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Optical Metrology for Large Telescope Optics
In recent years the demand for meter-scale optical elements has increased significantly, driven by growth in terrestrial and satellite-based astronomy, and defense and security applications. Laser interferometry is used throughout the manufacturing of large optics to ensure conformance to demanding
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Tight Squeeze: Optical Imaging For Cramped Quarters
, and geometric errors. Now more than ever before semiconductor equipment such as wirebonders and surface profiling equipment requires integrated sensors that can monitor a process or locate material. These sensors are often optical imaging systems. Yet I have visited many semiconductor equipment
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New from the Fab Labs: Lightweight but Superstrong Parts
since 1996.". EBM is relatively fast compared with other metal processes such as laser sintering because electron-beam energy couples well with metals, says Comier. "The melt goes fairly quickly because there is no optical reflectivity. Melting aluminum, with other methods, for instance, would make
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Optical Comparators in Medical Device Manufacturing
material goes to the production floor for centerless grinding. Operators use Starrett Optical Comparators to check their in-process work. In addition, roaming QC inspectors randomly select pieces and view them on the optical comparators. The optical comparators are used with 50 or 100-power lenses
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Analysis of Trace Elements in Tungsten Carbide using the Teledyne Leeman Labs Prodigy DC Arc
U.S.A. Tel: 603 886 8400 · Fax: 603 886 9141 · www.leemanlabs.com. Experimental. Instrument. A Prodigy DC Arc was used to generate the data for. this application note. The Prodigy DC Arc is a. compact, bench-top simultaneous instrument featuring. an 800 mm focal length Echel e optical system
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MICRO:Process Equipment-Lithography, by Zhou Lin (Feb 99)
used in the fabrication of lithography equipment and other materials in the process area must be tested for their potential to emit molecular contamination within the process chamber. Such materials include building materials, solvents, chemicals, epoxies, adhesives, tapes, cleaners, foams, rubbers
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Detrimental Element Analysis of Non-Metallic Materials Used in Nuclear Reactors
for halogens, sulfur, and low-melting point metals by ASTM D129, E144 and D3761, using oxygen bomb or water leaching preparation with ion chromatography (IC) and inductively-coupled plasma (ICP) optical emission spectroscopy (OES or AES) is described. Some independent testing laboratories are approved
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MICRO:Defect Inspection Equipment, by Thomas Reuter (Oct '99)
Technologies (formerly Siemens Microelectronics Center, or SIMEC) in Dresden, Germany, in July 1998. Fully integrated into the production line, the tool is used in both memory and logic applications across the entire process flow. This article focuses on an investigation that was conducted