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Thermal Wafer Chuck

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  • Industry Reference: Semiconductor and Wafer Production
    Etched foil element heaters to heat acid in portable wafer processing baths, High Temperature Binder Inorganic and Organic coatings and with fabrication materials such as fiberglass cloth, fiberglass mat, mica, and ceramic fiber insulating carriers, etc... Thermal Circuits -Semiconductor etched...
  • MICRO: Measuring and controlling wafer temperature during plasma etching
    to the formation of a parasitic plasma and thus give an inaccurate temperature indication.4. One relatively new measurement technique, known as the Active Plasma Thermal Optical System, determines actual wafer temperature in real time, but it requires a fiber-optic harness that is tethered to the wafer...
  • MICRO: Product Tech News
    significant advantages over traditional wafer chucks. Three to five times stiffer than glass or metal components, the ceramic chucks are available in several materials, including UltraSiC silicon carbide, PureSiC chemical vapor deposition silicon carbide, PlasmaPure alumina, and StatSafe ESD alumina...
  • MICRO: Product Extra!
    The m600 developer's kit from allows R&D technologists and OEM engineers to test the technical feasibility and ease of integration of the company's Fluoroptic thermometry. Among other applications, the m600 can be used to control electrostatic chucks in semiconductor wafer tools. The m600 has...
  • Miniature Linear Encoders
    assembly, a critical subsystem in semiconductor wafer chambers, combines customer-specific mechanical, electrical, and thermal engineering with advanced chemical-vapor-deposited ceramic heaters and e-chucks. By considering the thermal, plasma, mechanical, and electrical boundary conditions of the chamber...
  • MICRO: Building Copperopolis II by Israel Ybarra Jr. (Jan 2000)
    the backside and bevel/edge. The process also may be used to remove thermal oxide or nitride films from the wafer backside and controlled to perform a precision wraparound film removal etch (an edge exclusion zone) on the wafer frontside. Copper particles imbedded within the oxide are effectively eliminated...
  • STEM System
    A single-wafer processor uses a vertical immersion process chamber with three megasonic transducers. Located at the top of the chambers, two transducers introduce acoustic wavefronts directed at the wafer/liquid/gas interface (the cleaning zone), while a bottom transducer prevents the redeposition...
  • MICRO: Green Manufacturing
    , the wafer is heated to an elevated temperature (>230 C) by resting on top of a heated chuck. If needed, RF power can be applied to the bottom electrode, inducing physical sputtering. Figure 2: Schematic diagram of a postimplant resist profile depicting how implant species can penetrate...
  • TA022: Benefits and Challenges in Decreasing GaAs through Substrate via Size and Die Thickness
    the back-side ground, plated heat sink to be. can provide the additional support needed for wafers. placed closer to the device active regions resulting in better. thinned to 75 µm or less in order to prevent breakage from. thermal conduction. the thin wafer / carrier de-mount through the dicing steps...
  • MICRO: Special Apps
    handlers to achieve a secure vacuum seal, which affected wafer handling on the prealigner, the robot end-effector, and the measurement chuck. Furthermore, the absence of a tight vacuum seal interfered with the tool's ability to detect the presence of the wafer, which is usually performed...

Engineering Web Search: Thermal Wafer Chuck

Thermal Challenges During Microprocessor Testing
THERMAL CHALLENGES AT SORT Wafer sort is the first step in the test process with its main purpose being to reduce assembly
Environmental Chambers | Temperature Testing | Thermal Testing
Wafer Hot & Cold Chuck Testing, Probing and Failure Analysis - Thermal Systems - Thermal Chambers - Data Sheets/Application Notes
See Temptronic Corporation Information
106-914-E Summit 11_12K User's Guide
1 Chuck: Summit 11500, 12500, 11700, 12700 and 11800, 12800 .................... 1 Guarded Thermal Chuck Option
Deactivation Induced Within Wafer Nonuniformity During Nonmelt...
This additional thermal budget is associated with the chuck temperature and duration a wafer is left on the chuck after LSA. The deactivation is
FEA thermal investigation on plasma etching induced heating...
FEA thermal investigation on plasma etching induced heating during wafer thinning process
METHOD OF SURFACE MODIFICATION FOR THERMAL SHOCK RESISTANCE...

Method of Manufacturing Semiconductor Device-Fabrication Wafer...
Wafer holder and semiconductor manufacturing equipment in which the holder is installed, the wafer holder having a wafer-carrying surface, wherein
Extreme ultraviolet lithography - Wikipedia, the free...
Therefore the wafer clamping variability on the electrostatic chuck needs to be dealt with.
CCMR - Shared Experimental Facilities
Aremco Wafer cutting Diamond Saw Location: Duffield Hall
Heated Chuck For Laser Thermal Processing invention
Abstract: A chuck for supporting a wafer and maintaining a constant background temperature across the wafer during laser thermal processing (LTP) is

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