Silicon - Sun (March 2000)
    defects. To prevent such effects, various techniques have been used to analyze organic contaminants on silicon wafer surfaces, including Fourier transform infrared spectroscopy, ion mobility spectrometry, time-of-flight ion mass spectrometry, x-ray photoelectron spectroscopy, and thermal desorption
  • Short-wave IR imaging invades machine vision
    and technically, in literally hundreds of industrial applications. And they offer benefits thermal and visible-spectrum cameras do not, creating a performance/life-cycle cost advantage for SWIR, even in applications where both thermal and SWIR can technically do the job. Like visible CCD and CMOS detectors, SWIR

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