Products/Services for Topographic Measurement
Mapping and Surveying Services - (1128 companies)Mapping and surveying services perform all of the activities that involve the physical measurement of land areas, including field surveying and data collection operations as well as the creation of maps using existing or acquired data. Mapping... Learn More
Interferometers - (116 companies)
Total Stations, Theodolites, and Transits - (56 companies)Total Stations, Theodolites and Transits Information. Theodolites and Transits are used for the accurate measurement of features, orientation and absolute positioning of large scale objects in engineering, construction, mapping, industry, defense... Learn More
Hygrometers and Humidity Measurement Instruments - (567 companies)
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Inertial Measurement Units (IMU) - (24 companies)Inertial measurement units (IMU) use integrated gyroscopes and accelerometers to detect the distance and direction traveled over a period of time. Measurements are summed to determine change from an initial location. Calibration parameters can... Learn More
Measurement Microphones - (56 companies)
Interface Level Measurement Equipment - (39 companies)Interface level measurement equipment includes sensors and meters for the detection and measurement of interface levels between different media, such as oil/water interfaces and liquid/solid interfaces. Interface level measurement equipment includes... Learn More
Dimensional Measurement and Metrology Services - (226 companies)
Test, Inspection, and Measurement Software - (304 companies)
Product News for Topographic Measurement
Measurement of Doped Wafers and TSVs Sensors with submicron height resolution easily serve these typical applications: Wafer thickness on nearly all materials. Topographical measurements on structured samples. Mask thickness. Quality assurance on bondings (length of leads etc.). Measurement of coating thickness. Because of the small spot size, it is possible to use the CHRocodile sensors for measurement on any portion of the wafer, even at the edge. With the high speed and dynamic range, it is also possible to collect large volumes... (read more)Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc.
CHRocodile Sensors materials. A wide range of optical probes allows topographic measurements from 10nm - 25mm and chromatic thickness measurements from 30 μm - 35mm. Interferometric mode enables measurement of transparent materials from 2 μm - 150 μm. The CHRocodile IT series and MI5 use infrared light with an advanced interferometric technique to measure the distance and thickness of semiconductor materials. With speeds up to 4kHz, it is possible to measure silicon wafers up to 1mm thick. APPLICATIONS... (read more)
North Hills Signal Processing Corp.
VDSL Measurements VDSL Measurements. VDSL requires service-splitters at the network end as well as remote customer end to separate the low-frequency telephone (POTS) and high-frequency data signals. Application Note 162 outlines electrical tests of the Network End Splitter as covered in Annex F (pages 146-155) of ANSI Standard T1.424.2004. Application Note 163 outlines electrical tests of the Remote Customer End Splitter as covered in Annex E (pages 135-145) of ANSI Standard T1.424.2004. The Network End Service... (read more)Browse Network Test Equipment Datasheets for North Hills Signal Processing Corp.
Low-Cost Measurements On the Go The National Instruments USB-6008 provides basic data acquisition functionality for applications such as simple data logging, portable measurements, and academic lab experiments. It is affordable for student use and powerful enough for more sophisticated measurement applications. View product specifications and pricing. (read more)
Non-contact Sandwich Measurements CHRocodile's non-contact optical sensors utilize two different techniques, depending on the thickness and material being analyzed. With our chromatic confocal technique, the white light is passed through the material (visually transparent or translucent) and a return signal is processed from each surface. This provides a high speed and very precise measurement of distance to each surface, as well as thickness. When coupled with another chromatic sensor, it is possible to synchronize the two... (read more)
Multiparameter Measurements on Lubricants and Oils with these challenges, Anton Paar has developed Modulyzer for Petro. In its basic configuration, Modulyzer for Petro is a combination of a DMA 4100/4500 M density meter or a DMA 5000 M (the most accurate density meter in the world), an Abbemat-HP/WR refractometer and an Xsample Heated for the efficient, flexible and modular measurement of highly viscous petrochemical samples at temperatures of up to 80 °C. Measurements with Modulyzer are highly reproducible, precise and easy... (read more)Browse Viscometers Datasheets for Anton Paar
Clamp-On Ground Resistance Measurements These new Megger Clamp-On Testers measure resistance and continuity of grounding loops around pads, poles & buildings. Multi-ground systems can be checked without disconnecting the ground rod or stake under test. Use the DET14C to verify lightning protection on cell towers, RF transmitters and telecom sites as well as consumer installations such as pools and spas. This meter will also measure leakage current flowing to ground or circulating in the ground system. The DET14C is fast and easy... (read more)Browse Clamp Meters Datasheets for Weschler Instruments
LVDTs for Linear Displacement Measurements LVDT stands for Linear Variable Differential Transformer. An LVDT is also referred to as a linear displacement transducer, or linear position transducer. This sensor device measures linear displacement (or linear position) very accurately. The basic technology behind an LVDT is described below. Technology: the typical LVDT sensor consists of a primary coil and two secondary coils wound on a coil form. A ferromagnetic core links the electromagnetic field of... (read more)Browse Linear Variable Differential Transformers (LVDT) Datasheets for Trans-Tek, Inc.
