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Made for use with sub-0.25- um processes, the SEMVision in-line microscope automatically classifies up to 300 defects per hour. The system uses a proprietary technology to provide enhanced topographic information and automatic classification of defects into types closely linked to their source...

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Product Announcements
Lapmaster-Wolters International
Assembly Tool Specialists, Inc.
Pratt & Whitney Measurement Systems, Inc.
Carl Zeiss Industrial Metrology, LLC