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  • Description: , the MarSurf M 400 fulfills the needs on the shopfloor and in production and the measuring room. Especially skidless tracing with the skidless probe BFW 250 and the drive unit SD 26 enable the measurement and evaluation of not only the roughness depth but also waviness and profile criteria. The magnetic

    • Technology: Contact / Stylus Based
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.)
    • Common Specific Parameters: Roughness Average (Ra), Roughness - RMS (Rq), Base Roughness Depth (R3Z), Maximum Peak Height (RP), Maximum Valley Depth (RV), Profile Depth (Pt), Ten Point Height (Rz JIS), Skewness (Rsk), Waviness Average (Wa), Waviness Height (Wt), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Other
    • Standards Compliance: ASME, ISO / EN, DIN, JIS, Other

  • Description: profiler and surface analysis system utilizes numerous platform and measurement technologies from KLA-Tencor's most advanced semiconductor profiler systems for surface topography analysis - programmable scan stage, low noise, and high quality, high resolution long scans -- but in a smaller, more

    • Technology: Contact / Stylus Based
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt )
    • Vertical (Z) Range: 0.0394 inch

  • Description: No Description Provided

    • Technology: Non-contact - Optical / Laser
    • Surface Metrology: 2D / Line Profile, 3D / Areal Topography
    • Measurement Capability: Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Waviness Parameters (Wa,Wt ), Hybrid Parameters, Defects / ADC, Flatness, Lay / Pattern, Step Height, Thickness, Warp / Bow, Specialty / Custom
    • Common Specific Parameters: Height (Rz JIS), Skewness (Rsk), Kurtosis (Rku), Waviness Average (Wa), Waviness Height (Wt), Peak Count (PC), Peak Spacing Average (Sm), Core Roughness Depth (Rk), Bearing Ratio (TP, Rmr), SlopeRa (Deltaa), SlopeRMS (Deltaq), Other

  • Description: Modular machine concept and a wide variety of probes for any measuring problem High-precision shop floor measurements for quickly adapting the manufacturing process Large measuring volume Large weight capacity of the rotary table

    • Surface Metrology: Form Measurement
    • Measurement Capability: 2D / Line Profiles, Coaxiality, Cylindricity, Differential / Taper, Flatness, Eccentricity / Concentricity, Parallelism, Roundness, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Squareness / Angularity, Straightness, Waviness Parameters (Wa,Wt )
    • Standards Compliance: ISO / EN, DIN
    • Technology: Contact / Stylus Based

  • Supplier: Polytec, Inc.

    Description: For the best yields it is necessary to optimize your process. Measuring and understanding the characteristicsof your product allows continuous improvement. The AVT-1000 enables you to measure all critical parame-ters on metal or glass such as Roughness, Waviness, and Defects. The AVT can measure

    • Measurement Capability: 3D / Areal Topography, Defects / ADC, Flatness, Runout, Roughness Parameters (Ra, RMS / Rq, Rz, etc.), Thickness, Waviness Parameters (Wa,Wt )
    • Standards Compliance: ASME, ISO / EN
    • Technology: Non-contact - Optical / Laser
    • Mounting / Loading: Floor / Free Standing

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  • Beyond Roughness (.pdf)
    and the reasons for doing so go far beyond roughness. ./b6f22649-646f-47b3-b808-2e2dbc0ca82f Quality 101. 3 This measuring system combines. roughness and contour measurements. into a single, integrated system. Using. a single drive unit and incorporating a. laser interferometer within the gage
  • Surface Analysis: Beyond Roughness
    and the reasons for doing so go far beyond roughness. In fact, many experts choose to use the terminology of "surface texture" rather than simply calling these characteristics "roughness.". Some measurements determine how a surface will bear loads, while others determine how well a surface provides
  • Medical Device Link .
    . Rq = the maximum peak-to-valley distance. Rz = the average absolute value of the five highest peaks and the five lowest valleys over the evaluation length. Wa = waviness or the arithmetically averaged roughness, i.e., the average deviation of all points from a plane fit to the waviness data
  • Choosing the Most Suitable Shape Parameter in Morphological Analysis (.pdf)
    . The compactness factor reflects the ratio between the surface of. the particle and the surface of the smallest rectangle that can. contain it. W. A. Compactness factor = W x H. Figure 2: Length characteristic of the. smallest rectangle containing the particle. where A is the surface of the particle

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