MTI Instruments Inc.
Laser Sensor Displacement & Position Measurements Laser Sensor Displacement & Position Measurements from MTI Instruments. High Speed Laser System utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation sensing technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II is ideal for solving tough production measurement applications throughout a variety of industries. Click here to visit... (read more)Browse Optical Triangulation Position Sensors Datasheets for MTI Instruments Inc.
ESDU 12003 - Pressure and Flow Measurements on the selection of an appropriate measurement technique, and, where appropriate, on the construction, installation, calibration, and use of a measuring instrument. ESDU 12003 covers pressure measurement in stationary and moving fluids, and volume flow and mass flow measurements. Measurements in incompressible and compressible fluids are discussed. The flows considered are, in the first instance, as a steady and single phase. Advice, with appropriate warnings, is given where techniques and instruments... (read more)Browse Standards and Technical Documents Datasheets for IHS ESDU
...are remarkable, and they are able to achieve the highest resolutions theoretically possible (researchers are able to observe and measure topographic details on 500 nanometer grooves). In my research work, the laser scanning confocal microscope is one of the most useful optical measuring systems...
...safety glass. where certain topographic characteristics are required to assure adhesion between glass and film layers. However, such measurement is quite slow, and irregular spacing between points within a profile and between. the multiple traces makes 3D parameter calculation difficult. Correlating...
Made for use with sub-0.25-um processes, the SEMVision in-line microscope automatically classifies up to 300 defects per hour. The system uses a proprietary technology to provide enhanced topographic information and automatic classification of defects into types closely linked to their source...
...to generate a topographic, or height, profile of the sample. ADwin systems are ideal for these applications. The ADwin - which incorporates digital and analog inputs and outputs with a real-time processor in a single unit - can drive stepper motors and/or other actuators, using feedback from various...
...of the ice to gauge conditions within the glacier. Scientists believe that Jakobshavn remained unchanged until 1900, when the ice surface near the calving front began lowering by 2.5 meters (about 8 feet) per year on average. According to the new data collected by NASA's Airborne Topographic Mapper...
...of an Other topographic features inspected by this system include. airstream for imaging and measurement of retinal topography. macula holes, tumors, edema and more. The software offers. The light probe is nearly undetectable by the patient and images eight different color scales, ten image enhancement...
In an optical profiler, a digital camera records fringes that result from reflections off a test surface and a reference surface. The system converts these fringes into high-resolution topographic information. The white-light interferometer is a type of microscope in which the two waves are split...
Accessories for two-dimensional topographic mapping over intermediate distances are also available. When used in conjunction with a microscope, the spatial resolution can be reduced from approximately 400 um down to 1 um. Figure 3: A close up of Tyvek's surface texture and the overlying metal coating...
...surface elevation data by using NASA's Airborne Topographic Mapper, a scanning lidar system. Those results can be compared to ICESat's data to see how well the new lidar system is working. The Dry Valleys area presents special challenges for lidar measurements, Csatho explained. There, the exposed rock...
...that the surface. atomic configuration as defined by the crystal ographic orientation helps determine the localized. work function. Figure 3 - Kelvin Probe Force Microscopy measurement of a CGS film showing (a) topographic image with facets. (b). Representation of the measured work function with crystal ographic...
Engineering Web Search: Topographic Measurement
LIDAR - Wikipedia, the free encyclopedia
Airborne topographic mapping lidars generally use 1064 nm diode pumped YAG lasers, while bathymetric systems generally use 532 nm frequency doubled
Dictionary of Abbreviations and Acronyms in Geographic...
Airborne Integrated Mapping System; Automated Investigation Measurement System (Nikon) Airborne Laser Topographic Mapping System
Physikalisch-Technische Bundesanstalt (PTB), Working Group...
to ellipsometric measurements, topographic methods require contiguous coated and uncoated substrate ranges which are accessible to a measurement.
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Physikalisch-Technische Bundesanstalt (PTB): Layer thickness...
Hardness and Layer Thickness Measurement Technique
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Magellan Fact Sheet
Obtain a near-global topographic map with 50km spatial and 100m vertical resolution.
: Measurement Approach
With measurement footprints of this size and density, the OCO-2 instrument will acquire an adequate number of high quality soundings even in those
Influences of DEM quality parameters on the topographic phase...
Influences of DEM quality parameters on the topographic phase correction in DInSAR