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This conceptual diagram shows IBM's new "spin-flip spectroscopy " technique. Electrons (red) tunnel from the tip of a scanning tunneling microscope (top) through an atom (red circle) that rests on a surface (bottom). When the electrons' energy exceeds a certain value, it flips the atom's spin...

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  • Springer Handbook of Experimental Solid Mechanics
    Figure 4.16 shows a tunneling electron microscope mi- crograph of the exfoliated Cloisite 30B clay reinforced Dow DER331/DER732 epoxy system.
  • Information measuring systems in nanotechnology
    Currently, in laboratories tunneling electron microscopes that deal with problems of nanomanipu lation are equipped with microrobots [18, 26�29].
  • Physics
    individual atoms can be moved and mapped 1207 With the raster tunnel electron microscope on a surface.
  • Scanning Probe Microscopy of Functional Materials
    Riedel, D., Bocquet, M., Lesnard, H., Lastapis, M., Lorente, N., Sonnet, P., Dujardin, G. �Selective scanning tunnelling microscope electron -induced reactions of single biphenyl molecules on a Si(100) surface�.
  • Nanotechnology: Principles and Practices
    Scanning tunnelling microscope ( electron current .
  • Bio and Nano Packaging Techniques for Electron Devices
    STM Scanning Tunneling Micro- scope; AFM Atomic Force Microscope; SEM, TEM Scan- ning and Tunneling Electron Microscope , respectively; SNOM Near-field Scanning Optical Microscope; OM Optical Microscope .
  • Nanofabrication
    � that ultra fine e-beam could drill holes directly in a range of inorganic thin films, such as NaCl, MgF2, Al2O3, LiF, and AlF3, with hole diameter of about 1.5 nm, using a scanning tunneling electron microscope at beam diameter of �
  • Micromanufacturing
    Most inspection that is currently done is accomplished using optical micro- scopes, scanning electron microscopes (SEM) and tunneling electron mi- croscopes (TEM).
    Applications of tunneling 1) Scanning tunneling electron microscope (STM .
  • Measuring techniques
    There are several scanning techniques with different surface sensitivity and lateral resolution; all of them work only under vacuum conditions: - scanning tunneling electron microscope (STM) with an intentionally degraded resolution of 1 nm, - scanning electron microscope (SEM), maximum resolution about 3 nm �