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Supplier: KLA-Tencor Corporation
Description: The HRP-250 is an automated, advanced surface topography metrology tool, featuring high resolution/high-aspect ratio, stylus-based surface profiling for leading edge 200mm applications. This surface topography metrology tool's ultra-fine 20nm stylus tip option enables down to 45nm-generation
- Form Factor: Wafer Probing System
- Mounting / Loading: Floor Mounted / Stand-alone
- Applications: Semiconductor Wafers
- Measurement Capability: Roughness / Waviness
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Supplier: Bruker Nano Surfaces Division
Description: The ContourGT-K0 3D Optical Microscope combines exceptional profiling performance, operator convenience, and affordability into one bench-top instrument. The system utilizes white light interferometry to measure surface topography from nanometer-scale roughness through millimeter-scale steps
- Form Factor: Monitor / Instrument
- Mounting / Loading: Manual Loading
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Roughness / Waviness, Thickness - Film / Layer
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Supplier: Precitec, Inc.
Description: Optical Sensor for Non-contact distance thickness measurement. The new sensor CHRocodile S, with its modern design, represents the latest generation of optical distance and thickness measuring devices. It is applicable for highly accurate distance and topography measurements as well for measuring
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Supplier: GENEQ, inc.
Description: by knowledgeable weather enthusiasts, with the easiest setup and installation of any instrument being sold today. Since then, we have worked diligently to improve the performance of the MKIII. We have done just that with the MKIII-LR by dramatically expanding its transmission range to one mile (LOS
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Supplier: Carl Zeiss Industrial Metrology, LLC
Description: Compact field surface texture measuring instrument
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
- Standards Compliance: ASME, ISO / EN, DIN, JIS, Other
- Technology: Contact / Stylus Based
- Mounting / Loading: Benchtop, Handheld / Portable
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Supplier: Corning Specialty Materials
Description: First optical instrument to provide extensive quantification of o.d. & i.d.
- Surface Metrology: Surface Profilometry
- Measurement Capability: 2D / Line Profiles, 3D / Areal Topography, Cylindricity, Differential / Taper, Harmonics, Roundness, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Straightness
- Standards Compliance: ISO / EN
- Technology: Non-contact - Optical / Laser
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Featured Products for Topography Instrument Top
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Knight Optical Ltd.
Light Detection and Ranging (LiDAR) Optics
Precision optical components for the latest LiDAR (Light Detection & Ranging) systems. From Mining to Wind Energy, our components are utilised in topography and ranging instruments in harsh environments with high grit and sand levels and extreme temperatures in arctic to desert climates. LiDAR (Light Detection and Ranging) systems are used in monitoring wind speeds and directions on proposed and existing wind farm sites and in systems used for topographical measurement, void... (read more)
Browse Optical Lenses Datasheets for Knight Optical Ltd. -
M+P Labs
Surface Prep, Coating and Plating Evaluations
of chemical constituents, microstructure and surface topography to study failures and features of interest in a wide variety of materials. Our instruments are capable of performing Secondary Electron and Backscatter Electron Imaging, and producing ultra-fast color x-ray element maps to thoroughly study features of interest. Semi-quantitative detection of the presence of nearly every element in the periodic table of elements, from boron to uranium on a microscopic scale. View features... (read more)
Browse Material Testing Services Datasheets for M+P Labs -
Precitec, Inc.
Measurement of Doped Wafers and TSVs
Modifications have been made to several existing CHRocodile sensors to enable measurement on unique semiconductor materials, ranging from glass, sapphire and highly doped wafers, to TSVs and other structured devices. Capable of measuring wafer thickness, topography or film thickness at high speeds, CHRocodile sensors are available for nearly all materials and applications. With the semiconductor and electronic industries dependant on high quality standards, the high precision of the CHRocodile... (read more)
Browse Wafer and Thin Film Instrumentation Datasheets for Precitec, Inc. -
M+P Labs
Quality Control of Medical Device Components
. The appropriate technique(s) will provide information about: · Chemical composition. · Distribution of composition (Element mapping). · Features (discoloration, cracks, poor adhesion). · Fractography. · Surface topography. · Thickness. Additional analyses and testing capabilities available at M+P Labs include: The chemical and thermal analysis capabilities available at M+P Labs can be used in conjunction with mechanical, metallurgical, microstructural... (read more)
Browse Product and Component Testing Services Datasheets for M+P Labs
Conduct Research Top
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SmartMovesTM Spotlights: Veeco Instruments, Inc. (.pdf)
roughness and topography, with subnanometer resolution. The measurements are accurate, repeatable and high speed. Veeco chose Galil's Ethernet-based DMC-3425 motion controllers for its profilers because they provide a highly versatile and powerful form of distributed control where many controllers can
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LVDT Use in a Scanning Laser Tomography Instrument
of an Other topographic features inspected by this system include. airstream for imaging and measurement of retinal topography. macula holes, tumors, edema and more. The software offers. The light probe is nearly undetectable by the patient and images eight different color scales, ten image enhancement
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Wind Turbines
to the topography. Therefore, wind mapping. has to be performed in. order to determine if a location. is correct for the wind farm. Such wind maps are usually. done with Doppler radars. which are equipped with stationary. temperature and humidity. sensors. These sensors. improve the average accuracy
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Spatial Coherence in Interferometry
test, which is the test surface. In addition,. the reference surface acts like another (reflective) object, which is now more or less out. of focus. The purpose of the microscope is to image the object onto the camera. The. purpose of the interferometer is to make the topography of the surface
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MICRO: Defect/Yield Analysis & Metrology
are especially valuable for CMP process development and control. The optoacoustic technique generates and detects ultrasonic waves using laser light, and, in contrast to profilometry, which measures surface topography, it measures metal thickness directly. For CMP applications, commercially available
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Surface Texture Parameters
. length are considered waviness. Also known as cutoff length. (Lr). Spacing Parameters- A measure of the horizontal or lateral. periodic characteristics of the surface. Surface Texture- The topography of a surface composed of certain. deviations that are typical of the real surface. It includes roughness
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Wastewater Level Measurement Techniques
process. The type of plant and topography of the site are big factors, but the requirement for pumps, controls, instruments and operator intervention can be minimized by good treatment plant design. Figure 36.1 Albany County North Sewage Treatmernt Plant, Albany NY. Wastewater treatment plant
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Measuring Surface Slope Error on Precision Aspheres (.pdf)
and. surface topography (sag) and do. others. not report slope. Shack Hartmann sensors. Wavefront sensors determine. Wavefront sciences and others. wavefront error through slope. measurement. Phase measuring microscopes. Measure phase like Fizeau. Zygo New View 5000, ADE. interferometers, do not measure
Engineering Web Search: Topography Instrument Top
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Missions - NASA Jet Propulsion Laboratory
Images taken by the ASTER instrument also provide detailed views of the effects of global climate change and extreme weather on Earth's landforms and
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The Geoscience Laser Altimeter System (GLAS) Homepage
GLAS (the Geoscience Laser Altimeter System) is the first laser-ranging (lidar) instrument for continuous global observations of Earth.
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ESA Science & Technology: Instruments
HASI: Huygens Atmosphere Structure Instrument
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ESA Science & Technology: Micro-Imaging Dust Analysis System
Instrument Research and Development Microcam Instrument Technology R&D Active Pixel Sensor
- LIDAR - Wikipedia, the free encyclopedia
- Cassini?Huygens - Wikipedia, the free encyclopedia
- USGS/EROS › -Home
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USGS Scientists Develop System for Simultaneous Measurements...
USGS Scientists Develop System for Simultaneous Measurements of Topography and Bathymetry in Coastal Environments